公开(公告)号：US20230349842A1

公开(公告)日：2023-11-02

申请号：US18309021

申请日：2023-04-28

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Ruimin Qiao ,  Sylvia Jia Yun Lewis ,  Srivatsan Seshadri ,  Janos Kirz ,  Benjamin Donald Stripe

IPC: G01N23/20008

CPC classification number: G01N23/20008 ,  G01N2223/316

Abstract: An apparatus is configured to receive x-rays propagating from an x-ray source. The apparatus includes first and second x-ray diffractors, the second x-ray diffractor downstream from the first x-ray diffractor and first and second x-ray detectors. The first x-ray diffractor is configured to receive the x-rays, to diffract a first spectral band of the x-rays to the first x-ray detector, and to transmit at least 2% of the received x-rays to the second x-ray diffractor. The second x-ray diffractor is configured to receive the transmitted x-rays from the first x-ray diffractor and to diffract a second spectral band of the x-rays to the second x-ray detector. The first x-ray detector is configured to measure a first spectrum of the first spectral band of the x-rays and the second x-ray detector is configured to measure a second spectrum of the second spectral band of the x-rays.

公开(公告)号：US10989822B2

公开(公告)日：2021-04-27

申请号：US16427148

申请日：2019-05-30

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Janos Kirz ,  Benjamin Donald Stripe

IPC: G01T1/36

Abstract: An x-ray spectrometer includes at least one x-ray optic configured to receive x-rays having an incident intensity distribution as a function of x-ray energy and at least one x-ray detector configured to receive x-rays from the at least one x-ray optic and to record a spatial distribution of the x-rays from the at least one x-ray optic. The at least one x-ray optic includes at least one substrate having at least one surface extending at least partially around and along a longitudinal axis. A distance between the at least one surface and the longitudinal axis in at least one cross-sectional plane parallel to the longitudinal axis varies as a function of position along the longitudinal axis. The at least one x-ray optic further includes at least one mosaic crystal structure and/or a plurality of layers on or over at least a portion of the at least one surface. The plurality of layers has a first plurality of first layers comprising a first material and a second plurality of second layers comprising a second material. The first layers and the second layers alternate with one another in a direction perpendicular to the at least one surface.

公开(公告)号：US10416099B2

公开(公告)日：2019-09-17

申请号：US15927520

申请日：2018-03-21

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Srivatsan Seshadri ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  Alan Francis Lyon ,  Benjamin Donald Stripe

IPC: G01N23/00 ,  G01N23/085 ,  G21K1/06 ,  H01J35/02 ,  H01J35/10 ,  H01J35/12

Abstract: A method for performing x-ray absorption spectroscopy and an x-ray absorption spectrometer system to be used with a compact laboratory x-ray source to measure x-ray absorption of the element of interest in an object with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness laboratory x-ray source, an optical train to focus the x-rays through an object to be examined, and a spectrometer comprising a single crystal analyzer (and, in some embodiments, also a mosaic crystal) to disperse the transmitted beam onto a spatially resolving x-ray detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 105 mrad. and be coupled to an optical train that collects and focuses the high flux x-rays to spots less than 500 micrometers, leading to high flux density. The coatings of the optical train may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.

公开(公告)号：US20190011379A1

公开(公告)日：2019-01-10

申请号：US15927520

申请日：2018-03-21

Applicant: Sigray, Inc.

Inventor： Wenbing Yun ,  Srivatsan Seshadri ,  Sylvia Jia Yun Lewis ,  Janos Kirz ,  Alan Francis Lyon ,  Benjamin Donald Stripe

IPC: G01N23/085

CPC classification number: G01N23/085 ,  G21K1/06 ,  H01J35/02 ,  H01J35/10 ,  H01J35/12

Abstract: A method for performing x-ray absorption spectroscopy and an x-ray absorption spectrometer system to be used with a compact laboratory x-ray source to measure x-ray absorption of the element of interest in an object with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness laboratory x-ray source, an optical train to focus the x-rays through an object to be examined, and a spectrometer comprising a single crystal analyzer (and, in some embodiments, also a mosaic crystal) to disperse the transmitted beam onto a spatially resolving x-ray detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 105 mrad. and be coupled to an optical train that collects and focuses the high flux x-rays to spots less than 500 micrometers, leading to high flux density. The coatings of the optical train may also act as a “low-pass” filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.