公开(公告)号：US20180003767A1

公开(公告)日：2018-01-04

申请号：US15703614

申请日：2017-09-13

Applicant: TECHNOPROBE S.p.A.

Inventor： Roberto Crippa ,  Raffaele Vallauri ,  Emanuele Bertarelli ,  Daniele Perego

IPC: G01R31/28 ,  G01R1/067

CPC classification number: G01R31/2891 ,  G01R1/06733 ,  G01R1/0675 ,  G01R1/07314 ,  G01R1/07357 ,  H01R13/2435 ,  H01R13/42

Abstract: A testing head for testing a device includes a couple of plate-like supports separated from each other by a suitable gap and provided with respective guide holes to slidably house a plurality of contact probes, each including a rod-like body extending along a preset longitudinal axis between a first and second ends, the first end being a contact tip that abuts a contact pad of the device and the second end being a contact head that abuts a contact pad of a space transformer. At least one of the supports comprises a couple of guides that are parallel to each other and separated by an additional gap and provided with corresponding guide holes. Each contact probe comprises a protruding element or stopper originating from a lateral wall and realized in correspondence of one wall of a guide hole of the guides contacting the lateral wall of the contact probe.

公开(公告)号：US20160377655A1

公开(公告)日：2016-12-29

申请号：US15257424

申请日：2016-09-06

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Liberini ,  Filippo Dell'Orto ,  Roberto Crippa

IPC: G01R1/073

CPC classification number: G01R1/07314 ,  G01R1/07378

Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head which houses a plurality of contact probes, each contact probe having at least one contact tip suitable to abut onto contact pads of a device under test, and a support plate of the testing head associated with a stiffener and an intermediate support, connected to the support plate and suitable to provide a spatial transformation of the distances between contact pads made on the opposite sides thereof. Conveniently, the probe card comprises a support element which is joined to the intermediate support, this support element being made by means of a material having a greater stiffness than the intermediate support, thereby being able to provide local micro rectifications of the intermediate support.

Abstract translation: 用于电子设备测试装置的探针卡包括容纳多个接触探针的至少一个测试头，每个接触探针具有至少一个适于邻接被测器件的接触垫的接触尖端，以及支撑板 与加强件和中间支撑件相关联的测试头连接到支撑板并且适于提供在其相对侧上形成的接触垫之间的距离的空间变换。 方便地，探针卡包括与中间支撑件连接的支撑元件，该支撑元件通过具有比中间支撑件更大的刚度的材料制成，由此能够提供中间支撑件的局部微整流。