Abstract:
A device is for detecting a relative positioning of two clock signals including a fast clock signal and a slow clock signal. The fast clock frequency may be n times greater than a slow clock frequency, and n includes an integer greater than 1. The device includes a phase logic signal generator for generating a phase logic signal from the two clock signals by assigning a predetermined logic value to the phase logic signal when a rising edge of the fast clock signal matches a predetermined location of the slow clock signal.
Abstract:
Data stored in a first memory are processed by a processing device comprising a processor, a second memory, and an interface device interfacing the processing device with the first memory. In the interface device, in order to facilitate transfer of data from the first memory where data are stored in a first data format to the second memory where data are stored in a second data format, a first group of data is received from the first memory, with said group ordered into a sequence corresponding to the first data format. Then at least one second group of data is obtained by ordering said data in the first group into a new sequence which is a function of the first and second data formats. The second group of data is stored in the second memory.
Abstract:
A frequency-doubling block includes an input terminal for the incident signal, a first variable delay cell linked to the input, and an EXCLUSIVE OR gate, one input of which is linked to the output of the first delay cell, the other input of which is linked to the input terminal, and the output of which is able to deliver an output clock signal at twice the frequency of the incident signal. A comparison circuit compares the duty ratio of the output signal with a predetermined reference value and a modulation circuit modulates the value of the first delay as a function of the result of the comparison.
Abstract:
The present invention provides a circuit capable of operating according to a normal operating mode or to a structural operating mode. The test mode is stored in an internal flip-flop via an interface of the circuit. In test mode, the flip-flop is insulated from the interface by multiplexing means. To exit the test mode, an input temporarily dedicated to this function is used, this input being then insulated by multiplexing means from the rest of the circuit.