LPP EUV plasma source material target delivery system
    21.
    发明授权
    LPP EUV plasma source material target delivery system 失效
    LPP EUV等离子体源材料目标传送系统

    公开(公告)号:US07589337B2

    公开(公告)日:2009-09-15

    申请号:US12075631

    申请日:2008-03-12

    CPC classification number: H05G2/001

    Abstract: An EUV light generation system and method is disclosed that may comprise a droplet generator producing plasma source material target droplets traveling toward the vicinity of a plasma source material target irradiation site; a drive laser; a drive laser focusing optical element having a first range of operating center wavelengths; a droplet detection radiation source having a second range of operating center wavelengths; a drive laser steering element comprising a material that is highly reflective within at least some part of the first range of wavelengths and highly transmissive within at least some part of the second range of center wavelengths; a droplet detection radiation aiming mechanism directing the droplet detection radiation through the drive laser steering element and the lens to focus at a selected droplet detection position intermediate the droplet generator and the irradiation site.

    Abstract translation: 公开了一种EUV发光系统和方法,其可以包括产生等离子体源材料的液滴发生器,目标液滴朝向等离子体源材料目标照射位置附近行进; 驱动激光器 具有第一操作中心波长范围的驱动激光聚焦光学元件; 具有第二操作中心波长范围的液滴检测辐射源; 驱动激光操纵元件,其包括在第一波长范围的至少一部分内具有高度反射性的材料,并且在第二中心波长范围的至少一部分内具有高度透射性的材料; 液滴检测辐射瞄准机构,其引导液滴检测辐射通过驱动激光转向元件和透镜,以聚焦在液滴发生器和照射部位之间的选定液滴检测位置。

    Systems for protecting internal components of an EUV light source from plasma-generated debris
    23.
    发明授权
    Systems for protecting internal components of an EUV light source from plasma-generated debris 有权
    用于保护EUV光源的内部部件免受等离子体产生的碎片的系统

    公开(公告)号:US07109503B1

    公开(公告)日:2006-09-19

    申请号:US11067099

    申请日:2005-02-25

    Abstract: Systems and methods are disclosed for protecting an EUV light source plasma production chamber optical element surface from debris generated by plasma formation. In one aspect of an embodiment of the present invention, a shield is disclosed which comprises at least one hollow tube positioned between the optical element and a plasma formation site. The tube is oriented to capture debris while allowing light to pass through the tube's lumen via reflection at relatively small angles of grazing incidence. In another aspect of an embodiment of the present invention, a shield is disclosed which is heated to a temperature sufficient to remove one or more species of debris material that has deposited on the shield. In yet another aspect of an embodiment of the present invention, a system is disclosed which a shield is moved from a light source plasma chamber to a cleaning chamber where the shield is cleaned.

    Abstract translation: 公开了用于保护EUV光源等离子体生产室光学元件表面免受等离子体形成产生的碎片的系统和方法。 在本发明的实施例的一个方面,公开了一种屏蔽件,其包括位于光学元件和等离子体形成部位之间的至少一个中空管。 管被定向以捕获碎片,同时允许光以相对较小的掠入射角度的反射通过管的内腔。 在本发明的一个实施例的另一方面,公开了一种屏蔽件,其被加热到足以去除沉积在屏蔽上的一种或多种碎屑材料的温度。 在本发明的一个实施例的另一方面,公开了一种系统,其将屏蔽件从光源等离子体室移动到清洁室,其中屏蔽件被清洁。

Patent Agency Ranking