公开(公告)号：US20070002328A1

公开(公告)日：2007-01-04

申请号：US11436267

申请日：2006-05-17

Applicant: Gary Woods ,  Steven Kasapi ,  Kenneth Wilsher

Inventor： Gary Woods ,  Steven Kasapi ,  Kenneth Wilsher

IPC: G01B9/02

CPC classification number: G01R31/308

Abstract: A system for probing a DUT is provided, the system comprising a tunable or CW laser source, a modulator for modulating the output of the laser source, a beam optics designed to point a probing beam at a designated location on the DUT, optical detector for detecting the reflected beam, and collection and signal processing electronics. The system deciphers perturbations in the reflected beam by detecting beat frequency between operation frequency of the DUT and frequency of the modulation. In an alternative embodiment, the laser is CW and the modulation is applied to the optical detector.

Abstract translation: 提供了一种用于探测DUT的系统，该系统包括可调谐或CW激光源，用于调制激光源的输出的调制器，被设计为将探测光束指向DUT上的指定位置的光束光学器件，用于 检测反射光束，采集和信号处理电子元件。 系统通过检测DUT的工作频率和调制频率之间的拍频来破译反射光束的扰动。 在替代实施例中，激光是CW并且调制被应用于光学检测器。

公开(公告)号：US20060031036A1

公开(公告)日：2006-02-09

申请号：US11241609

申请日：2005-09-30

Applicant: Steven Kasapi

Inventor： Steven Kasapi

IPC: G01R31/00

CPC classification number: G01R31/31903 ,  G01R31/31937

Abstract: Systems and methods consistent with principles of the present invention allow contactless measurements of voltage characteristics of dynamic electrical signals in integrated circuits. The invention utilizes a signal analysis circuit, such as a voltage comparator, disposed with the circuit under test, which is optically coupled with the external timing measurement equipment. The signal analysis circuit changes its state depending on the characteristics of the measured electrical signal applied thereto. The changes in the condition of the signal analysis circuit are sensed by the external timing measurement equipment provided outside the circuit under test. To this end, the signal analysis circuit is optically coupled with the external measurement equipment registering specific changes in the condition of the signal analysis circuit. The information on the condition of the signal analysis circuit registered by the external measurement equipment is used to study the characteristics of the dynamic electrical signals within the circuit.

公开(公告)号：US06976234B2

公开(公告)日：2005-12-13

申请号：US10341721

申请日：2003-01-13

Applicant: Steven Kasapi

Inventor： Steven Kasapi

IPC: G01R31/319 ,  G01R31/3193 ,  G06F17/50

CPC classification number: G01R31/31903 ,  G01R31/31937

Abstract: Systems and methods consistent with principles of the present invention allow contactless measurements of voltage characteristics of dynamic electrical signals in integrated circuits. The invention utilizes a signal analysis circuit, such as a voltage comparator, disposed with the circuit under test, which is optically coupled with the external timing measurement equipment. The signal analysis circuit changes its state depending on the characteristics of the measured electrical signal applied thereto. The changes in the condition of the signal analysis circuit are sensed by the external timing measurement equipment provided outside the circuit under test. To this end, the signal analysis circuit is optically coupled with the external measurement equipment registering specific changes in the condition of the signal analysis circuit. The information on the condition of the signal analysis circuit registered by the external measurement equipment is used to study the characteristics of the dynamic electrical signals within the circuit.

Abstract translation: 与本发明的原理一致的系统和方法允许对集成电路中的动态电信号的电压特性进行非接触式测量。 本发明利用与被测电路配置的信号分析电路，例如电压比较器，其与外部定时测量设备光耦合。 信号分析电路根据所施加的测量电信号的特性改变其状态。 信号分析电路状态的变化由设在被测电路外部的外部定时测量设备检测。 为此，信号分析电路与外部测量设备光学耦合，记录信号分析电路的状况的特定变化。 由外部测量设备登记的信号分析电路的状况信息用于研究电路内动态电信号的特性。

公开(公告)号：US20050146321A1

公开(公告)日：2005-07-07

申请号：US11040333

申请日：2005-01-20

Applicant: Romain Desplats ,  Patricia Le Coupanec ,  William Lo ,  Philippe Perdu ,  Steven Kasapi

Inventor： Romain Desplats ,  Patricia Le Coupanec ,  William Lo ,  Philippe Perdu ,  Steven Kasapi

IPC: G01R31/311 ,  G01R1/00

CPC classification number: G01R31/2656 ,  G01R31/311

Abstract: A system, apparatus, and method for analyzing photon emission data to discriminate between photons emitted by transistors and photons emitted by background sources. The analysis involves spatial and/or temporal correlation of photon emissions. After correlation, the analysis may further involve obtaining a likelihood that the correlated photons were emitted by a transistor. After correlation, the analysis may also further involve assigning a weight to individual photon emissions as a function of the correlation. The weight, in some instances, reflecting a likelihood that the photons were emitted by a transistor. The analysis may further involve automatically identifying transistors in a photon emission image.

公开(公告)号：US07733100B2

公开(公告)日：2010-06-08

申请号：US11438121

申请日：2006-05-18

Applicant: Steven Kasapi

Inventor： Steven Kasapi

IPC: G01R31/302

CPC classification number: G01R31/311 ,  G01R31/2851 ,  G01R31/308

Abstract: An apparatus for providing modulation mapping is disclosed. The apparatus includes a laser source, a motion mechanism providing relative motion between the laser beam and the DUT, signal collection mechanism, which include a photodetector and appropriate electronics for collecting modulated laser light reflected from the DUT, and a display mechanism for displaying a spatial modulation map which consists of the collected modulated laser light over a selected time period and a selected area of the IC.

Abstract translation: 公开了一种用于提供调制映射的设备。 该装置包括激光源，提供激光束和DUT之间的相对运动的运动机构，信号收集机构，其包括光电检测器和用于采集从DUT反射的调制激光的适当电子器件，以及显示机构，用于显示空间 调制图由选定时间段内收集的调制激光和IC的选定区域组成。

公开(公告)号：US07679358B2

公开(公告)日：2010-03-16

申请号：US11697205

申请日：2007-04-05

Applicant: Steven Kasapi ,  Gary Leonard Woods

Inventor： Steven Kasapi ,  Gary Leonard Woods

IPC: G01R31/16

CPC classification number: G01R29/26 ,  G01R31/2882 ,  G01R31/311 ,  G01R31/31709 ,  G01R31/31725

Abstract: Time-resolved emission can be used to measure loop-synchronous, small-signal voltage perturbation in integrated circuits. In this technique the measurements are completely non-invasive and so reflect the true device behavior. The time-dependant propagation delay caused by Vdd modulation also shows the expected qualitative signature. This technique should find applications in circuits with relatively fast clock-like circuits where loop-synchronous voltage pickup is limiting circuit behavior.

Abstract translation: 时间分辨发射可用于测量集成电路中的环路同步，小信号电压扰动。 在这种技术中，测量是完全非侵入性的，因此反映了真正的器件行为。 由Vdd调制引起的时间依赖传播延迟也显示了预期的定性特征。 这种技术应该在具有相对较快时钟的电路的电路中找到应用，其中环路同步电压拾取是限制电路行为的。

公开(公告)号：US20070236206A1

公开(公告)日：2007-10-11

申请号：US11697205

申请日：2007-04-05

Applicant: Steven Kasapi ,  Gary Leonard Woods

Inventor： Steven Kasapi ,  Gary Leonard Woods

IPC: G01R23/16

CPC classification number: G01R29/26 ,  G01R31/2882 ,  G01R31/311 ,  G01R31/31709 ,  G01R31/31725

Abstract: Time-resolved emission can be used to measure loop-synchronous, small-signal voltage perturbation in integrated circuits. In this technique the measurements are completely non-invasive and so reflect the true device behavior. The time-dependant propagation delay caused by Vdd modulation also shows the expected qualitative signature. This technique should find applications in circuits with relatively fast clock-like circuits where loop-synchronous voltage pickup is limiting circuit behavior.

Abstract translation: 时间分辨发射可用于测量集成电路中的环路同步，小信号电压扰动。 在这种技术中，测量是完全非侵入性的，因此反映了真正的器件行为。 由Vdd调制引起的时间依赖传播延迟也显示了预期的定性特征。 这种技术应该在具有相对较快时钟的电路的电路中找到应用，其中环路同步电压拾取是限制电路行为的。

公开(公告)号：US20070046301A1

公开(公告)日：2007-03-01

申请号：US11438121

申请日：2006-05-18

Applicant: Steven Kasapi

Inventor： Steven Kasapi

IPC: G01R31/305

CPC classification number: G01R31/311 ,  G01R31/2851 ,  G01R31/308

Abstract: An apparatus for providing modulation mapping is disclosed. The apparatus includes a laser source, a motion mechanism providing relative motion between the laser beam and the DUT, signal collection mechanism, which include a photodetector and appropriate electronics for collecting modulated laser light reflected from the DUT, and a display mechanism for displaying a spatial modulation map which consists of the collected modulated laser light over a selected time period and a selected area of the IC.

Abstract translation: 公开了一种用于提供调制映射的设备。 该装置包括激光源，提供激光束和DUT之间的相对运动的运动机构，信号收集机构，其包括光电检测器和用于采集从DUT反射的调制激光的适当电子器件，以及显示机构，用于显示空间 调制图由选定时间段内收集的调制激光和IC的选定区域组成。

公开(公告)号：US07042563B2

公开(公告)日：2006-05-09

申请号：US11042288

申请日：2005-01-24

Applicant: Kenneth R. Wilsher ,  Steven Kasapi

Inventor： Kenneth R. Wilsher ,  Steven Kasapi

IPC: G01N21/88

CPC classification number: G01R31/311 ,  G01R31/31905

Abstract: A method and system of testing integrated circuits (IC) via optical coupling. The optical system includes an optical fiber, fixture and focusing element. In addition, channels are provided in the fixture mounted on the integrated circuit to accommodate the optical system. The fixture acts as a heat sink. As such, one or more photosensitive elements/targets on the integrated circuit are probed using light that is brought to a focus on each target site. The light causes latching of data into the integrated circuit (which is operating under influence of a test program) and formation of a test pattern output from the integrated circuit that is used to confirm proper functioning of the IC.

Abstract translation: 一种通过光耦合测试集成电路（IC）的方法和系统。 光学系统包括光纤，夹具和聚焦元件。 此外，在安装在集成电路上的灯具中提供通道以容纳光学系统。 夹具用作散热器。 因此，使用聚焦在每个目标位置的光来探测集成电路上的一个或多个感光元件/靶。 光引起数据锁存到集成电路中（其在测试程序的影响下运行），并形成用于确认IC正常工作的集成电路输出的测试图案。

公开(公告)号：US20050128471A1

公开(公告)日：2005-06-16

申请号：US11042288

申请日：2005-01-24

Applicant: Kenneth Wilsher ,  Steven Kasapi

Inventor： Kenneth Wilsher ,  Steven Kasapi

IPC: G01R1/06 ,  G01R31/302 ,  G01R31/311 ,  G01R31/319 ,  H01L21/66 ,  G01N21/00

CPC classification number: G01R31/311 ,  G01R31/31905

Abstract: A method and system of testing integrated circuits (IC) via optical coupling. The optical system includes an optical fiber, fixture and focussing element. In addition, channels are provided in the fixture mounted on the integrated circuit to accommodate the optical system. The fixture acts as a heat sink. As such, one or more photosensitive elements/targets on the integrated circuit are probed using light that is brought to a focus on each target site. The light causes latching of data into the integrated circuit (which is operating under influence of a test program) and formation of a test pattern output from the integrated circuit that is used to confirm proper functioning of the IC.

Abstract translation: 一种通过光耦合测试集成电路（IC）的方法和系统。 光学系统包括光纤，夹具和聚焦元件。 此外，在安装在集成电路上的灯具中提供通道以容纳光学系统。 夹具用作散热器。 因此，使用聚焦在每个目标位置的光来探测集成电路上的一个或多个感光元件/靶。 光引起数据锁存到集成电路中（其在测试程序的影响下运行），并形成用于确认IC正常工作的集成电路输出的测试图案。