Top Plate Sampling Circuit Including Input-Dependent Dual Clock Boost Circuits

    公开(公告)号:US20190207617A1

    公开(公告)日:2019-07-04

    申请号:US16104978

    申请日:2018-08-20

    CPC classification number: H03M1/1245 G06F1/04 G11C27/02

    Abstract: In some examples, a system includes a first transistor comprising a first source terminal coupled to a first input terminal, a first drain terminal coupled to a first top plate sampling capacitor, and a first gate terminal. The system also includes a first input-dependent dual clock boost circuit coupled to the first input terminal via a first boost circuit input and to the first gate terminal via a first boost circuit output. The system further includes a second transistor comprising a second source terminal coupled to a second input terminal, a second drain terminal coupled to a second top plate sampling capacitor, and a second gate terminal. The system also includes a second input-dependent dual clock boost circuit coupled to the second input terminal via a second boost circuit input and to the second gate terminal of the second transistor via a second boost circuit output.

    ANALOG-TO-DIGITAL CONVERTER
    14.
    发明申请

    公开(公告)号:US20190013816A1

    公开(公告)日:2019-01-10

    申请号:US15859437

    申请日:2017-12-30

    Abstract: In some examples, a system comprises an analog-to-digital converter (ADC) to receive an analog input signal and a reset signal, the ADC to convert the analog input signal into a digital signal. The system comprises a digital-to-analog converter (DAC), coupled to the ADC, to convert the digital signal into an internal analog signal. The system includes a first capacitor, coupled to the DAC, to receive the internal analog signal. The system comprises a first switch, coupled to the first capacitor, to provide the analog input signal to the first capacitor. The system comprises a second switch to couple the first capacitor to ground.

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