公开(公告)号：US11982648B2

公开(公告)日：2024-05-14

申请号：US17107646

申请日：2020-11-30

Applicant: Etegent Technologies, Ltd.

Inventor： Oleg Lobkis ,  Richard A. Roth ,  Christopher G. Larsen ,  Stuart J. Shelley

IPC: G01L11/06 ,  F01D17/08 ,  G01H11/00 ,  G01L1/10 ,  G01L1/25 ,  G01N29/07 ,  G01N29/12 ,  G01N29/24 ,  G01N29/32 ,  G01P15/097 ,  G01P15/10 ,  F01D17/02

CPC classification number: G01N29/326 ,  F01D17/08 ,  F01D17/085 ,  G01H11/00 ,  G01L1/10 ,  G01L1/255 ,  G01L11/06 ,  G01N29/07 ,  G01N29/12 ,  G01N29/2462 ,  G01P15/10 ,  F01D17/02 ,  F05D2220/32 ,  G01L1/106 ,  G01N2291/0215 ,  G01N2291/02827 ,  G01N2291/02872 ,  G01N2291/02881 ,  G01N2291/0421 ,  G01N2291/0422 ,  G01N2291/0426 ,  G01N2291/0427 ,  G01P15/097

Abstract: An environmental condition may be measured with a sensor (10) including a wire (20) having an ultrasonic signal transmission characteristic that varies in response to the environmental condition by sensing ultrasonic energy propagated through the wire using multiple types of propagation, and separating an effect of temperature on the wire from an effect of strain on the wire using the sensed ultrasonic energy propagated through the wire using the multiple types of propagation. A positive feedback loop may be used to excite the wire such that strain in the wire is based upon a sensed resonant frequency, while a square wave with a controlled duty cycle may be used to excite the wire at multiple excitation frequencies. A phase matched cone (200, 210) may be used to couple ultrasonic energy between a waveguide wire (202, 212) and a transducer (204, 214).

公开(公告)号：US20230134403A1

公开(公告)日：2023-05-04

申请号：US18068911

申请日：2022-12-20

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Liggett ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G05B19/418 ,  G05B19/4063

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US20230091072A1

公开(公告)日：2023-03-23

申请号：US18058586

申请日：2022-11-23

Applicant: Etegent Technologies Ltd.

Inventor： Thomas D. Sharp ,  Richard A. Roth, II ,  Uriah M. Liggett ,  Joseph M. Kesler

IPC: G06F17/10 ,  G06Q10/04 ,  G06Q10/06

Abstract: Methods manage non-destructive evaluation (“NDE”) data. NDE data for an asset is received and at least one alignment algorithm to align the NDE data to a simulated model associated therewith is determined. The NDE data is automatically aligned to the simulated model, a display representation that visually represents the aligned NDE data on the simulated model is generated, and information about the aligned NDE data is exported. Additionally, second NDE data associated with the at least a portion of the asset may also be received, at least one alignment algorithm to align the data determined, and the second NDE data aligned. Respective indications associated with the first and second NDE data may be determined and visually represented on the simulated model. Moreover, a shot descriptor file may be analyzed to determine whether additional NDE data is required to complete an alignment of NDE data.

公开(公告)号：US11543811B2

公开(公告)日：2023-01-03

申请号：US15863534

申请日：2018-01-05

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Ligget ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G05B19/418 ,  G05B19/4063

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US20200218242A9

公开(公告)日：2020-07-09

申请号：US15863534

申请日：2018-01-05

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Ligget ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G05B19/418

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US20140277662A1

公开(公告)日：2014-09-18

申请号：US14211600

申请日：2014-03-14

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Liggett ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G06F17/50

CPC classification number: G05B19/41875 ,  B64F5/60 ,  G05B2219/32189 ,  G06Q10/06 ,  G06Q50/04 ,  Y02P90/22 ,  Y02P90/26 ,  Y02P90/30

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

Abstract translation: 用于通过制造过程分析，监测和/或建模零件的制造的方法，装置和计算机程序产品。 从部件类型的制造部件收集的非破坏性评估数据和/或质量相关数据可以与与部件类型相关联的模拟模型对齐。 基于对齐的数据，可以监视制造过程以确定制造过程是否正常运行; 制造过程的方面可以与对准的数据在空间上相关; 和/或可以分析制造过程。

公开(公告)号：US20130289943A1

公开(公告)日：2013-10-31

申请号：US13926517

申请日：2013-06-25

Applicant: Etegent Technologies, Ltd.

Inventor： Thomas D. Sharp ,  Richard A. Roth, II ,  Uriah M. Liggett ,  Joseph M. Kesler

IPC: G06F17/10

CPC classification number: G06F17/10 ,  G06Q10/04 ,  G06Q10/06

Abstract: Methods manage non-destructive evaluation (“NDE”) data. NDE data for an asset is received and at least one alignment algorithm to align the NDE data to a simulated model associated therewith is determined. The NDE data is automatically aligned to the simulated model, a display representation that visually represents the aligned NDE data on the simulated model is generated, and information about the aligned NDE data is exported. Additionally, second NDE data associated with the at least a portion of the asset may also be received, at least one alignment algorithm to align the data determined, and the second NDE data aligned. Respective indications associated with the first and second NDE data may be determined and visually represented on the simulated model. Moreover, a shot descriptor file may be analyzed to determine whether additional NDE data is required to complete an alignment of NDE data.

Abstract translation: 方法管理非破坏性评估（“NDE”）数据。 接收到资产的NDE数据，并且确定至少一个对准算法以将NDE数据与与其相关联的模拟模型对准。 NDE数据自动对准模拟模型，生成可视化表示模拟模型上对齐的NDE数据的显示表示，并输出关于对齐NDE数据的信息。 此外，还可以接收与资产的至少一部分相关联的第二NDE数据，至少一个对准算法以使确定的数据和第二NDE数据对准。 可以在模拟模型上确定与视觉上表示与第一和第二NDE数据相关的各种指示。 此外，可以分析镜头描述符文件以确定是否需要附加NDE数据来完成NDE数据的对准。