公开(公告)号：US20240170864A1

公开(公告)日：2024-05-23

申请号：US18552037

申请日：2022-03-03

Applicant: SENSORVIEW CO., LTD. ,  OKINS ELECTRONICS CO., LTD

Inventor： Byoung Nam KIM ,  Kyoung Il KANG ,  Joung Min PARK ,  Sung Cheol CHO ,  Jin Kook JUN ,  Sung Gyu PARK ,  Soeung Chel JANG

IPC: H01R9/05 ,  H01R24/40 ,  H01R103/00

CPC classification number: H01R9/0524 ,  H01R24/40 ,  H01R2103/00

Abstract: A plug connector coupled to a receptacle connector is presented, comprising: a conductor for signals; a ring-shaped conductor for ground, the conductor for ground surrounding the conductor for signals; a ring-shaped insulator surrounding the conductor for signals and being surrounded by the conductor for ground, and insulating between the conductor for signals and the conductor for ground; a lower body; and an upper body coupled onto the lower body. The conductor for signals includes a lower portion protruding below a first portion of the top of the insulator, a middle portion inserted into a hollow portion of the first portion, and an upper portion protruding above the first portion. The conductor for ground includes a lower portion protruding below the first portion and an upper portion surrounding the first portion. The lower body includes a lower housing, such that the upper portion is accommodated in the hollow portion.

公开(公告)号：US20230395413A1

公开(公告)日：2023-12-07

申请号：US18452271

申请日：2023-08-18

Applicant: OKINS ELECTRONICS CO., LTD

Inventor： Jin Kook JUN ,  Sung Gye PARK ,  Soung Hun CHOI

IPC: H01L21/677 ,  H01F7/02

CPC classification number: H01L21/67721 ,  H01F7/0252

Abstract: Provided is a magnetic collet. The magnetic collet includes adsorption rubber including a plurality of individual holes passing therethrough from a contact surface, which is one surface of the adsorption rubber, coming into contact with a semiconductor chip to the other surface thereof, and a metal plate including a common hole which passes therethrough from one surface of the metal plate to the other surface thereof and provides a common passage connected to the individual holes and stacked on the adsorption rubber.

公开(公告)号：US20230314472A1

公开(公告)日：2023-10-05

申请号：US18130431

申请日：2023-04-04

Applicant: okins electronics Co.,Ltd

Inventor： Jin Kook JUN ,  Chan Ho Lee ,  Seung Hyun NOH

IPC: G01R1/04 ,  G01R31/28

CPC classification number: G01R1/0466 ,  G01R31/2863

Abstract: A contact pin for a test socket is provided in the test socket for testing the electrical characteristics of a semiconductor device. The contact pin includes an elastic part elastically deformable in the longitudinal direction of the contact pin; a first contact part which includes a first support part extending from one end of the elastic part and a first contact tip connected to an end of the first support part; and a second contact part which includes a second support part extending from the other end of the elastic part and a second contact tip connected to an end of the second support part, where the elastic part and the second contact part are bent in at least one direction with respect to the first contact part.

公开(公告)号：US20220336973A1

公开(公告)日：2022-10-20

申请号：US17719506

申请日：2022-04-13

Applicant: Hyun Duk KIM ,  Sensorview Co., Ltd. ,  okins electronics Co.,Ltd

Inventor： Byoung Nam KIM ,  Kyoung Il KANG ,  Jin Woo LEE ,  Jin Kook JUN ,  Sung Gyu PARK ,  Hyun Duk KIM ,  Jong Wook HAM ,  Sang Woo HAN

IPC: H01R9/05 ,  H01R13/17 ,  H01R13/502

Abstract: Disclosed is a cable adaptor comprising a first member which is conductive and comes into contact with a signal pin of the cable, a second member disposed outside the first member and coupled to the first member, a third member which is conductive and disposed outside the second member, and a contact pin fixed to the first member. Here, the first member includes a first body coupled to the second member and a first contact portion which extends from the first body and comes into contact with the signal pin. The third member includes a second body coupled to the second member and a second contact portion which extends from the second body and comes into contact with the outer conductor. A plurality of first contact points of the signal pin and the first contact portion are arranged at same intervals along a circumferential direction of the signal pin.

公开(公告)号：US20210199692A1

公开(公告)日：2021-07-01

申请号：US16812147

申请日：2020-03-06

Applicant: OKINS ELECTRONICS CO., LTD

Inventor： Jin Kook JUN ,  Eun Hyeong PYO ,  Won Ho CHOI

IPC: G01R1/067 ,  G01R1/04 ,  G01R1/073

Abstract: There is provided a probe pin for performing an electrical inspection between a contact pad of a test apparatus and a conductive ball of a semiconductor device, the probe pin including a cylinder-type bottom plunger connected to the contact pad and configured to slide vertically, a piston-type top plunger connected to the conductive ball and configured to slide vertically, and an outer spring configured to provide an elastic force between the bottom plunger and the top plunger. According to the configuration of the present invention, it is possible to perform a stable inspection process by using the outer spring despite pin miniaturization.