公开(公告)号：US20080278992A1

公开(公告)日：2008-11-13

申请号：US12140366

申请日：2008-06-17

Applicant: Ching-Te Chuang ,  Jae-Joon Kim ,  Keunwoo Kim

Inventor： Ching-Te Chuang ,  Jae-Joon Kim ,  Keunwoo Kim

IPC: G11C11/00

CPC classification number: G11C11/412

Abstract: Techniques are provided for employing independent gate control in asymmetrical memory cells. A memory circuit, such as an SRAM circuit, can include a number of bit line structures, a number of word line structures that intersect the bit line structures to form a number of cell locations, and a number of asymmetrical memory cells located at the cell locations. Each of the asymmetrical cells can be selectively coupled to a corresponding one of the bit line structures under control of a corresponding one of the word line structures. Each of the cells can include a number of field effect transistors (FETS), and at least one of the FETS can be configured with separately biased front and back gates. One gate can be biased separately from the other gate in a predetermined manner to enhance read stability of the asymmetrical cell.

Abstract translation: 提供了在不对称存储单元中采用独立门控制的技术。 诸如SRAM电路的存储器电路可以包括多个位线结构，与位线结构相交以形成多个单元位置的多个字线结构以及位于单元的多个非对称存储单元 位置。 每个非对称单元可以在相应的一个字线结构的控制下选择性地耦合到位线结构中的对应的一个。 每个单元可以包括多个场效应晶体管（FETS），并且FETS中的至少一个可以被配置为单独偏置的前门和后门。 一个栅极可以以预定的方式与另一个栅极分开偏置，以增强不对称单元的读取稳定性。

公开(公告)号：US07417889B2

公开(公告)日：2008-08-26

申请号：US11362612

申请日：2006-02-27

Applicant: Ching-Te Chuang ,  Jae-Joon Kim ,  Keunwoo Kim

Inventor： Ching-Te Chuang ,  Jae-Joon Kim ,  Keunwoo Kim

IPC: G11C11/00

CPC classification number: G11C11/412

Abstract: Techniques are provided for employing independent gate control in asymmetrical memory cells. A memory circuit, such as an SRAM circuit, can include a number of bit line structures, a number of word line structures that intersect the bit line structures to form a number of cell locations, and a number of asymmetrical memory cells located at the cell locations. Each of the asymmetrical cells can be selectively coupled to a corresponding one of the bit line structures under control of a corresponding one of the word line structures. Each of the cells can include a number of field effect transistors (FETS), and at least one of the FETS can be configured with separately biased front and back gates. One gate can be biased separately from the other gate in a predetermined manner to enhance read stability of the asymmetrical cell.

Abstract translation: 提供了在不对称存储单元中采用独立门控制的技术。 诸如SRAM电路的存储器电路可以包括多个位线结构，与位线结构相交以形成多个单元位置的多个字线结构以及位于单元的多个非对称存储单元 位置。 每个非对称单元可以在相应的一个字线结构的控制下选择性地耦合到位线结构中的对应的一个。 每个单元可以包括多个场效应晶体管（FETS），并且FETS中的至少一个可以被配置为单独偏置的前门和后门。 一个栅极可以以预定的方式与另一个栅极分开偏置，以增强不对称单元的读取稳定性。

公开(公告)号：US07342287B2

公开(公告)日：2008-03-11

申请号：US11184244

申请日：2005-07-19

Applicant: Ching-Te Chuang ,  Koushik K. Das ,  Shih-Hsien Lo ,  Jeffrey W. Sleight

Inventor： Ching-Te Chuang ,  Koushik K. Das ,  Shih-Hsien Lo ,  Jeffrey W. Sleight

IPC: H01L27/092

CPC classification number: H01L27/1203 ,  H01L21/823807 ,  H01L21/823878 ,  H01L21/84 ,  H01L27/092

Abstract: Disclosed are a multi-threshold CMOS circuit and a method of designing such a circuit. The preferred embodiment combines an MTCMOS scheme and a hybrid SOI-epitaxial CMOS structure. Generally, the logic transistors (both nFET and pFET) are placed in SOI, preferably in a high-performance, high density UTSOI; while the headers or footers are made of bulk epitaxial CMOS devices, with or without an adaptive well-biasing scheme. The logic transistors are based on (100) SOI devices or super HOT, the header devices are in bulk (100) or (110) pFETs with or without an adaptive well biasing scheme, and the footer devices are in bulk (100) NFET with or without an adaptive well biasing scheme.

Abstract translation: 公开了一种多阈值CMOS电路和一种设计这种电路的方法。 优选实施例组合MTCMOS方案和混合SOI外延CMOS结构。 通常，逻辑晶体管（nFET和pFET都）放置在SOI中，优选地以高性能，高密度的UTSOI; 而集管或页脚由大量外延CMOS器件制成，具有或不具有自适应阱偏置方案。 逻辑晶体管基于（100）SOI器件或超级HOT，头部器件处于具有或不具有自适应阱偏置方案的体（100）或（110）pFET中，并且脚踏器件处于本体（100）NFET中 或没有自适应井偏置方案。

公开(公告)号：US20060227595A1

公开(公告)日：2006-10-12

申请号：US11100893

申请日：2005-04-07

Applicant: Ching-Te Chuang ,  Jae-Joon Kim ,  Keunwoo Kim

Inventor： Ching-Te Chuang ,  Jae-Joon Kim ,  Keunwoo Kim

IPC: G11C11/00

CPC classification number: G11C11/412

Abstract: Disclosed is an eight transistor static random access memory (SRAM) device, comprising first and second inverters, a first bit line, a first complement bit line, a pair of write access transistors, and a pair of read access transistors. Each of the first and second inverters includes a respective pair of transistors, and has a respective data node. Each of a first and a second of the access transistors has a source, a drain, a front gate, and a back gate. The first access transistor is coupled to the first bit line, and the second access transistor is coupled to the first complement bit line. The back gate of the first access transistor is coupled to the data node of the first inverter; and the back gate of the second access transistor is coupled to the data node of the second inverter. This increases the difference between the threshold voltages of the first and second access transistors.

Abstract translation: 公开了一种八晶体管静态随机存取存储器（SRAM）器件，包括第一和第二反相器，第一位线，第一补码位线，一对写入存取晶体管和一对读存取晶体管。 第一和第二反相器中的每一个包括相应的晶体管对，并具有相应的数据节点。 第一和第二存取晶体管中的每一个具有源极，漏极，前栅极和后栅极。 第一存取晶体管耦合到第一位线，第二存取晶体管耦合到第一补码位线。 第一存取晶体管的背栅极耦合到第一反相器的数据节点; 并且第二存取晶体管的背栅极耦合到第二反相器的数据节点。 这增加了第一和第二存取晶体管的阈值电压之间的差异。

公开(公告)号：US20050040881A1

公开(公告)日：2005-02-24

申请号：US10644211

申请日：2003-08-20

Applicant: Richard Brown ,  Ching-Te Chuang ,  Peter Cook ,  Koushik Das ,  Rajiv Joshi

Inventor： Richard Brown ,  Ching-Te Chuang ,  Peter Cook ,  Koushik Das ,  Rajiv Joshi

IPC: H03K19/00 ,  H03K3/01

CPC classification number: H03K19/0016

Abstract: A multi-threshold integrated circuit (IC) with reduced subthreshold leakage and method of reducing leakage. Selectable supply switching devices (NFETs and/or PFETS) between a logic circuit and supply connections (Vdd and Ground) for the circuit have higher thresholds than normal circuit devices. Some devices may have thresholds lowered when the supply switching devices are on. Header/footer devices with further higher threshold voltages and widths may be used to further increase off resistance and maintain/reduce on resistance. Alternatively, high threshold devices may be stacked to further reduce leakage to a point achieved for an even higher threshold. Intermediate supply connects at the devices may have decoupling capacitance and devices may be tapered for optimum stack height and an optimum taper ratio to minimize circuit leakage and circuit delay.

Abstract translation: 具有降低的亚阈值泄漏的多阈值集成电路（IC）和减少泄漏的方法。 电路逻辑电路和电源连接（Vdd和Ground）之间的可选供电开关器件（NFET和/或PFETS）具有比正常电路器件更高的阈值。 当供电开关装置打开时，一些装置可能具有降低的阈值。 具有更高阈值电压和宽度的标题/页脚装置可用于进一步降低电阻和保持/降低电阻。 或者，可以堆叠高阈值装置以进一步将泄漏减少到达到甚至更高阈值所达到的点。 中间电源连接在器件上可能具有去耦电容，器件可以锥形化，以获得最佳堆叠高度和最佳锥度比，以最大限度地减少电路泄漏和电路延迟。

公开(公告)号：US20120087196A1

公开(公告)日：2012-04-12

申请号：US13075682

申请日：2011-03-30

Applicant: Hao-I YANG ,  Ching-Te Chuang ,  Wei Hwang

Inventor： Hao-I YANG ,  Ching-Te Chuang ,  Wei Hwang

IPC: G11C5/14

CPC classification number: G11C11/417

Abstract: The present invention proposes a gate oxide breakdown-withstanding power switch structure, which is connected with an SRAM and comprises a first CMOS switch and a second CMOS switch respectively having different gate-oxide thicknesses or different threshold voltages. The CMOS switch, which has a normal gate-oxide thickness or a normal threshold voltage, provides current for the SRAM to wake up the SRAM from a standby or sleep mode to an active mode. The CMOS switch, which has a thicker gate-oxide thickness or a higher threshold voltage, provides current for the SRAM to work in an active mode. The present invention prevents a power switch from gate-oxide breakdown lest noise margin, stabilization and performance of SRAM be affected.

Abstract translation: 本发明提出一种栅极氧化物击穿电源开关结构，其与SRAM连接，并且包括分别具有不同栅极氧化物厚度或不同阈值电压的第一CMOS开关和第二CMOS开关。 具有正常栅极氧化物厚度或正常阈值电压的CMOS开关为SRAM提供电流，以将SRAM从待机或睡眠模式唤醒至活动模式。 具有更厚栅极氧化物厚度或更高阈值电压的CMOS开关为SRAM提供工作在主动模式的电流。 本发明防止电源开关从栅极氧化层击穿，以免噪声容限，SRAM的稳定性和性能受到影响。

公开(公告)号：US20110128796A1

公开(公告)日：2011-06-02

申请号：US12772238

申请日：2010-05-03

Applicant: Ching-Te Chuang ,  Hao-I Yang ,  Jihi-Yu Lin ,  Shyh-Chyi Yang ,  Ming-Hsien Tu ,  Wei Hwang ,  Shyh-Jye Jou ,  Kun-Ti Lee ,  Hung-Yu Li

Inventor： Ching-Te Chuang ,  Hao-I Yang ,  Jihi-Yu Lin ,  Shyh-Chyi Yang ,  Ming-Hsien Tu ,  Wei Hwang ,  Shyh-Jye Jou ,  Kun-Ti Lee ,  Hung-Yu Li

IPC: G11C7/10 ,  G11C7/00

CPC classification number: G11C11/412

Abstract: A disturb-free static random access memory cell includes: a latch circuit having a first access terminal and a second access terminal; a first switching circuit having a first bit transferring terminal coupled to the first access terminal, a first control terminal coupled to a first write word line, and a second bit transferring terminal; a second switching circuit having a third bit transferring terminal coupled to the second access terminal, a second control terminal coupled to a second write word line, and a fourth bit transferring terminal coupled to the second bit transferring terminal; a third switching circuit having a fifth bit transferring terminal coupled to the fourth bit transferring terminal, a third control terminal coupled to a word line, and a sixth bit transferring terminal coupled to a bit line; and a sensing amplifier coupled to the bit line, for determining a bit value appearing at the bit line.

Abstract translation: 无干扰的静态随机存取存储单元包括：具有第一接入终端和第二接入终端的锁存电路; 第一切换电路，具有耦合到第一接入终端的第一比特传送终端，耦合到第一写字线的第一控制终端和第二比特传送终端; 第二切换电路，具有耦合到第二接入终端的第三比特传送终端，耦合到第二写字线的第二控制终端，以及耦合到第二比特传送终端的第四比特传送终端。 第三开关电路，具有耦合到第四位转移终端的第五位转移终端，耦合到字线的第三控制端和耦合到位线的第六位转移端; 以及耦合到位线的感测放大器，用于确定出现在位线处的位值。

公开(公告)号：US07903450B2

公开(公告)日：2011-03-08

申请号：US12040966

申请日：2008-03-03

Applicant: Ching-Te Chuang ,  Jae-Joon Kim ,  Keunwoo Kim

Inventor： Ching-Te Chuang ,  Jae-Joon Kim ,  Keunwoo Kim

IPC: G11C11/00

CPC classification number: G11C11/412 ,  H01L27/1104

Abstract: Asymmetrical SRAM cells are improved by providing one or more of improved read stability and improved write performance and margin. A first inverter and a second inverter are cross-coupled and configured for selective coupling to true and complementary bit lines under control of read and write word lines. The first inverter is formed by a first, n-type, FET (NFET) and a second, p-type, FET (PFET). Process and/or technology approaches can be employed to adjust the relative strength of the FETS to obtain, for example, read margin, write margin, and/or write performance improvements.

Abstract translation: 通过提供改进的读取稳定性和改进的写入性能和余量的一个或多个来改进非对称SRAM单元。 第一反相器和第二反相器被交叉耦合并且被配置为在读和写字线的控制下选择性地耦合到真和互补的位线。 第一反相器由第一n型FET（NFET）和第二p型FET（PFET）形成。 可以采用过程和/或技术方法来调整FET的相对强度，以获得例如读取余量，写入裕度和/或写入性能改进。

公开(公告)号：US20090302894A1

公开(公告)日：2009-12-10

申请号：US11859351

申请日：2007-09-21

Applicant: Ching-Te Chuang ,  Keunwoo Kim ,  Jente Benedict Kuang ,  Kevin John Nowka

Inventor： Ching-Te Chuang ,  Keunwoo Kim ,  Jente Benedict Kuang ,  Kevin John Nowka

IPC: H03K19/20 ,  H03K19/096

CPC classification number: H03K19/0963

Abstract: A dynamic logic gate has a device for charging a dynamic node during a pre-charge phase of a clock. A logic tree evaluates the dynamic node with a device during an evaluate phase of the clock. The dynamic node has a keeper circuit comprising an inverter with its input coupled to the dynamic node and its output coupled to the back gate of a dual gate PFET device. The source of the dual gate PFET is coupled to the power supply and its drain is coupled to the dynamic node forming a half latch. The front gate of the dual gate PFET is coupled to a logic circuit with a mode input and a logic input coupled back to a node sensing the state of the dynamic node. The mode input may be a slow mode to preserve dynamic node state or the clock delayed that turns ON the strong keeper after evaluation.

Abstract translation: 动态逻辑门具有用于在时钟的预充电阶段对动态节点充电的装置。 逻辑树在时钟的评估阶段使用设备来评估动态节点。 动态节点具有保持器电路，其包括反相器，其输入耦合到动态节点，其输出耦合到双栅极PFET器件的背栅极。 双栅极PFET的源极耦合到电源，并且其漏极耦合到形成半锁存器的动态节点。 双栅极PFET的前栅极耦合到具有模式输入和逻辑输入的逻辑电路，逻辑输入耦合回到感测动态节点的状态的节点。 模式输入可能是缓慢的模式，以保持动态节点状态或时钟延迟，在评估后打开强守护者。

公开(公告)号：US20080201672A1

公开(公告)日：2008-08-21

申请号：US11762257

申请日：2007-06-13

Applicant: Ching-Te Chuang ,  Jente B. Kuang ,  Hung C. Ngo

Inventor： Ching-Te Chuang ,  Jente B. Kuang ,  Hung C. Ngo

IPC: G06F17/50

CPC classification number: G01R31/31725

Abstract: A cascaded pass-gate test circuit including interposed split-output drive devices provides accurate measurement of critical timing parameters of pass gates. The rise time and fall time of signals passed through the pass gate can be separately measured in a ring oscillator or one-shot delay line configuration. Inverters or other buffer circuits are provided as drive devices to couple the pass gates in cascade. The final complementary tree in each drive device is split so that the only one of the output pull-down transistor or pull-up transistor is connected to the next pass gate input, while the other transistor is connected to the output of the pass gate. The result is that the state transition associated with the device connected to the pass gate input is dominant in the delay, while the other state transition is propagated directly to the output of the pass gate, bypassing the pass gate.

Abstract translation: 包括插入式分离输出驱动装置的级联通过栅极测试电路提供对通孔的临界定时参数的精确测量。 通过通过门的信号的上升时间和下降时间可以在环形振荡器或单稳态延迟线配置中单独测量。 逆变器或其它缓冲电路被提供作为驱动装置来串联耦合通过门。 每个驱动装置中的最终互补树被分开，使得输出下拉晶体管或上拉晶体管中的唯一一个连接到下一个通过栅极输入，而另一个晶体管连接到通过栅极的输出端。 结果是，与连接到通过栅极输入的器件相关联的状态转变在延迟中是主要的，而另一个状态转变直接传播到通过栅极的输出，绕过通过栅极。