-
公开(公告)号:US20220209782A1
公开(公告)日:2022-06-30
申请号:US17133745
申请日:2020-12-24
Applicant: Texas Instruments Incorporated
Inventor: Narasimhan RAJAGOPAL , Chirag Chandrahas SHETTY , Neeraj SHRIVASTAVA , Prasanth K , Eeshan MIGLANI
Abstract: A method of using an analog-to-digital converter system includes receiving a sampled voltage corresponding to one of an input voltage and a known voltage, causing preamplifiers to generate output signals based on the sampled voltage, generating first and second signals based on the output signals, causing a delay-resolving delay-to-digital backend to generate a single-bit digital signal representing an order of receipt of the first and second signals, and adjusting one or more of the preamplifiers based on the digital signal. The disclosure also relates to a system which includes a voltage-to-delay frontend and a delay-resolving backend, and to a method which includes causing a delay comparator to generate a single-bit digital signal representing an order of receipt of input signals, causing the comparator to transmit a residue delay signal to a succeeding comparator, and transmitting a signal to adjust one or more of the preamplifiers based on the digital signal.
-
公开(公告)号:US20170041014A1
公开(公告)日:2017-02-09
申请号:US15048027
申请日:2016-02-19
Applicant: Texas Instruments Incorporated
Inventor: Neeraj SHRIVASTAVA , Supreet JOSHI , Himanshu VARSHNEY , Jafar Sadique KAVILADATH , Visvesvaraya PENTAKOTA , Shagun DUSAD
CPC classification number: H03M1/1009 , H03M1/1019 , H03M1/1057 , H03M1/66 , H03M1/742 , H03M1/745 , H03M1/785
Abstract: The disclosure provides a current steering digital to analog converter (DAC) that includes a plurality of DAC elements. At least one DAC element of the plurality of DAC elements is coupled to a calibration circuit. The calibration circuit includes a fixed current source coupled to a primary node of the DAC element through a first estimation switch. A digital code generator is coupled to the primary node, and generates a first digital code corresponding to a primary voltage generated at the primary node. The digital code generator generates a second digital code. A correction DAC is coupled to the digital code generator and generates a bias voltage based on the second digital code. The bias voltage is provided to the DAC element such that a current flowing through each DAC element of the plurality of DAC elements is equal.
Abstract translation: 本公开提供了包括多个DAC元件的电流转向数模转换器(DAC)。 多个DAC元件中的至少一个DAC元件耦合到校准电路。 校准电路包括通过第一估计开关耦合到DAC元件的主节点的固定电流源。 数字码发生器耦合到主节点,并且产生对应于在主节点处产生的主电压的第一数字码。 数字代码生成器产生第二数字代码。 校正DAC耦合到数字代码发生器并且基于第二数字代码产生偏置电压。 偏置电压被提供给DAC元件,使得流过多个DAC元件中的每个DAC元件的电流相等。
-
公开(公告)号:US20210105021A1
公开(公告)日:2021-04-08
申请号:US17061730
申请日:2020-10-02
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Jawaharlal TANGUDU , Pankaj GUPTA , Sreenath Narayanan POTTY , Ajai PAULOSE , Chandrasekhar SRIRAM , Mahesh Ravi VARMA , Shabbar Abbasi VEJLANI , Neeraj SHRIVASTAVA , Himanshu VARSHNEY , Divyeshkumar Mahendrabhai PATEL , Raju Kharataram CHAUDHARI
Abstract: A non-linearity correction circuit includes a non-linearity coefficient estimation circuit. The non-linearity coefficient estimation circuit includes a data capture circuit, a non-linearity term generation circuit, a time-to-frequency conversion circuit, a bin identification circuit, a residual non-linearity conversion circuit, and a non-linearity coefficient generation circuit. The non-linearity term generation circuit is coupled to the data capture circuit. The time-to-frequency conversion circuit is coupled to the data capture circuit and the non-linearity term generation circuit. The bin identification circuit is coupled to the time-to-frequency conversion circuit. The residual non-linearity conversion circuit is coupled to the bin identification circuit. The non-linearity coefficient generation circuit is coupled to the bin identification circuit and the residual non-linearity conversion circuit.
-
公开(公告)号:US20190296758A1
公开(公告)日:2019-09-26
申请号:US16358456
申请日:2019-03-19
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Arun MOHAN , Neeraj SHRIVASTAVA
Abstract: An analog-to-digital converter including a first stage and a second stage. The first stage includes a first sample-and-hold (SH) having an input coupled to a voltage input node of the ADC, and having a first SH output. The first stage also includes a buffer, a first flash converter and a first digital-to-analog converter (DAC). The buffer has an input coupled to the first SH output and has a buffer output. The first flash converter has an input coupled to the first SH output, and has a first flash converter output. The first DAC has an input coupled to the first flash converter output. The second stage includes a second flash converter having an input coupled to the buffer output.
-
公开(公告)号:US20230387932A1
公开(公告)日:2023-11-30
申请号:US17825864
申请日:2022-05-26
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Narasimhan RAJAGOPAL , Nithin GOPINATH , Viswanathan NAGARAJAN , Neeraj SHRIVASTAVA , Visvesvaraya A. PENTAKOTA , Harshit MOONDRA , Abhinav CHANDRA
IPC: H03M1/10
CPC classification number: H03M1/1014
Abstract: A circuit includes a nonlinear analog-to-digital converter (ADC) configured to provide a first digital output based on an analog input signal. The circuit also includes a linearization circuit having a lookup table (LUT) memory configured to store initial calibration data. The linearization circuit is coupled to the nonlinear ADC and is configured to: determine updated calibration data based on the initial calibration data; replace the initial calibration data in the LUT memory with the updated calibration data; and provide a second digital output at a linearization circuit output of the linearization circuit based on the first digital output and the updated calibration data.
-
公开(公告)号:US20190207564A1
公开(公告)日:2019-07-04
申请号:US15859431
申请日:2017-12-30
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Ani Xavier , Neeraj SHRIVASTAVA , Arun MOHAN , Shagun DUSAD
CPC classification number: H03F1/301 , H03F1/0205 , H03F3/45179 , H03F2203/45286
Abstract: In some examples, an amplifier stage includes a voltage-gain amplifier stage and a negative capacitance circuit coupled to the voltage-gain amplifier stage, the negative capacitance circuit comprising a first transistor that provides a first temperature-biased current.
-
公开(公告)号:US20250023575A1
公开(公告)日:2025-01-16
申请号:US18524652
申请日:2023-11-30
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Rishi SOUNDARARAJAN , Visvesvaraya Appala PENTAKOTA , Sai Vikas KANDIMALLA , Neeraj SHRIVASTAVA , Eeshan MIGLANI
IPC: H03M1/10
Abstract: An analog-to-digital converter (ADC) includes: a time-domain ADC core; and a calibration circuit. The time-domain ADC core includes: a first delay-to-digital stage having a terminal; a second delay-to-digital stage having a terminal; a third delay-to-digital stage having a terminal. The calibration circuitry is coupled to the terminal of the first delay-to-digital stage, the terminal of the second delay-to-digital stage, and the terminal of the third delay-to-digital stage of stages. The calibration circuitry is configured to calibrate the first delay-to-digital stage, the second delay-to-digital stage, and the third delay-to-digital stage based on a zero-crossing calibration and an over-range calibration. The over-range calibration sets a maximum threshold and a minimum threshold for the time-domain ADC relative to a reference voltage.
-
8.
公开(公告)号:US20200212921A1
公开(公告)日:2020-07-02
申请号:US16234685
申请日:2018-12-28
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Sai Aditya KrishnaSwamy NURANI , Arun MOHAN , Shagun DUSAD , Neeraj SHRIVASTAVA
Abstract: A top-plate sampling analog-to-digital converter (ADC) circuit includes a first ADC stage and a residue amplifier coupled to the first ADC stage. The residue amplifier comprises a first transistor with a control terminal, a first current terminal, and a second current terminal. The residue amplifier also comprises a second transistor with a control terminal, a first current terminal, and a second current terminal. The residue amplifier also comprises a linearity adjustment circuit coupled to a second current terminal of at least one of the first transistor and the second transistor. The linearity adjustment circuit comprises at least one switch that changes its state as a function of an input sampling phase and a gain phase of the residue amplifier.
-
公开(公告)号:US20190207619A1
公开(公告)日:2019-07-04
申请号:US16211259
申请日:2018-12-06
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Jafar Sadique KAVILADATH , Neeraj SHRIVASTAVA
IPC: H03M1/36 , H03K19/0175
CPC classification number: H03M1/361 , H03K19/017509 , H03M1/145
Abstract: A circuit, which is usable in a flash analog-to-digital converter, includes a first switch configured to provide a first reference voltage to a first reference node responsive to a first control signal and a second switch configured to provide the first reference voltage to a second reference node responsive to a second control signal. A third switch is coupled to the first switch and is configured to provide a second reference voltage to the first reference node responsive to a clock signal. Further, a fourth switch is coupled to the second switch and configured to provide the second reference voltage to the second reference node responsive to the clock signal.
-
公开(公告)号:US20240372557A1
公开(公告)日:2024-11-07
申请号:US18772635
申请日:2024-07-15
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Narasimhan RAJAGOPAL , Nithin GOPINATH , Viswanathan NAGARAJAN , Neeraj SHRIVASTAVA , Visvesvaraya A. PENTAKOTA , Harshit MOONDRA , Abhinav CHANDRA
IPC: H03M1/10
Abstract: A circuit includes a nonlinear analog-to-digital converter (ADC) configured to provide a first digital output based on an analog input signal. The circuit also includes a linearization circuit having a lookup table (LUT) memory configured to store initial calibration data. The linearization circuit is coupled to the nonlinear ADC and is configured to: determine updated calibration data based on the initial calibration data; replace the initial calibration data in the LUT memory with the updated calibration data; and provide a second digital output at a linearization circuit output of the linearization circuit based on the first digital output and the updated calibration data.
-
-
-
-
-
-
-
-
-