公开(公告)号：US20230386564A1

公开(公告)日：2023-11-30

申请号：US18137159

申请日：2023-04-20

Applicant: STMicroelectronics International N.V.

Inventor： Kedar Janardan DHORI ,  Nitin CHAWLA ,  Promod KUMAR ,  Harsh RAWAT ,  Manuj AYODHYAWASI

IPC: G11C11/4096 ,  G11C11/408 ,  G11C11/4094

CPC classification number: G11C11/4096 ,  G11C11/4085 ,  G11C11/4094

Abstract: An in-memory computation circuit includes a memory array with SRAM cells connected in rows by word lines and in columns by bit lines. A row controller circuit simultaneously actuates word lines in parallel for an in-memory compute operation. A column processing circuit includes a read circuit that operates to reduce sensitivity to variation in bit line read current. Additionally, a testing circuit senses analog signals on the complementary bit lines to identify one of the complementary bit lines as having a less variable read current. That identified one of the complementary bit lines is coupled to the read circuit for the in-memory compute operation.

公开(公告)号：US20230012567A1

公开(公告)日：2023-01-19

申请号：US17844955

申请日：2022-06-21

Applicant: STMicroelectronics International N.V.

Inventor： Harsh RAWAT ,  Kedar Janardan DHORI ,  Promod KUMAR ,  Nitin CHAWLA ,  Manuj AYODHYAWASI

IPC: G11C11/418 ,  G11C11/412 ,  G11C11/419

Abstract: An in-memory computation circuit includes a memory array with SRAM cells connected in rows by word lines and in columns by bit lines. Body bias nodes of the transistors in each SRAM cell are biased by a modulated body bias voltage. A row controller circuit simultaneously actuates word lines in parallel for an in-memory compute operation. A column processing circuit processes analog voltages developed on the bit lines in response to the simultaneous actuation to generate a decision output for the in-memory compute operation. A voltage generator circuit switches the modulated body bias voltage from a non-negative voltage level to a negative voltage level during the simultaneous actuation. The negative voltage level is adjusted dependent on integrated circuit process and/or temperature conditions in order to optimize protection against unwanted memory cell data flip.

公开(公告)号：US20210072894A1

公开(公告)日：2021-03-11

申请号：US17012501

申请日：2020-09-04

Applicant: STMICROELECTRONICS S.r.l. ,  STMicroelectronics International N.V.

Inventor： Nitin CHAWLA ,  Giuseppe DESOLI ,  Anuj GROVER ,  Thomas BOESCH ,  Surinder Pal SINGH ,  Manuj AYODHYAWASI

IPC: G06F3/06 ,  G06N3/08

Abstract: A memory array arranged as a plurality of memory cells. The memory cells are configured to operate at a determined voltage. A memory management circuitry coupled to the plurality of memory cells tags a first set of the plurality of memory cells as low-voltage cells and tags a second set of the plurality of memory cells as high-voltage cells. A power source provides a low voltage to the first set of memory cells and provides a high voltage to the second set of memory cells based on the tags.

公开(公告)号：US20180189229A1

公开(公告)日：2018-07-05

申请号：US15423272

申请日：2017-02-02

Applicant: STMICROELECTRONICS S.R.L. ,  STMICROELECTRONICS INTERNATIONAL N.V.

Inventor： Giuseppe DESOLI ,  Thomas BOESCH ,  Nitin CHAWLA ,  Surinder Pal SINGH ,  Elio GUIDETTI ,  Fabio Giuseppe DE AMBROGGI ,  Tommaso MAJO ,  Paolo Sergio ZAMBOTTI

IPC: G06F15/78 ,  G06N3/04 ,  G06F13/40

Abstract: Embodiments are directed towards a system on chip (SoC) that implements a deep convolutional network heterogeneous architecture. The SoC includes a system bus, a plurality of addressable memory arrays coupled to the system bus, at least one applications processor core coupled to the system bus, and a configurable accelerator framework coupled to the system bus. The configurable accelerator framework is an image and deep convolutional neural network (DCNN) co-processing system. The SoC also includes a plurality of digital signal processors (DSPs) coupled to the system bus, wherein the plurality of DSPs coordinate functionality with the configurable accelerator framework to execute the DCNN.

公开(公告)号：US20240177769A1

公开(公告)日：2024-05-30

申请号：US18522547

申请日：2023-11-29

Applicant: STMicroelectronics International N.V.

Inventor： Promod KUMAR ,  Kedar Janardan DHORI ,  Harsh RAWAT ,  Nitin CHAWLA ,  Manuj AYODHYAWASI

IPC: G11C11/419 ,  G11C5/14 ,  G11C8/08

CPC classification number: G11C11/419 ,  G11C5/145 ,  G11C8/08

Abstract: A memory array includes memory cells arranged in rows and columns where each row includes a word line connected to memory cells of the row and each column includes a bit line connected to memory cells of the column. Each memory cell stores a bit of weight data for an in-memory computation operation. A row controller circuit coupled to the word lines through drive circuits is configured to simultaneously actuate multiple word lines during the in-memory computation operation. A column processing circuit includes a discharge time sensing circuit for each column that generates an analog signal indicative of a time taken during the in-memory computation operation to discharge the bit line from a precharge voltage to a threshold voltage. The analog signals are converted to digital signal and a computation circuitry performs digital signal processing calculations on the digital signals to generate a decision output for the in-memory computation operation.

公开(公告)号：US20240112748A1

公开(公告)日：2024-04-04

申请号：US18228118

申请日：2023-07-31

Applicant: STMicroelectronics International N.V.

Inventor： Tanuj KUMAR ,  Hitesh CHAWLA ,  Bhupender SINGH ,  Harsh RAWAT ,  Kedar Janardan DHORI ,  Manuj AYODHYAWASI ,  Nitin CHAWLA ,  Promod KUMAR

IPC: G11C29/12 ,  G11C29/32

CPC classification number: G11C29/1201 ,  G11C29/12015 ,  G11C29/32 ,  G11C2029/1204

Abstract: A memory circuit includes an address port, a data input port and a data output port. An upstream shadow logic circuit is coupled to provide address data to the address port of the memory circuit and input data to the data input port of the memory circuit. A downstream shadow logic circuit is coupled to receive output data from the data output port of the memory circuit. The memory circuit includes a bypass path between the address port and the data output port. This bypass path is activated during a testing operation to pass bits of the address data (forming test data) applied by upstream shadow logic circuit from the address port to the data output port.

公开(公告)号：US20240071546A1

公开(公告)日：2024-02-29

申请号：US18227545

申请日：2023-07-28

Applicant: STMicroelectronics International N.V.

Inventor： Hitesh CHAWLA ,  Tanuj KUMAR ,  Bhupender SINGH ,  Harsh RAWAT ,  Kedar Janardan DHORI ,  Manuj AYODHYAWASI ,  Nitin CHAWLA ,  Promod KUMAR

IPC: G11C29/12 ,  G11C29/36

CPC classification number: G11C29/1201 ,  G11C29/36 ,  G11C2029/1202 ,  G11C2029/1204 ,  G11C2029/3602

Abstract: The memory array of a memory includes sub-arrays with memory cells arranged in a row-column matrix where each row includes a word line and each sub-array column includes a local bit line. A row decoder circuit supports two modes of memory circuit operation: a first mode where only one word line in the memory array is actuated during a memory read and a second mode where one word line per sub-array are simultaneously actuated during the memory read. An input/output circuit for each column includes inputs to the local bit lines of the sub-arrays, a column data output coupled to the bit line inputs, and a sub-array data output coupled to each bit line input. Both BIST and ATPG testing of the input/output circuit are supported. For BIST testing, multiple data paths between the bit line inputs and the column data output are selectively controlled to provide complete circuit testing.

公开(公告)号：US20240071429A1

公开(公告)日：2024-02-29

申请号：US18233562

申请日：2023-08-14

Applicant: STMicroelectronics International N.V.

Inventor： Harsh RAWAT ,  Nitin CHAWLA ,  Promod KUMAR ,  Kedar Janardan DHORI ,  Manuj AYODHYAWASI

IPC: G11C7/10 ,  G11C7/12

CPC classification number: G11C7/1009 ,  G11C7/1057 ,  G11C7/106 ,  G11C7/12

Abstract: The memory array of a circuit includes sub-arrays with memory cells arranged in a row-column matrix where each row includes a word line and each sub-array column includes a local bit line. A control circuit supports two modes of circuit operation: a first mode where only one word line in the memory array is actuated during a memory read and a second mode where one word line per sub-array are simultaneously actuated during the memory read. An input/output circuit for each column includes inputs to the local bit lines of the sub-arrays, a column data output coupled to the bit line inputs, and a sub-array data output coupled to each bit line input. In memory computation operations are performed in the second mode as a function of feature data and weight data stored in the memory.

公开(公告)号：US20240069096A1

公开(公告)日：2024-02-29

申请号：US18228048

申请日：2023-07-31

Applicant: STMicroelectronics International N.V.

Inventor： Bhupender SINGH ,  Hitesh CHAWLA ,  Tanuj KUMAR ,  Harsh RAWAT ,  Kedar Janardan DHORI ,  Manuj AYODHYAWASI ,  Nitin CHAWLA ,  Promod KUMAR

IPC: G01R31/317 ,  G11C11/418 ,  G11C11/419

CPC classification number: G01R31/31724 ,  G11C11/418 ,  G11C11/419

Abstract: An array of a memory includes sub-arrays with memory cells arranged in a row-column matrix where each row includes a word line and each sub-array column includes a local bit line. A row decoder supports two modes of memory operation: a first mode where only one word line in the memory array is actuated during a read and a second mode where one word line per sub-array are simultaneously actuated during the read. An input/output circuit for each column includes inputs to the local bit lines of the sub-arrays, a column data output coupled to the bit line inputs, and a sub-array data output coupled to each bit line input. BIST testing of the input/output circuit is supported through data at both the column data output and the sub-array data outputs in order to confirm proper memory operation in support of both the first and second modes of operation.

公开(公告)号：US20240045589A1

公开(公告)日：2024-02-08

申请号：US18488581

申请日：2023-10-17

Applicant: STMICROELECTRONICS S.r.l. ,  STMicroelectronics International N.V.

Inventor： Nitin CHAWLA ,  Giuseppe DESOLI ,  Anuj GROVER ,  Thomas BOESCH ,  Surinder Pal SINGH ,  Manuj AYODHYAWASI

IPC: G06F3/06 ,  G06N3/08

CPC classification number: G06F3/0604 ,  G06F3/0619 ,  G06F3/0655 ,  G06F3/0679 ,  G06N3/08

Abstract: A memory array arranged as a plurality of memory cells. The memory cells are configured to operate at a determined voltage. A memory management circuitry coupled to the plurality of memory cells tags a first set of the plurality of memory cells as low-voltage cells and tags a second set of the plurality of memory cells as high-voltage cells. A power source provides a low voltage to the first set of memory cells and provides a high voltage to the second set of memory cells based on the tags.