公开(公告)号：US20220034975A1

公开(公告)日：2022-02-03

申请号：US17386384

申请日：2021-07-27

Applicant: Tektronix, Inc.

Inventor： Sam J. Strickling ,  Daniel S. Froelich ,  Michelle L. Baldwin ,  Jonathan San ,  Lin-Yung Chen

IPC: G01R31/58 ,  G01R31/12 ,  H01R13/64 ,  H01R13/66

Abstract: A cable structured to be repeatedly connected to a device, each repeated connection causing degradation of the cable, the cable including a condition indicator disposed on the cable and configured to be updated with each successive connection of the cable into the device.

公开(公告)号：US20220034967A1

公开(公告)日：2022-02-03

申请号：US17375451

申请日：2021-07-14

Applicant: Tektronix, Inc.

Inventor： Sam J. Strickling ,  Daniel S. Froelich ,  Michelle L. Baldwin ,  Jonathan San ,  Lin-Yung Chen ,  Shane A. Hazzard

IPC: G01R31/319 ,  G01R31/3185

Abstract: A calibrated test and measurement cable for connecting one or more devices under test and a test and measurement instrument, including a first port structured to electrically connect to a first signal lane, a second port structured to electrically connect to a second signal lane, a third port structured to electrically connect to a test and measurement instrument, and a multiplexer configured to switch between electrically connecting the first port to the third port and connected the second port to the third port. The first and second signal lanes can be included on the same device under test or different devices under test. An input can receive instructions to operate the multiplexer.

公开(公告)号：US20210297882A1

公开(公告)日：2021-09-23

申请号：US17207091

申请日：2021-03-19

Applicant: Tektronix, Inc.

Inventor： Sam J. Strickling ,  Andrew McCann ,  Daniel S. Froelich ,  Michelle L. Baldwin ,  Jonathan San ,  Lin-Yung Chen

IPC: H04W24/08 ,  G01R35/00

Abstract: Systems and methods for automated recognition of a device under test and retrieving data associated with the device under test based on the recognition. The systems and methods include receiving a recognition key based on an identifying characteristic of the device under test, matching the received recognition key to a stored key in a database, retrieving data related to the stored key when the received recognition key matches the stored key, transmitting instructions to perform an action on a test and measurement device based on the retrieved data, receiving new data related to the device under test, and updating the data in the database related to the stored key with the new data.

公开(公告)号：US20210148640A1

公开(公告)日：2021-05-20

申请号：US17096622

申请日：2020-11-12

Applicant: Tektronix, Inc.

Inventor： Julie A. Campbell ,  David Thomas Engquist ,  Sam J. Strickling

IPC: F28D7/10 ,  G01R31/28

Abstract: A thermal management system for a test-and-measurement probe that includes a thermally insulated shroud and a fluid inlet conduit. The shroud is configured to enclose a first portion of a probe head of the probe within an interior cavity of the shroud, while permitting a second portion of the probe head to extend out of the shroud. The shroud further includes a fluid outlet passageway configured to permit a heat-transfer fluid to pass from a probe-head end of the interior cavity, through the interior cavity of the shroud, and out of the shroud through an access portion of the shroud. The fluid inlet conduit enters the shroud through the access portion of the shroud, extends through the interior cavity of the shroud, and is configured to introduce the heat-transfer fluid to the probe-head end of the interior cavity.