摘要:
A defect detecting apparatus including an illumination system for radiating a light of a plane wave linearly to a substrate having repetitive patterns of different pitches; a focusing optical system for focusing a light image reflected from the substrate thus illuminated by the illumination system; a spatial filter disposed intermediate the focusing optical system so as to shield a diffraction light from repetitive patterns of a small pitch on the substrate; a detector for detecting the light image formed by the focusing optical system; an erasing means for comparing and erasing signals which are generated on the basis of repetitive patterns of a large pitch and obtained through the spatial filter, out of signals detected by the detector; and a defect detecting means for detecting defects on the substrate in accordance with a signal detected by the detector, as well as a method applied to the said apparatus.
摘要:
In an image recording apparatus for recording images by modulating a light beam by information signals and applying the light beam to a recording medium, the longitudinal mode of the light beam is multiple, that is, comprises a plurality of oscillation wavelengths.
摘要:
Provided is a plug detachment prevention structure, such that when a plug equipped with a plug terminal and a plug retaining section that covers a part of the plug terminal is connected to a jack provided inside a housing, the plug detachment prevention structure retains the plug retaining section to prevent the plug from detaching from the jack, wherein the plug detachment prevention structure is equipped with a ring-shaped elastic section composed of an elastic material in which the plug retaining section is pressure-inserted, and a frame section that is circularly mounted at an outer circumferential side of the elastic section, composed of a material harder than that of the elastic section and detachably attached on an outside of the housing.
摘要:
An electronic instrument includes an input device having a plurality of channels to each of which an audio signal is input. A demodulation device demodulates audio signals and converts the audio signals into digital signals that control the electronic instrument. The electronic instrument also includes a feeding device that feeds the digital signals to a sound source and a detection device that detects whether or not the audio signals in any of the plurality of channels are modulated by the digital signals. A controller controls the demodulation device, in cases where it has been detected that any of the audio signals are modulated by the digital signals, so as to demodulate the digital signals from the audio signals that have been input to the channels, such that another channel's audio signals that are not modulated by the digital signals are output to an audio output.
摘要:
An apparatus and method for detecting defects on a specimen includes an illumination optical unit which obliquely projects a laser onto a region which is longer in one direction on a surface of a specimen than in a transverse direction, a table unit which mounts the specimen and which is movable, a detection optical unit which detects light from the specimen illuminated by the laser with an image sensor while the table is moving, and a signal processor. The signal processor processes a signal outputted from the image sensor of the detection optical unit and converted to a digital signal and extracts defects of the specimen by comparing the converted digital signal with a reference digital signal. A display unit displays information of defects extracted by the signal processor.
摘要:
A processing method for semiconductor devices in a semiconductor fabrication line includes processing a substrate in a first processing apparatus, transferring the substrate processed in the first processing apparatus to a detecting apparatus without removal of the substrate from the semiconductor fabrication line while continuing fabrication of the semiconductor devices, detecting foreign particle defects on the substrate transferred to the detecting apparatus, and determining a foreign particle generation condition of the processing apparatus based on a data from the detecting.
摘要:
The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.
摘要:
In an image read apparatus which reads an image from a recording medium, such as a film, and outputs image data, and shading correction data is set. Time elapsed since the shading correction data is set is counted. Before performing main scanning, whether or not the elapsed time is longer than a predetermined period is determined, and if it is, the shading correction data is updated. The read image data is processed with shading correction using the shading correction data which is updated as time elapses.
摘要:
An optical head using a semiconductor laser array as a light source comprises a semiconductor laser array in which a plurality of semiconductor lasers are linearly arrayed, a collimator lens, an objective lens and a beam shaping prism system. The beam shaping prism system is arranged between the collimator lens and the objective lens to convert a beam width of a beam emerged from the collimator lens. The junction surfaces of the semiconductor lasers are parallel with an array direction. A plane defined by incident and emerging beams on and from the beam shaping prism system is parallel with or overlapping the array direction of the semiconductor lasers.
摘要:
A colored image reading apparatus has a light source for illuminating the surface of an original, a transmitting optical system for dividing the light beam from the surface of the original into two beams of short wavelength zone and long wavelength zone and transmitting them to a light detector, a processing circuit for effecting an operation between the signals from the light detector and obtaining a plurality of electrical signals, and a converter circuit for converting the plurality of electrical signals into signals corresponding to respective colors, and is capable of well discriminating and reading four colors, black, blue, red and white, by selecting to predetermined values the wavelength .lambda.'b of the overall spectral characteristic on the short wavelength zone side including all of the spectral characteristics of the light source, the transmitting optical system and the light detector relative to the maximum value of the transmission factor and the wavelength .lambda.'r of the overall spectral characteristic on the long wavelength zone side relative to the maximum value of the transmission factor.