公开(公告)号：US20190338399A1

公开(公告)日：2019-11-07

申请号：US16518217

申请日：2019-07-22

Applicant: United Technologies Corporation

Inventor： Thomas J. Watson ,  Iuliana Cernatescu

IPC: C22C21/00 ,  C22C1/04 ,  B22F3/20 ,  B22F9/04 ,  C22F1/04 ,  B22F3/17 ,  B22F3/02

Abstract: A composition comprises, in weight percent: Al as a largest constituent; 3.0-6.0 Cr; 1.5-4.0 Mn; 0.1-3.5 Co; and 0.3-2.0 Zr.

公开(公告)号：US10458929B2

公开(公告)日：2019-10-29

申请号：US16184068

申请日：2018-11-08

Applicant: United Technologies Corporation

Inventor： Iuliana Cernatescu ,  Vasisht Venkatesh ,  David Ulrich Furrer

IPC: G01N23/207 ,  G01N23/20016 ,  G01N23/20008

Abstract: A system for the x-ray topography analysis of a sample, comprising in combination, a goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base. The system also includes an x-ray source operatively coupled with the tube arm and is capable of emitting a non-collimated beam of x-rays. A collimator is operatively associated with the x-ray source and converts the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions. A detector operatively coupled to the detector arm.

公开(公告)号：US10450636B2

公开(公告)日：2019-10-22

申请号：US14902709

申请日：2014-07-09

Applicant: United Technologies Corporation

Inventor： Thomas J. Watson ,  Iuliana Cernatescu

IPC: C22C21/00 ,  B22F3/02 ,  B22F3/17 ,  B22F3/20 ,  B22F9/04 ,  C22F1/04 ,  C22C1/04

Abstract: A composition comprises, in weight percent: Al as a largest constituent; 3.0 6.0 Cr; 1.5 4.0 Mn; 0.1 3.5 Co; and 0.3 2.0 Zr.

公开(公告)号：US20170089845A1

公开(公告)日：2017-03-30

申请号：US14867882

申请日：2015-09-28

Applicant: United Technologies Corporation

Inventor： Iuliana Cernatescu ,  David U. Furrer ,  Venkatarama K. Seetharaman

IPC: G01N23/18

CPC classification number: G01N23/20 ,  G01N23/06 ,  G01N23/083 ,  G01N23/087 ,  G01N23/12 ,  G01N23/18 ,  G01N23/20016 ,  G01N23/20025 ,  G01N23/205 ,  G01N2223/316 ,  G01N2223/61 ,  G01N2223/6116 ,  G01N2223/63 ,  G01N2223/6466

Abstract: Aspects of the disclosure are directed to an analysis of a material of a component. A radiation source is activated to transmit radiation to the component. A beam pattern is obtained based on the component interfering with the radiation. The beam pattern is compared to a reference beam pattern. An anomaly is detected to exist in the material when the comparison indicates a deviation between the beam pattern and the reference beam pattern.

公开(公告)号：US20160209340A1

公开(公告)日：2016-07-21

申请号：US14600511

申请日：2015-01-20

Applicant: United Technologies Corporation

Inventor： Iuliana Cernatescu ,  Vasisht Venkatesh ,  David Ulrich Furrer

IPC: G01N23/207 ,  G01N23/20

CPC classification number: G01N23/207 ,  G01N23/20016 ,  G01N2223/605 ,  G01N2223/606 ,  G01N2223/632

Abstract: A system for the x-ray topography analysis of a sample, comprising in combination, a goniometer having a base, a tube arm rotatably associated with the base, a detector arm rotatably associated with the base, and a sample stage operatively associated with the base. The system also includes an x-ray source operatively coupled with the tube arm and is capable of emitting a non-collimated beam of x-rays. A collimator is operatively associated with the x-ray source and converts the non-collimated beam of x-rays into a collimated beam of x-rays having a quasi-rectangular shape with a divergence less than three degrees in all directions. A detector operatively coupled to the detector arm.

Abstract translation: 一种用于样品的X射线形貌分析的系统，包括组合的测角器，具有基座的测角器，与所述基座可旋转地相关联的管臂，与所述基座可旋转地相关联的检测器臂以及与所述基座可操作地相关联的样品台 。 该系统还包括与管臂可操作地耦合并且能够发射非准直的X射线的X射线源。 准直器与x射线源可操作地相关联，并将非准直的X射线束转换成具有准矩形形状的准直的X射线束，其在所有方向上的发散小于三度。 可操作地耦合到检测器臂的检测器。