公开(公告)号：US5767019A

公开(公告)日：1998-06-16

申请号：US697834

申请日：1996-08-28

申请人： Sang Wook Kim ,  Hae Jung Lee

发明人： Sang Wook Kim ,  Hae Jung Lee

IPC分类号： H01L21/28 ,  H01L21/768 ,  H01L21/336

CPC分类号： H01L21/76804 ,  H01L21/76831 ,  Y02P80/30

摘要： Disclosed is a method for forming a fine contact hole, and more particularly, a method capable of minimizing the loss of a silicon substrate. In the method for forming the contact hole according to the present invention, since the spacer is formed on the sidewall in the contact hole at the time of performing the dry etching process which makes it wide the approach to the contact hole, the contact area is hardly damaged by the etchant. Then, the dry etching process in accordance with the present invention can minimizes the loss of the substrate because the substrate to be exposed is under the protection of the insulating layer 43. The substrate can be less damaged than 100

摘要翻译： 公开了一种形成微细接触孔的方法，更具体地说，可以使硅衬底的损耗最小化的方法。 在根据本发明的形成接触孔的方法中，由于在执行干蚀刻处理时在接触孔的侧壁上形成间隔物，这使接近孔接近，接触面积为 几乎不被蚀刻剂损坏。 然后，根据本发明的干法蚀刻工艺可以最大限度地减少衬底的损耗，因为待暴露的衬底处于绝缘层43的保护之下。衬底的损伤可能小于100

公开(公告)号：US06975475B2

公开(公告)日：2005-12-13

申请号：US10294115

申请日：2002-11-14

申请人： Hae Jung Lee ,  Sang Lee ,  Keung Youn Cho

发明人： Hae Jung Lee ,  Sang Lee ,  Keung Youn Cho

IPC分类号： A45F5/00 ,  A45F5/10 ,  B65G7/12 ,  G11B5/00 ,  G11B5/012 ,  G11B5/02 ,  G11B20/10 ,  G11B20/18 ,  G11B27/36

CPC分类号： B65G7/12 ,  G11B5/012 ,  G11B5/02 ,  G11B20/10009 ,  G11B20/1816 ,  G11B27/36 ,  G11B2005/0013 ,  G11B2020/10898 ,  G11B2220/20

摘要： The invention includes a testing method which may be applied to at least one writer in a disk drive during the self-test phase to generate write parameters, focused on the Over Shoot Control (OSC) of the write current parameter to improve the reliability of write operations by that writer. The Minimum OSC is used for write operations in normal temperatures. The Optimum OSC is used for a first lower temperature range, preferably between essentially 15° Centigrade and essentially 5° Centigrade. The Maximum OSC is preferred below essentially 5° C. The Minimum OSC should preferably guarantee both an Adjacent Track Write (ATW) criteria, as well as guarantee a Write Induced Instability (WII) criteria. The invention includes the write parameter collection, as well as the disk drive containing the generated write parameter collection. The invention also includes the method of using that write parameter collection to control a writer while writing to tracks belonging to the radial zone collection and program systems implementing the invention's methods.

摘要翻译： 本发明包括测试方法，其可以在自检阶段期间应用于磁盘驱动器中的至少一个写入器以产生写入参数，其集中在写入当前参数的过拍控制（OSC）上，以提高写入的可靠性 作家的作业。 最低OSC用于正常温度下的写入操作。 最佳OSC用于第一较低的温度范围，优选在15摄氏度和基本上5摄氏度之间。 最小OSC优选低于基本上5°C。最小OSC应优选地保证相邻轨道写入（ATW）标准，以及保证写入诱发不稳定性（WII）标准。 本发明包括写入参数集合以及包含生成的写入参数集合的磁盘驱动器。 本发明还包括使用该写入参数集来控制写入器同时写入属于径向区域集合的轨道和实现本发明方法的程序系统的方法。

公开(公告)号：US20050264909A1

公开(公告)日：2005-12-01

申请号：US11176414

申请日：2005-07-06

申请人： Hae Jung Lee ,  Sang Lee ,  Keung Cho

发明人： Hae Jung Lee ,  Sang Lee ,  Keung Cho

IPC分类号： G11B21/02 ,  G11B5/00 ,  G11B5/02 ,  G11B5/455

CPC分类号： G11B5/455 ,  G11B2005/0008

摘要： The invention includes a testing method which may be applied to at least one writer in a disk drive during the self-test phase to generate write parameters, focused on the Over Shoot Control (OSC) of the write current parameter to improve the reliability of write operations by that writer. The Minimum OSC is used for write operations in normal temperatures. The Optimum OSC is used for a first lower temperature range, preferably between essentially 15 degrees Centigrade and essentially 5 degrees Centigrade. The Maximum OSC is preferred below essentially 5 degrees Centigrade. The Minimum OSC should preferably guarantee both an Adjacent Track Write (ATW) criteria, as well as guarantee a Write Induced Instability (WII) criteria. The invention includes the write parameter collection, as well as the disk drive containing the generated write parameter collection. The invention also includes the method of using that write parameter collection to control a writer while writing to tracks belonging to the radial zone collection and program systems implementing the invention's methods.

摘要翻译： 本发明包括测试方法，其可以在自检阶段期间应用于磁盘驱动器中的至少一个写入器以产生写入参数，其集中在写入当前参数的过拍控制（OSC）上，以提高写入的可靠性 作家的作业。 最低OSC用于正常温度下的写入操作。 最佳OSC用于第一较低温度范围，优选在基本上15摄氏度和基本上5摄氏度之间。 最高OSC优选低于基本上5摄氏度。 最小OSC应优选保证相邻轨道写入（ATW）标准，并保证写入诱发不稳定（WII）标准。 本发明包括写入参数集合以及包含生成的写入参数集合的磁盘驱动器。 本发明还包括使用该写入参数集来控制写入器同时写入属于径向区域集合的轨道和实现本发明方法的程序系统的方法。

公开(公告)号：US06956710B2

公开(公告)日：2005-10-18

申请号：US10458666

申请日：2003-06-09

申请人： Jong Yun Yun ,  Hae Jung Lee ,  Ken Bovatsek ,  Kieu Lien Dang

发明人： Jong Yun Yun ,  Hae Jung Lee ,  Ken Bovatsek ,  Kieu Lien Dang

IPC分类号： G11B5/02 ,  G11B5/012 ,  G11B5/596 ,  G11B5/09

CPC分类号： G11B5/59633 ,  G11B5/012

摘要： A method for determining and varying the capacity, track per inch and bit per inch values of a hard disk drive. The method includes determining an optimal track per inch value for each head of the drive. The method then determines whether each head does not exceed a threshold BER value. If one or more heads do not exceed the threshold BER value then the BPI (data rates) of the non-performing heads are decreased until an acceptable BER is achieved. The BPI of performing heads may be increased to insure that the capacity of the disk drive still meets a target value. Likewise, if all of the heads are above the threshold value, the BPI of one or more of the performing heads may be decreased to improve the BER of the heads. The reduction in BPI is limited so that the drive always meets the target capacity value. The BPI and TPI values are stored in memory for use during the operation of the drive.

摘要翻译： 用于确定和改变硬盘驱动器的容量，每英寸轨迹和英寸每英寸值的方法。 该方法包括为驱动器的每个头部确定每英寸值的最佳轨迹。 然后，该方法确定每个头部是否不超过阈值BER值。 如果一个或多个磁头不超过阈值BER值，则不良磁头的BPI（数据速率）降低直到达到可接受的BER。 可以增加执行磁头的BPI以确保磁盘驱动器的容量仍然满足目标值。 类似地，如果所有磁头都高于阈值，则可以减少一个或多个执行磁头的BPI以改善磁头的BER。 BPI的减少受到限制，因此驱动器始终满足目标容量值。 BPI和TPI值存储在存储器中以在驱动器的操作期间使用。

公开(公告)号：US06791780B2

公开(公告)日：2004-09-14

申请号：US09978904

申请日：2001-10-15

申请人： Hae Jung Lee ,  Sang Lee ,  Keung Youn Cho ,  Ken Bovatsek

发明人： Hae Jung Lee ,  Sang Lee ,  Keung Youn Cho ,  Ken Bovatsek

IPC分类号： G11B503

CPC分类号： G11B5/012 ,  G11B5/035 ,  G11B20/10009 ,  G11B27/3027 ,  G11B27/36 ,  G11B2005/0013

摘要： The present invention is a method and system to optimize a write channel in a hard disk drive. The method comprises providing a disk having a at least one side with a plurality of tracks, and selecting a target track from the plurality of tracks. Data is written at least once on a predetermined plurality of tracks adjacent to either side of the target track and on the target track. Data is also written a predetermined number of times on tracks immediately adjacent to the target track. Data written on the predetermined plurality of tracks adjacent to either side of the target track and on the target track is then read. The process then determines if a number of errors on the tracks is greater than a predetermined criteria, if so, a write current value of the write channel is decreased, otherwise the write current value is increased.

摘要翻译： 本发明是一种优化硬盘驱动器中的写入通道的方法和系统。 该方法包括提供具有多个轨迹的至少一个侧面的盘，以及从多个轨迹中选择目标轨迹。 在与目标轨道的任一侧相邻的预定多个轨道上和目标轨迹上至少写入一次数据。 在与目标轨迹相邻的轨迹上也写入预定次数的数据。 然后读取写入到与目标轨道的任一侧相邻的预定多个轨道上的数据和目标轨道上的数据。 然后，该过程确定磁道上的多个错误是否大于预定标准，如果是，则写入通道的写入当前值减小，否则写入电流值增加。