公开(公告)号：US08458632B2

公开(公告)日：2013-06-04

申请号：US13197320

申请日：2011-08-03

申请人： Eric A. Foreman ,  James C. Gregerson ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Debjit Sinha ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladimer Zolotov

发明人： Eric A. Foreman ,  James C. Gregerson ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Debjit Sinha ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladimer Zolotov

IPC分类号： G06F9/455 ,  G06F17/50

CPC分类号： G06F17/5031

摘要： Aspects of the present invention provide solutions for projecting slack in an integrated circuit. A statistical static timing analysis (SSTA) is computed to get a set of Gaussian distributions over a plurality of variation sources in the integrated circuit. Based on the Gaussian distributions, a truncated subset and a remainder subset of the Gaussian distributions are identified. Then data factors that represent a ratio between the remainder subset and the truncated subset are obtained. These data factors are applied to the SSTA to root sum square (RSS) project the slack for the integrated circuit that takes into account the absence of the truncated subset.

摘要翻译： 本发明的方面提供了用于在集成电路中突出松弛的解决方案。 计算统计静态时序分析（SSTA）以在集成电路中的多个变化源上获得一组高斯分布。 基于高斯分布，识别高斯分布的截断子集和余数子集。 然后获得表示余数子集和截断子集之间的比率的数据因子。 这些数据因子被应用于SSTA到根平方（RSS）项目，考虑到缺少截断子集的集成电路的松弛。

公开(公告)号：US08413095B1

公开(公告)日：2013-04-02

申请号：US13400680

申请日：2012-02-21

申请人： John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Amol A. Joshi ,  Christopher J. Kiegle ,  William J. Wright ,  Vladimir Zolotov

发明人： John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Amol A. Joshi ,  Christopher J. Kiegle ,  William J. Wright ,  Vladimir Zolotov

IPC分类号： G06F17/50 ,  G06F9/455

CPC分类号： G06F17/504 ,  G06F2217/10 ,  G06F2217/78 ,  G06F2217/84

摘要： A statistical single library that includes on-chip variation (OCV) is created for timing and power analysis of a digital chip design. Initially, library values for all cells of a digital chip design, including ranges for environmental and process parameters, are subject to a statistical model to create statistical timing for the ranges of the parameters. A statistical timing tool is applied across the ranges of the parameters to determine statistical corners for delay and input power to a subset of cells. The statistically determined delay and input power to the subset of cells is entered into the statistical single library. Each delay of each statistical corner for the subset of cells is compared with a chip sign-off statistical delay requirement of a test macro.

摘要翻译： 创建了包含片上变化（OCV）的统计单库，用于数字芯片设计的时序和功耗分析。 最初，数字芯片设计的所有单元（包括环境和工艺参数的范围）的库值都需要统计模型来创建参数范围的统计时序。 在整个参数范围内应用统计计时工具，以确定细胞子集的延迟和输入功率的统计角。 统计确定的单元子集的延迟和输入功率被输入到统计单个库中。 将每个细胞子集的每个统计角的每个延迟与测试宏的芯片签发统计延迟要求进行比较。

公开(公告)号：US20140074422A1

公开(公告)日：2014-03-13

申请号：US13614564

申请日：2012-09-13

申请人： Jeanne P. Bickford ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Clarence R. Ogilvie ,  Tad J. Wilder ,  Vladimir Zolotov

发明人： Jeanne P. Bickford ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Clarence R. Ogilvie ,  Tad J. Wilder ,  Vladimir Zolotov

IPC分类号： G06F17/50 ,  G06F19/00 ,  G01R31/317

CPC分类号： G01R31/31718 ,  G01R31/3008

摘要： A plurality of digital circuits are manufactured from an identical circuit design. A power controller is operatively connected to the digital circuits, and a non-transitory storage medium is operatively connected to the power controller. The digital circuits are classified into different voltage bins, and each of the voltage bins has a current leakage limit. Each of the digital circuits has been previously tested to operate within a corresponding current leakage limit of a corresponding voltage bin into which each of the digital circuits has been classified. The non-transitory storage medium stores boundaries of the voltage bins as speed-binning test data. The power controller controls power-supply signals applied differently for each of the digital circuits based on which bin each of the digital circuit has been classified and the speed-binning test data.

摘要翻译： 由相同的电路设计制造多个数字电路。 功率控制器可操作地连接到数字电路，并且非瞬时存储介质可操作地连接到功率控制器。 数字电路分为不同的电压箱，每个电压箱都有漏电极限。 已经对每个数字电路进行了测试，以在对应的电压仓的相应的电流泄漏极限内运行，每个数字电路已被分类到该对应的电压仓。 非瞬时存储介质存储电压仓的边界作为速度分组测试数据。 功率控制器控制基于每个数字电路已被分类的每个数字电路不同地施加的电源信号和速度合并测试数据。

公开(公告)号：US20110055793A1

公开(公告)日：2011-03-03

申请号：US12549061

申请日：2009-08-27

申请人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Susan K. Lichtensteiger ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang

发明人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Susan K. Lichtensteiger ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang

IPC分类号： G06F17/50

CPC分类号： G06F17/5031 ,  G06F2217/84

摘要： An approach for covering multiple selective timing corners in a single statistical timing run is described. In one embodiment, a single statistical timing analysis is run on the full parameter space that covers unlimited process parameters/environment conditions. Results from the statistical timing analysis are projected for selected corners. Timing closure is performed on the corners having the worst slacks.

摘要翻译： 描述了在单个统计时序运行中覆盖多个选择性定时角的方法。 在一个实施例中，在涵盖无限制过程参数/环境条件的完整参数空间上运行单个统计时序分析。 统计时间分析的结果预计为所选角。 在具有最差松弛度的角落上进行定时关闭。

公开(公告)号：US08560989B2

公开(公告)日：2013-10-15

申请号：US13311832

申请日：2011-12-06

申请人： Nathan Buck ,  Brian Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  James C. Gregerson ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Debjit Sinha ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Michael H. Wood ,  Vladimir Zolotov

发明人： Nathan Buck ,  Brian Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  James C. Gregerson ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Debjit Sinha ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Michael H. Wood ,  Vladimir Zolotov

IPC分类号： G06F17/50

CPC分类号： G06F17/505 ,  G06F2217/10 ,  G06F2217/62

摘要： Systems and methods for statistical clock cycle computation and closing timing of an integrated circuit design to a maximum clock cycle or period. The method includes loading a design and timing model for at least one circuit path of an integrated circuit or a region of the integrated circuit into a computing device. The method further includes performing a statistical static timing analysis (SSTA) of the at least one circuit path using the loaded design and timing model to obtain slack canonical data. The method further includes calculating a maximum circuit clock cycle for the integrated circuit or the specified region of the integrated circuit in linear canonical form based upon the slack canonical data obtained from the SSTA.

摘要翻译： 将集成电路设计的统计时钟周期计算和闭合时序的系统和方法设计到最大时钟周期或周期。 该方法包括将用于集成电路或集成电路的区域的至少一个电路路径的设计和定时模型加载到计算设备中。 该方法还包括使用加载的设计和定时模型来执行至少一个电路路径的统计静态时序分析（SSTA），以获得松散的规范数据。 该方法还包括基于从SSTA获得的松弛规范数据，以线性规范形式计算集成电路或集成电路的指定区域的最大电路时钟周期。

公开(公告)号：US08468483B2

公开(公告)日：2013-06-18

申请号：US13279373

申请日：2011-10-24

申请人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladimir Zolotov

发明人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang ,  Vladimir Zolotov

IPC分类号： G06F9/455

CPC分类号： G06F17/5031 ,  G06F2217/84

摘要： In embodiments of a statistical static timing analysis (SSTA) method, system and program storage device, the interdependence between the setup time and hold time margins of a circuit block (e.g., a latch, flip-flop, etc., which requires the checking of setup and hold timing constraints) is determined, taking into account possible variations in multiple parameters (e.g., using a variation-aware characterizing technique). A parameterized statistical static timing analysis (SSTA) of a circuit incorporating the circuit block is performed in order to determine, in statistical parameterized form, setup and hold times for the circuit block. Based on the interdependence between the setup and hold time margins, setup and hold time constraints can be determined in statistical parameterized form. Finally, the setup and hold times determined during the SSTA can be checked against the setup and hold time constraints to determine, if the time constraints are violated or not and to what degree.

摘要翻译： 在统计静态时序分析（SSTA）方法，系统和程序存储装置的实施例中，需要检查的电路块（例如，锁存器，触发器等）的建立时间和保持时间裕度之间的相互依赖关系 确定设置和保持时序约束），同时考虑到多个参数的可能变化（例如，使用变异感知特性技术）。 执行结合电路块的电路的参数化统计静态时序分析（SSTA），以便以统计参数化形式确定电路块的建立和保持时间。 基于设置和保持时间间隔之间的相互依赖性，可以以统计参数化形式确定建立和保持时间约束。 最后，可以根据建立和保持时间约束来检查SSTA期间确定的建立和保持时间，以确定是否违反时间限制，以及在何种程度上。

公开(公告)号：US20120084066A1

公开(公告)日：2012-04-05

申请号：US12894286

申请日：2010-09-30

申请人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue X. Wang

发明人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue X. Wang

IPC分类号： G06F17/50

CPC分类号： G06F13/105 ,  G06F11/261 ,  G06F17/50 ,  G06F17/5036

摘要： A computer-implemented method that simulates NPskew effects on a combination NFET (Negative Field Effect Transistor)/PFET (Positive Field Effect Transistor) semiconductor device using slew perturbations includes performing a timing test by a computing device, by: (1) evaluating perturb slews in Strong N/Weak P directions on the combination semiconductor device for a timing test result; (2) evaluation perturb slews in Weak N/Strong P directions on the combination semiconductor device for a timing test result; and (3) evaluating unperturbed slews in a balanced condition on the combination semiconductor device for a timing test result. After each test is performed, a determination is made as to which evaluation of the perturbed and unperturbed slews produces a most conservative timing test result for the combination semiconductor device. An NPskew effect adjusted timing test result is finally output based on determining the most conservative timing test result.

摘要翻译： 使用摆动扰动模拟组合NFET（负场效应晶体管）/ PFET（正场效应晶体管）/ PFET（正场效应晶体管））半导体器件的NPskew效应的计算机实现的方法包括通过以下方式执行计算设备的定时测试：（1）评估干扰压摆 在组合半导体器件上以强N /弱P方向进行定时测试结果; （2）组合半导体器件的评估扰动在弱N /强P方向上的时序测试结果; 和（3）在组合半导体器件上对平衡状态下的非扰动压摆进行定时测试结果。 在执行每个测试之后，确定扰动和未扰动的压摆的哪个评估对组合半导体器件产生最保守的定时测试结果。 基于确定最保守的定时测试结果，最终输出NPskew效果调整的定时测试结果。

公开(公告)号：US08141012B2

公开(公告)日：2012-03-20

申请号：US12549061

申请日：2009-08-27

申请人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Susan K. Lichtensteiger ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang

发明人： Nathan C. Buck ,  Brian M. Dreibelbis ,  John P. Dubuque ,  Eric A. Foreman ,  Peter A. Habitz ,  Jeffrey G. Hemmett ,  Susan K. Lichtensteiger ,  Natesan Venkateswaran ,  Chandramouli Visweswariah ,  Xiaoyue Wang

IPC分类号： G06F17/50

CPC分类号： G06F17/5031 ,  G06F2217/84

摘要： An approach for covering multiple selective timing corners in a single statistical timing run is described. In one embodiment, a single statistical timing analysis is run on the full parameter space that covers unlimited process parameters/environment conditions. Results from the statistical timing analysis are projected for selected corners. Timing closure is performed on the corners having the worst slacks.

摘要翻译： 描述了在单个统计时序运行中覆盖多个选择性定时角的方法。 在一个实施例中，在涵盖无限制过程参数/环境条件的完整参数空间上运行单个统计时序分析。 统计时间分析的结果预计为所选角。 在具有最差松弛度的角落上进行定时关闭。

公开(公告)号：US07870525B2

公开(公告)日：2011-01-11

申请号：US12122451

申请日：2008-05-16

申请人： Eric A. Foreman ,  Peter A. Habitz ,  David J. Hathaway ,  Jerry D. Hayes ,  Jeffrey H. Oppold ,  Anthony D. Polson

发明人： Eric A. Foreman ,  Peter A. Habitz ,  David J. Hathaway ,  Jerry D. Hayes ,  Jeffrey H. Oppold ,  Anthony D. Polson

IPC分类号： G06F17/50

CPC分类号： G06F17/5031 ,  G06F17/5045

摘要： A method, system and program product are disclosed for improving an IC design that prioritize failure coefficients of slacks that lead to correction according to their probability of failure. With an identified set of independent parameters, a sensitivity analysis is performed on each parameter by noting the difference in timing, typically on endpoint slacks, when the parameter is varied. This step is repeated for every independent parameter. A failure coefficient is then calculated from the reference slack and the sensitivity of slack for each of the timing endpoints and a determination is made as to whether at least one timing endpoint fails a threshold test. Failing timing endpoints are then prioritized for modification according to their failure coefficients. The total number of runs required is one run that is used as a reference run, plus one additional run for each parameter.

摘要翻译： 公开了一种用于改进IC设计的方法，系统和程序产品，其优先考虑根据其故障概率导致校正的松弛故障系数。 通过确定的一组独立参数，当参数变化时，通过注意时序上的差异，通常在端点松弛时，对每个参数执行灵敏度分析。 对于每个独立参数重复此步骤。 然后从参考松弛和每个定时端点的松弛的灵敏度计算失效系数，并且确定至少一个定时端点是否失败阈值测试。 然后将失败的定时终点根据其故障系数进行优先级修改。 所需的总运行次数是一次运行，用作参考运行，每个参数再运行一次运行。

公开(公告)号：US07716616B2

公开(公告)日：2010-05-11

申请号：US11930924

申请日：2007-10-31

申请人： Eric A. Foreman ,  Peter A. Habitz ,  David J. Hathaway ,  Jerry D. Hayes ,  Jeffrey H. Oppold ,  Anthony D. Polson

发明人： Eric A. Foreman ,  Peter A. Habitz ,  David J. Hathaway ,  Jerry D. Hayes ,  Jeffrey H. Oppold ,  Anthony D. Polson

IPC分类号： G06F17/50

CPC分类号： G06F17/5031 ,  G06F17/5045

摘要： A method, system and program product are disclosed for improving an IC design that prioritize failure coefficients of slacks that lead to correction according to their probability of failure. With an identified set of independent parameters, a sensitivity analysis is performed on each parameter by noting the difference in timing, typically on endpoint slacks, when the parameter is varied. This step is repeated for every independent parameter. A failure coefficient is then calculated from the reference slack and the sensitivity of slack for each of the timing endpoints and a determination is made as to whether at least one timing endpoint fails a threshold test. Failing timing endpoints are then prioritized for modification according to their failure coefficients. The total number of runs required is one run that is used as a reference run, plus one additional run for each parameter.

摘要翻译： 公开了一种用于改进IC设计的方法，系统和程序产品，其优先考虑根据其故障概率导致校正的松弛故障系数。 通过确定的一组独立参数，当参数变化时，通过注意时序上的差异，通常在端点松弛时，对每个参数执行灵敏度分析。 对于每个独立参数重复此步骤。 然后从参考松弛和每个定时端点的松弛的灵敏度计算失效系数，并且确定至少一个定时端点是否失败阈值测试。 然后将失败的定时终点根据其故障系数进行优先级修改。 所需的总运行次数是一次运行，用作参考运行，每个参数再运行一次运行。