Abstract:
A method controls probe measurement using an electronic device. The method receives user-defined identification data of a probe if a preset configuration file is not stored in a storage device of the electronic device, and fits a three dimensional (3D) model of the probe according to the user-defined identification data of the probe. The method further updates the user-defined identification data of the probe if the fitted 3D model does not match the probe, or stores the user-defined identification data of the probe in a user-defined configuration file if the fitted 3D model matches the probe, and controls the probe to execute measurement according to the user-defined configuration file.
Abstract:
In a method for processing a point cloud using a computing device, a straight line fitted by the point cloud comprising border points is determined as a benchmark line. An inflection point in the point cloud of the benchmark line is determined. If the vertical distance of the inflection point is not greater than the preset filtration value, needless border points in the point cloud are deleted and a remainder point cloud is obtained. If the vertical distance between the inflection point and the benchmark line is greater than a filtration value, the point cloud is divided into two sub-point clouds, and the one sub-point cloud having border points less than the preset number is deleted, and the other sub-point cloud is set as a remainder point cloud.
Abstract:
In a computing device, computerized method, and a non-transitory storage medium, correction data of a probe holder is read. The probe holder comprises one or more slots that houses all available probes and is placed on the coordinate measuring machine. The correction data comprises coordinates of the slots. A coordinate of one of the slots is obtained from the correction data. A Z-axis of the coordinate measuring machine moves to a position that corresponds to the extracted coordinates, to detach a probe which is currently installed on the Z-axis and to place the detached probe into the slot, and/or to pick up and install another probe which is currently housed in the slot onto the Z-axis.
Abstract:
A calibration plate is configured for revising an image capture apparatus of a vision measuring system. The vision measuring system includes a worktable which is configured for supporting the calibration plate. The calibration plate includes a quadrate portion. A calibration area and a zero marker are formed on the quadrate portion. The calibration area includes a plurality of regions having the same shape.
Abstract:
In an electronic device, an image point A on an image of an object is selected. A spectral confocal sensor is controlled to move to a position above a measuring point A′ on the object, where the measuring point A′ corresponds to the image point A, and a Z-coordinate of the measuring point A′ is computed using the spectral confocal sensor. A focal position of the measuring point A′ is computed according to the Z-coordinate of the measuring point A′, and a CCD lens is controlled to move to the focal position. The Z-coordinate of the measuring point A′ is stored into a storage unit of the electronic device.
Abstract:
A computing device connects with a vision measuring machine (VMS). Then the computing device generates a one time password (OTP). A size of the OTP, the OTP are stored in a predefined file. The computing device obtains a size of measurement program codes of the VMS. The size of the OTP and the size of the measurement program codes are stored in the predefined file. The measurement program codes are encrypted by the OTP. If the measurement data includes image data of an object which is measured by the VMS, the computing device stores the encrypted program codes, a type of the image data, image data, and a size of the image data in the predefined file.
Abstract:
A measurement apparatus includes a lamp mount including a first mount and a second mount. The first mount has a first cavity to mount an observation module. The second mount has a second cavity to mount an image capture module. The measurement apparatus further includes a plurality of light modules mounted on an undersurface of the lamp mount. The second mount is disposed with an included angle relative to a first axis of the first cavity so that a second axis of the second cavity and the first axis converge on a point. The undersurface of the lamp mount is concave so that light from the light modules tilts toward the first axis, and the light and the first axis also converge on the point.
Abstract:
A measuring device and method is used to select focusing points on an object. A CCD of the measuring device is positioned at the top of an initial focusing range, then moves to the bottom of the initial focusing range at a first speed to capture first images of the object. Image points corresponding to each focusing point in the first images are identified to compute coordinates of a first focal point of each focusing point. The initial focusing range is updated according to Z-coordinates of the first focal points. The CCD is positioned at the bottom of the updated focusing range, then, moves to the top of the updated focusing range at a second speed to capture second images of the object. Image points corresponding to each focusing point in the second images are identified to compute coordinates of a second focal point of each focusing point.
Abstract:
A computing device and method for programming a measuring program into the device. The system and method divide an ideal image into one or more sections and obtains the attributes of each of the sections. The system and method measure dimensions from a desired position located in each of the sections based on a coordinate system created for each of the sections, and obtains ideal measurements from the desired position. The system and method generate a measuring program which is capable of executing the steps mentioned above.
Abstract:
A method detects a status of an image measuring machine using an electronic device. The method searches a measuring process of the image measuring machine, records a closed status of the image measuring machine if the measuring process has not been found, obtains status information of the image measuring machine if the measuring process has been found, and calculates a variation of the status information. The method further records a stopped status of the image measuring machine if the variation of the status information is less than a preset value within a specified length of time, or records an operating status of the image measuring machine if the variation of the status information is greater than or equal to the preset value within the specified length of time.