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    DISPLACEMENT AMOUNT MEASURING DEVICE, DISPLACEMENT AMOUNT MEASURING METHOD, AND RECORDING MEDIUM
    23.
    发明申请
    DISPLACEMENT AMOUNT MEASURING DEVICE, DISPLACEMENT AMOUNT MEASURING METHOD, AND RECORDING MEDIUM 有权

    公开(公告)号：US20210239458A1

    公开(公告)日：2021-08-05

    申请号：US16972279

    申请日：2019-06-03

    Applicant: NEC Corporation

    Inventor： Hiroshi IMAI

    IPC: G01B11/16 ,  G06T7/50 ,  G06T7/00 ,  G06T7/70 ,  G02B17/08

    Abstract: The objective of the present invention is to detect defects in a structure accurately in a non-contact manner. An optical path length converting unit (320) is disposed between a specimen being inspected and an image capturing element (310) in such a way as to cover part of a field of view of the image capturing element (310). An image analyzing unit (330) uses images captured by the image capturing element (310) to calculate amounts of displacement within the surface of the specimen, obtained using two fields of view of the image capturing element (310) not covered/covered by the optical path length converting unit (320). An out-of-plane displacement calculating unit (340) calculates an out-of-plane displacement of the specimen on the basis of the calculated amounts of displacement.

    STATE DETERMINATION APPARATUS, STATE DETERMINATION METHOD, AND COMPUTER-READABLE RECORDING MEDIUM
    24.
    发明申请
    STATE DETERMINATION APPARATUS, STATE DETERMINATION METHOD, AND COMPUTER-READABLE RECORDING MEDIUM 审中-公开

    公开(公告)号：US20200284576A1

    公开(公告)日：2020-09-10

    申请号：US16646423

    申请日：2017-09-12

    Applicant: NEC CORPORATION

    Inventor： Subhajit CHAUDHURY ,  Hiroshi IMAI

    IPC: G01B11/16 ,  G01B9/02 ,  G06T7/00 ,  G06T7/60

    Abstract: A state determination apparatus 100 determines the state of a structure 200. The state determination apparatus 100 includes a measurement unit 10 configured to measure a deflection amount and a surface displacement amount in each of a plurality of target regions that are preset on the structure 200, a feature value calculation unit 20 configured to calculate, for the respective target regions, feature values each indicating a relationship between the deflection amount and the surface displacement amount, using the measured deflection amount and surface displacement amount, a spatial distribution calculation unit 30 configured to calculate a spatial distribution of the feature values using the feature values calculated for each of the target regions, and a degradation state determination unit 40 configured to determine a degradation state of the structure 200 based on the spatial distribution of the feature value.

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