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    Method and system for implementing large capacity calls by using H.323 protocol stack
    24.
    发明授权
    Method and system for implementing large capacity calls by using H.323 protocol stack 有权
    使用H.323协议栈实现大容量呼叫的方法和系统

    公开(公告)号：US08760491B2

    公开(公告)日：2014-06-24

    申请号：US13376829

    申请日：2010-05-07

    申请人： Qiang Zhang ,  Zheng Ma ,  Feng Li

    发明人： Qiang Zhang ,  Zheng Ma ,  Feng Li

    IPC分类号： H04N7/15

    CPC分类号： H04N7/152 ,  H04L65/00 ,  H04L65/1009 ,  H04L65/1069 ,  H04L65/403 ,  H04L69/32

    摘要： A method and system for implementing large capacity calls by using the H.323 protocol stack are provided in the present invention. The method comprises: a plurality of protocol stacks are deployed in a multi-point control unit; an IP address of a third protocol stack is pre-configured as a uniform IP address of the multi-point control unit, wherein the IP address acts as an incoming address when the multi-point control unit is called, and the third protocol stack is used to perform the H.225 signaling interaction with the opposite end when the multi-point control unit is a called party; when the multi-point control unit is a calling party, a first protocol stack, the number of processable calls of which does not exceed a limit number, is selected to perform the H.225 signaling interaction with the opposite end, and a second protocol stack, the number of processable calls of which does not exceed a limit number, is selected to perform the H.245 signaling interaction with the opposite end; when the multi-point control unit is a called party, a fourth protocol stack, the number of processable calls of which does not exceed a limit number, is selected to perform the H.245 signaling interaction with the opposite end. In the present invention, the H.245 messages from different ends are distributed to a plurality of protocol stacks for processing, which thereby improves the processing efficiency.

    摘要翻译： 本发明提供了一种使用H.323协议栈实现大容量呼叫的方法和系统。 该方法包括：在多点控制单元中部署多个协议栈; 第三协议栈的IP地址被预配置为多点控制单元的统一IP地址，其中当调用多点控制单元时，IP地址用作输入地址，并且第三协议栈是 当多点控制单元是被叫方时，用于与相对端执行H.225信令交互; 当多点控制单元是呼叫方时，选择第一协议栈，其可处理呼叫的数量不超过限制号码，以执行与相对端的H.225信令交互，并且第二协议 堆叠，其可处理呼叫的数量不超过限制数量，以执行与相对端的H.245信令交互; 当多点控制单元是被叫方时，选择第四协议栈，其可处理呼叫的数量不超过限制号码，以执行与相对端的H.245信令交互。 在本发明中，来自不同端的H.245消息被分配到多个协议栈进行处理，从而提高了处理效率。

    PARTICLE DEFOAMER AND PROCESS FOR PREPARING SAME
    25.
    发明申请
    PARTICLE DEFOAMER AND PROCESS FOR PREPARING SAME 有权
    颗粒破碎剂及其制备方法

    公开(公告)号：US20140142020A1

    公开(公告)日：2014-05-22

    申请号：US13989029

    申请日：2011-12-14

    申请人： Yueqin Chi ,  Fei Wu ,  Tian Cao ,  Qiang Zhang ,  Hualan Sui ,  Wei Huang

    发明人： Yueqin Chi ,  Fei Wu ,  Tian Cao ,  Qiang Zhang ,  Hualan Sui ,  Wei Huang

    IPC分类号： C11D3/00

    CPC分类号： C11D3/0026 ,  B01D19/04 ,  C11D1/82 ,  C11D1/825 ,  C11D3/37 ,  C11D3/373 ,  C11D3/3738 ,  C11D9/36 ,  C11D11/00 ,  C11D17/0017 ,  C11D17/0034 ,  C11D17/06 ,  B01D19/0404 ,  B01D19/0409

    摘要： A process for preparing a particle defoamer. The particle defoamer of 55%-75% of a carrier, 15%-35% of a silicone emulsion, 3%-10% of a texturing agent and 2%-10% of a solvent, based on the total weight of the particle defoamer; the process for preparing the particle defoamer is: (1)first adding a carrier A1 into a mixer, and then adding thereto a silicone emulsion B1, and stirring uniformly; (2)adding a carrier component A2 to the mixture obtained in (1), and stirring uniformly; (3)adding a silicone emulsion B2 to the mixture obtained in (2), and, after uniformly stirring, adding the solvent thereto and stirring uniformly; and (4)pelleting and drying by baking the mixture obtained in(3), so as to produce the product.

    摘要翻译： 一种制备颗粒消泡剂的方法。 基于颗粒的总重量，55％-75％的载体，15％-35％的硅氧烷乳液，3％-10％的变形剂和2％-10％的溶剂的颗粒消泡剂 消泡剂 制备颗粒消泡剂的方法是：（1）首先将载体A1加入混合器中，然后加入硅氧烷乳液B1，均匀搅拌; （2）向（1）中得到的混合物中加入载体成分A2，均匀地搅拌; （3）向（2）中得到的混合物中加入硅氧烷乳液B2，在搅拌均匀后，向其中加入溶剂并均匀搅拌; 和（4）通过烘烤在（3）中获得的混合物造粒和干燥，以产生产物。

    Method for Managing Handover of a User Equipment
    26.
    发明申请
    Method for Managing Handover of a User Equipment 有权
    管理用户设备切换的方法

    公开(公告)号：US20140016617A1

    公开(公告)日：2014-01-16

    申请号：US14009463

    申请日：2011-04-06

    申请人： Jonas Fröberg Olsson ,  Qiang Zhang

    发明人： Jonas Fröberg Olsson ,  Qiang Zhang

    IPC分类号： H04W36/20

    CPC分类号： H04W36/20 ,  H04L1/00 ,  H04L1/1867 ,  H04W36/00 ,  H04W36/0016

    摘要： Methods and arrangements (600) in a first network node (120-1) for managing handover of a user equipment (110) from the first network node (120-1), to a second network node (120-2). The method and arrangement (600) comprises transmitting (501) a handover message to the user equipment (110), which handover message is triggering the user equipment (110) to perform the handover, and to establishing (502) a limit related to the amount of retransmissions to be made. Further the method and arrangement (600) comprises interrupting (503) scheduling of resources to the user equipment (110) and inhibiting further retransmissions of the handover message, when either the established limit is reached, or an indication that the user equipment (110) has left the first cell (130-1) is received. Also, methods and arrangements (800) in a in a second network node (120-2) are disclosed.

    摘要翻译： 用于管理用户设备（110）从第一网络节点（120-1）切换到第二网络节点（120-2）的第一网络节点（120-1）中的方法和布置（600）。 所述方法和装置（600）包括向所述用户设备（110）发送切换消息（501），所述切换消息正在触发所述用户设备（110）执行所述切换，以及建立（502）与所述用户设备 重新发送的数量。 此外，所述方法和装置（600）包括中断（503）向所述用户设备（110）的资源调度，并且当达到所建立的限制时，禁止进一步重传所述切换消息，或者指示所述用户设备（110） 已经离开接收到第一小区（130-1）。 此外，公开了第二网络节点（120-2）中的方法和布置（800）。

    Detecting defects on a wafer
    27.
    发明授权
    Detecting defects on a wafer 有权
    检测晶圆上的缺陷

    公开(公告)号：US08605275B2

    公开(公告)日：2013-12-10

    申请号：US13193492

    申请日：2011-07-28

    申请人： Lu Chen ,  Qiang Zhang

    发明人： Lu Chen ,  Qiang Zhang

    IPC分类号： G01N21/00

    CPC分类号： G01N21/9501 ,  H01L22/12

    摘要： Systems and methods for detecting defects on a wafer are provided. One method includes combining first image data and second image data, generated using different output generated using different values for focus of an inspection system, corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer and detecting defects on the wafer using the additional image data.

    摘要翻译： 提供了用于检测晶片上的缺陷的系统和方法。 一种方法包括组合第一图像数据和第二图像数据，所述第二图像数据使用针对检查系统的焦点生成的不同输出而生成的不同输出，对应于晶片上的基本上相同的位置，从而产生用于晶片的附加图像数据并检测晶片上的缺陷 使用附加的图像数据。

    Drop test device
    28.
    发明授权
    Drop test device 失效
    跌落测试设备

    公开(公告)号：US08453490B2

    公开(公告)日：2013-06-04

    申请号：US12981215

    申请日：2010-12-29

    申请人： Yin Le ,  Yu-Lin Liu ,  Qiang Zhang

    发明人： Yin Le ,  Yu-Lin Liu ,  Qiang Zhang

    IPC分类号： G01N3/30

    CPC分类号： G01M7/08 ,  G01N3/303

    摘要： A drop test device for testing the strength of a product includes an operating platform and a hanging mechanism. The operating platform includes a bottom board, a pillar substantially perpendicularly connected to the bottom board and a support member rotatably secured on the pillar. The hanging mechanism is mounted to the pillar, and includes a clamp member for positioning the product. The product is sandwiched by the clamp member so an arris of the product abuts the support member. The support plate is rotated away from the product, so the product can be disengaged from the clamp member and dropped towards the bottom board.

    摘要翻译： 用于测试产品强度的跌落测试装置包括操作平台和悬挂机构。 操作平台包括底板，基本上垂直连接到底板的支柱和可旋转地固定在支柱上的支撑构件。 悬挂机构安装到支柱上，并且包括用于定位产品的夹紧构件。 产品被夹紧构件夹住，使得产品的边缘邻接支撑构件。 支撑板远离产品旋转，因此产品可以从夹紧件脱离并向底板落下。

    ELECTRONIC DEVICES FOR DEFECT DETECTION
    29.
    发明申请
    ELECTRONIC DEVICES FOR DEFECT DETECTION 有权
    用于缺陷检测的电子设备

    公开(公告)号：US20130129188A1

    公开(公告)日：2013-05-23

    申请号：US13300331

    申请日：2011-11-18

    申请人： Qiang Zhang ,  Xinyu Xu ,  Chang Yuan ,  Hae-Jong Seo ,  Petrus J.L. Van Beek

    发明人： Qiang Zhang ,  Xinyu Xu ,  Chang Yuan ,  Hae-Jong Seo ,  Petrus J.L. Van Beek

    IPC分类号： G06K9/00

    CPC分类号： G06T7/0008 ,  G06T7/194 ,  G06T2207/20052 ,  G06T2207/20056

    摘要： An electronic device configured for defect detection is described. The electronic device includes a processor and instructions stored in memory that is in electronic communication with the processor. The electronic device performs background suppression on the image data based on a transform of the image data to obtain a score map. The electronic device also applies thresholding to the score map to generate a detection mask. The thresholding comprises bi-thresholding. The electronic device additionally detects any defects based on the detection mask. The electronic device further indicates any defects.

    摘要翻译： 描述了配置用于缺陷检测的电子设备。 电子设备包括处理器和存储在与处理器电子通信的存储器中的指令。 电子设备基于图像数据的变换对图像数据执行背景抑制以获得分数图。 电子设备还对得分图应用阈值以产生检测掩模。 阈值包括双阈值。 电子设备还基于检测掩模检测任何缺陷。 电子设备还指示任何缺陷。