Abstract:
Methods for performing cathode burn-in with respect to an FED display that avoid display non-uniformities near and around the spacer wall structures. In a first method, the anode is floated or receives a negative voltage with respect to the electron emitter. A positive voltage is then applied to the focus waffle structure with respect to the electron emitter. The cathode is then energized thereby preventing emitted electrons from escaping the focus well. Under these conditions, cathode burn-in conditioning can occur but electrons are energetically forbidden from hitting the anode or the spacer walls except for a small region near the focus waffle. Under the second method, the anode is grounded or allowed to float. A negative bias is applied to the focus waffle. This causes electrons to be collected at the M2 layer of the gate. Electrons are energetically forbidden from hitting any portion of the tube except the M2 layer. Under either method, no electrons hit the spacer walls and therefore display non-uniformities near and around the spacer wall structures are avoided.
Abstract:
The intensity at which electrons emitted by a first plate structure (10) in a flat-panel display strike a second plate structure (12) for causing it to emit light is controlled so as to reduce image degradation that could otherwise arise from undesired electron-trajectory changes caused by effects such as the presence of a spacer system (14) between the plate structures. An electron-emissive region (20) in the first plate structure typically contains multiple laterally separated electron-emissive portions (201 and 202) for selectively emitting electrons. An electron-focusing system in the first plate structure has corresponding focus openings (42P1 and 42P2) through which electrons emitted by the electron-emissive portions respectively pass. Upon being struck by the so-emitted electrons, a light-emissive region (22) in the second plate structure emits light to produce at least part of a dot of the display's image.