公开(公告)号：US09880202B2

公开(公告)日：2018-01-30

申请号：US14528774

申请日：2014-10-30

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Vettori ,  Riccardo Liberini

IPC: G01R31/01 ,  G01R1/073 ,  G01R31/28 ,  G01R1/067

CPC classification number: G01R1/07364 ,  G01R1/06733 ,  G01R1/07314 ,  G01R1/07378 ,  G01R31/2889

Abstract: A probe card for an apparatus for testing electronic devices comprises at least one probe head, a plurality of contact probes housed within the probe head, each contact probe having at least one contact tip suitable to abut against contact pads of a device to be tested, a supporting plate of the probe head, an interface plate, a stiffener associating the supporting plate and the interface plate, a plurality of connecting elements with clearance disposed between the supporting plate and the interface plate and housed in a floating manner in a plurality of respective seats made in the supporting plate, and a plurality of connecting elements without clearance disposed between the interface plate and the stiffener.

公开(公告)号：US11209463B2

公开(公告)日：2021-12-28

申请号：US16664669

申请日：2019-10-25

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Liberini

IPC: G01R1/073

Abstract: A probe card for a testing apparatus of electronic devices comprises a probe head housing a plurality of contact probes, each contact probe having at least one contact tip adapted to abut onto contact pads of a device under test, as well as a main support and an intermediate support connected to the main support and adapted to realize a spatial transformation of distances between contact pads on its opposite faces as a space transformer, the probe card suitably also comprising at least one connecting element adapted to link the space transformer and the main support, this connecting element having a substantially rod-like body and being equipped with a first end portion comprising at least one terminal section adapted to be engaged in a corresponding housing realized in the space transformer and with a second terminal portion adapted to abut onto an abutment element linked to the main support.

公开(公告)号：US10151775B2

公开(公告)日：2018-12-11

申请号：US15257424

申请日：2016-09-06

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Liberini ,  Filippo Dell'Orto ,  Roberto Crippa

IPC: G01R1/073

Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head which houses a plurality of contact probes, each contact probe having at least one contact tip suitable to abut onto contact pads of a device under test, and a support plate of the testing head associated with a stiffener and an intermediate support, connected to the support plate and suitable to provide a spatial transformation of the distances between contact pads made on the opposite sides thereof. Conveniently, the probe card comprises a support element which is joined to the intermediate support, this support element being made by means of a material having a greater stiffness than the intermediate support, thereby being able to provide local micro rectifications of the intermediate support.

公开(公告)号：US10509056B2

公开(公告)日：2019-12-17

申请号：US15257443

申请日：2016-09-06

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Liberini ,  Raffaele Vallauri ,  Giuseppe Crippa

IPC: G01R1/073

Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head which houses a plurality of contact probes, each contact probe having at least one contact tip suitable to abut onto contact pads of a device under test, and a support plate of the testing head associated with a stiffener and an intermediate support, connected to the support plate and suitable to provide a spatial transformation of the distances between contact pads made on opposite sides thereof. Conveniently, the probe card comprises a support which is joined to the intermediate support, which is made of a material compatible with the printed circuit board technologies and has a coefficient of thermal expansion greater than 10×10−6° C.−1, the support being made of a metal material having a coefficient of thermal expansion lower than 6×10−6° C.−1.

公开(公告)号：US20160377655A1

公开(公告)日：2016-12-29

申请号：US15257424

申请日：2016-09-06

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Liberini ,  Filippo Dell'Orto ,  Roberto Crippa

IPC: G01R1/073

CPC classification number: G01R1/07314 ,  G01R1/07378

Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head which houses a plurality of contact probes, each contact probe having at least one contact tip suitable to abut onto contact pads of a device under test, and a support plate of the testing head associated with a stiffener and an intermediate support, connected to the support plate and suitable to provide a spatial transformation of the distances between contact pads made on the opposite sides thereof. Conveniently, the probe card comprises a support element which is joined to the intermediate support, this support element being made by means of a material having a greater stiffness than the intermediate support, thereby being able to provide local micro rectifications of the intermediate support.

Abstract translation: 用于电子设备测试装置的探针卡包括容纳多个接触探针的至少一个测试头，每个接触探针具有至少一个适于邻接被测器件的接触垫的接触尖端，以及支撑板 与加强件和中间支撑件相关联的测试头连接到支撑板并且适于提供在其相对侧上形成的接触垫之间的距离的空间变换。 方便地，探针卡包括与中间支撑件连接的支撑元件，该支撑元件通过具有比中间支撑件更大的刚度的材料制成，由此能够提供中间支撑件的局部微整流。

公开(公告)号：US11782075B2

公开(公告)日：2023-10-10

申请号：US17545851

申请日：2021-12-08

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Liberini

IPC: G01R1/073

CPC classification number: G01R1/07378 ,  G01R1/07342

Abstract: A probe card for a testing apparatus of electronic devices comprises a probe head housing a plurality of contact probes, each contact probe having at least one contact tip adapted to abut onto contact pads of a device under test, as well as a main support and an intermediate support connected to the main support and adapted to realize a spatial transformation of distances between contact pads on its opposite faces as a space transformer, the probe card suitably also comprising at least one connecting element adapted to link the space transformer and the main support, this connecting element having a substantially rod-like body and being equipped with a first end portion comprising at least one terminal section adapted to be engaged in a corresponding housing realized in the space transformer and with a second terminal portion adapted to abut onto an abutment element linked to the main support.

公开(公告)号：US20160377656A1

公开(公告)日：2016-12-29

申请号：US15257443

申请日：2016-09-06

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Liberini ,  Rafaele Vallauri ,  Giuseppe Crippa

IPC: G01R1/073

Abstract: A probe card for a testing apparatus of electronic devices comprises at least one testing head which houses a plurality of contact probes, each contact probe having at least one contact tip suitable to abut onto contact pads of a device under test, and a support plate of the testing head associated with a stiffener and an intermediate support, connected to the support plate and suitable to provide a spatial transformation of the distances between contact pads made on opposite sides thereof. Conveniently, the probe card comprises a support which is joined to the intermediate support, which is made of a material compatible with the printed circuit board technologies and has a coefficient of thermal expansion greater than 10×10−6° C.−1, the support being made of a metal material having a coefficient of thermal expansion lower than 6×10−6° C.−1.

Abstract translation: 用于电子设备测试装置的探针卡包括容纳多个接触探针的至少一个测试头，每个接触探针具有至少一个适于邻接被测器件的接触垫的接触尖端，以及支撑板 与加强件相关联的测试头和中间支撑件，其连接到支撑板并且适于提供在其相对侧上形成的接触垫之间的距离的空间变换。 方便地，探针卡包括与中间支撑件相连的支撑件，该中间支架由与印刷电路板技术相兼容的材料制成并具有大于10×10-6℃-1的热膨胀系数， 支撑体由热膨胀系数低于6×10 -6℃-1的金属材料制成。

公开(公告)号：US20150048856A1

公开(公告)日：2015-02-19

申请号：US14528774

申请日：2014-10-30

Applicant: Technoprobe S.p.A.

Inventor： Riccardo Vettori ,  Riccardo Liberini

IPC: G01R1/073 ,  G01R1/067

CPC classification number: G01R1/07364 ,  G01R1/06733 ,  G01R1/07314 ,  G01R1/07378 ,  G01R31/2889

Abstract: A probe card for an apparatus for testing electronic devices comprises at least one probe head, a plurality of contact probes housed within the probe head, each contact probe having at least one contact tip suitable to abut against contact pads of a device to be tested, a supporting plate of the probe head, an interface plate, a stiffener associating the supporting plate and the interface plate, a plurality of connecting elements with clearance disposed between the supporting plate and the interface plate and housed in a floating manner in a plurality of respective seats made in the supporting plate, and a plurality of connecting elements without clearance disposed between the interface plate and the stiffener.

Abstract translation: 用于测试电子设备的装置的探针卡包括至少一个探针头，容纳在探针头内的多个接触探针，每个接触探针具有至少一个接触尖端，该接触尖端适于邻接被测试装置的接触垫， 探针头的支撑板，界面板，将支撑板和界面板相关联的加强件，具有设置在支撑板和界面板之间的间隙的多个连接元件，并以浮动方式容纳在多个相应的 在支撑板上形成的座，以及设置在界面板和加强件之间的多个没有间隙的连接元件。