公开(公告)号：US11514133B2

公开(公告)日：2022-11-29

申请号：US16875534

申请日：2020-05-15

Applicant: Etegent Technologies Ltd.

Inventor： Thomas D. Sharp ,  Richard A. Roth, II ,  Uriah M. Liggett ,  Joseph M. Kesler

IPC: G06F17/10 ,  G06Q10/04 ,  G06Q10/06

Abstract: Methods manage non-destructive evaluation (“NDE”) data. NDE data for an asset is received and at least one alignment algorithm to align the NDE data to a simulated model associated therewith is determined. The NDE data is automatically aligned to the simulated model, a display representation that visually represents the aligned NDE data on the simulated model is generated, and information about the aligned NDE data is exported. Additionally, second NDE data associated with the at least a portion of the asset may also be received, at least one alignment algorithm to align the data determined, and the second NDE data aligned. Respective indications associated with the first and second NDE data may be determined and visually represented on the simulated model. Moreover, a shot descriptor file may be analyzed to determine whether additional NDE data is required to complete an alignment of NDE data.

公开(公告)号：US20180067897A1

公开(公告)日：2018-03-08

申请号：US15799583

申请日：2017-10-31

Applicant: Etegent Technologies Ltd.

Inventor： Thomas D. Sharp ,  Richard Allan Roth, II ,  Uriah M. Ligget ,  Joe Kesler

IPC: G06F17/10 ,  G06Q10/04 ,  G06Q10/06

CPC classification number: G06F17/10 ,  G06Q10/04 ,  G06Q10/06

Abstract: Methods manage non-destructive evaluation (“NDE”) data. NDE data for an asset is received and at least one alignment algorithm to align the NDE data to a simulated model associated therewith is determined. The NDE data is automatically aligned to the simulated model, a display representation that visually represents the aligned NDE data on the simulated model is generated, and information about the aligned NDE data is exported. Additionally, second NDE data associated with the at least a portion of the asset may also be received, at least one alignment algorithm to align the data determined, and the second NDE data aligned. Respective indications associated with the first and second NDE data may be determined and visually represented on the simulated model. Moreover, a shot descriptor file may be analyzed to determine whether additional NDE data is required to complete an alignment of NDE data.

公开(公告)号：US09864366B2

公开(公告)日：2018-01-09

申请号：US14211600

申请日：2014-03-14

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Liggett ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G06F17/50 ,  G05B19/418 ,  G06Q10/06 ,  G06Q50/04 ,  B64F5/60

CPC classification number: G05B19/41875 ,  B64F5/60 ,  G05B2219/32189 ,  G06Q10/06 ,  G06Q50/04 ,  Y02P90/22 ,  Y02P90/26 ,  Y02P90/30

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US10657197B2

公开(公告)日：2020-05-19

申请号：US15799583

申请日：2017-10-31

Applicant: Etegent Technologies Ltd.

Inventor： Thomas D. Sharp ,  Richard Allan Roth, II ,  Uriah M. Ligget ,  Joe Kesler

IPC: G06F17/10 ,  G06Q10/04 ,  G06Q10/06

Abstract: Methods manage non-destructive evaluation (“NDE”) data. NDE data for an asset is received and at least one alignment algorithm to align the NDE data to a simulated model associated therewith is determined. The NDE data is automatically aligned to the simulated model, a display representation that visually represents the aligned NDE data on the simulated model is generated, and information about the aligned NDE data is exported. Additionally, second NDE data associated with the at least a portion of the asset may also be received, at least one alignment algorithm to align the data determined, and the second NDE data aligned. Respective indications associated with the first and second NDE data may be determined and visually represented on the simulated model. Moreover, a shot descriptor file may be analyzed to determine whether additional NDE data is required to complete an alignment of NDE data.

公开(公告)号：US09804997B2

公开(公告)日：2017-10-31

申请号：US13926517

申请日：2013-06-25

Applicant: Etegent Technologies, Ltd.

Inventor： Thomas D. Sharp ,  Richard A. Roth, II ,  Uriah M. Liggett ,  Joseph M. Kesler

IPC: G06F17/10 ,  G06Q10/04 ,  G06Q10/06

CPC classification number: G06F17/10 ,  G06Q10/04 ,  G06Q10/06

Abstract: Methods manage non-destructive evaluation (“NDE”) data. NDE data for an asset is received and at least one alignment algorithm to align the NDE data to a simulated model associated therewith is determined. The NDE data is automatically aligned to the simulated model, a display representation that visually represents the aligned NDE data on the simulated model is generated, and information about the aligned NDE data is exported. Additionally, second NDE data associated with the at least a portion of the asset may also be received, at least one alignment algorithm to align the data determined, and the second NDE data aligned. Respective indications associated with the first and second NDE data may be determined and visually represented on the simulated model. Moreover, a shot descriptor file may be analyzed to determine whether additional NDE data is required to complete an alignment of NDE data.

公开(公告)号：US20230134403A1

公开(公告)日：2023-05-04

申请号：US18068911

申请日：2022-12-20

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Liggett ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G05B19/418 ,  G05B19/4063

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US20230091072A1

公开(公告)日：2023-03-23

申请号：US18058586

申请日：2022-11-23

Applicant: Etegent Technologies Ltd.

Inventor： Thomas D. Sharp ,  Richard A. Roth, II ,  Uriah M. Liggett ,  Joseph M. Kesler

IPC: G06F17/10 ,  G06Q10/04 ,  G06Q10/06

Abstract: Methods manage non-destructive evaluation (“NDE”) data. NDE data for an asset is received and at least one alignment algorithm to align the NDE data to a simulated model associated therewith is determined. The NDE data is automatically aligned to the simulated model, a display representation that visually represents the aligned NDE data on the simulated model is generated, and information about the aligned NDE data is exported. Additionally, second NDE data associated with the at least a portion of the asset may also be received, at least one alignment algorithm to align the data determined, and the second NDE data aligned. Respective indications associated with the first and second NDE data may be determined and visually represented on the simulated model. Moreover, a shot descriptor file may be analyzed to determine whether additional NDE data is required to complete an alignment of NDE data.

公开(公告)号：US11543811B2

公开(公告)日：2023-01-03

申请号：US15863534

申请日：2018-01-05

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Ligget ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G05B19/418 ,  G05B19/4063

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US20200218242A9

公开(公告)日：2020-07-09

申请号：US15863534

申请日：2018-01-05

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Ligget ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G05B19/418

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

公开(公告)号：US20140277662A1

公开(公告)日：2014-09-18

申请号：US14211600

申请日：2014-03-14

Applicant: Etegent Technologies Ltd.

Inventor： Joseph M. Kesler ,  Thomas D. Sharp ,  Uriah M. Liggett ,  Brian Bahr ,  Chris M. Hodapp ,  Gary E. Coyan

IPC: G06F17/50

CPC classification number: G05B19/41875 ,  B64F5/60 ,  G05B2219/32189 ,  G06Q10/06 ,  G06Q50/04 ,  Y02P90/22 ,  Y02P90/26 ,  Y02P90/30

Abstract: Methods, apparatus, and computer program products for analyzing, monitoring, and/or modeling the manufacture of a type of part by a manufacturing process. Non-destructive evaluation data and/or quality related data collected from manufactured parts of the type of part may be aligned to a simulated model associated with the type of part. Based on the aligned data, the manufacturing process may be monitored to determine whether the manufacturing process is operating properly; aspects of the manufacturing process may be spatially correlated to the aligned data; and/or the manufacturing process may be analyzed.

Abstract translation: 用于通过制造过程分析，监测和/或建模零件的制造的方法，装置和计算机程序产品。 从部件类型的制造部件收集的非破坏性评估数据和/或质量相关数据可以与与部件类型相关联的模拟模型对齐。 基于对齐的数据，可以监视制造过程以确定制造过程是否正常运行; 制造过程的方面可以与对准的数据在空间上相关; 和/或可以分析制造过程。