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    Active wafer probe
    21.
    发明申请
    Active wafer probe 失效
    活动晶圆探针

    公开(公告)号：US20080309358A1

    公开(公告)日：2008-12-18

    申请号：US12228812

    申请日：2008-08-14

    Applicant: Eric Strid ,  K. Reed Gleason

    Inventor： Eric Strid ,  K. Reed Gleason

    IPC: G01R1/067

    CPC classification number: G01R1/06711 ,  G01R1/06772

    Abstract: A probe suitable for probing a semiconductor wafer that includes an active circuit. The probe may include a flexible interconnection between the active circuit and a support structure. The probe may impose a relatively low capacitance on the device under test.

    Abstract translation: 适于探测包括有源电路的半导体晶片的探针。 探针可以包括有源电路和支撑结构之间的柔性互连。 探头可能会在被测器件上施加相对较低的电容。

    Active wafer probe
    23.
    发明授权
    Active wafer probe 有权
    活动晶圆探针

    公开(公告)号：US07427868B2

    公开(公告)日：2008-09-23

    申请号：US11019440

    申请日：2004-12-21

    Applicant: Eric Strid ,  K. Reed Gleason

    Inventor： Eric Strid ,  K. Reed Gleason

    IPC: G01R31/02

    CPC classification number: G01R1/06711 ,  G01R1/06772

    Abstract: A probe suitable for probing a semiconductor wafer that includes an active circuit. The probe may have a rigid probing member and include a flexible interconnection between the active circuit and a support structure. The active circuit may have a relatively low capacitance as seen by the device under test.

    Abstract translation: 适于探测包括有源电路的半导体晶片的探针。 探头可以具有刚性探测构件并且包括有源电路和支撑结构之间的柔性互连。 有源电路可能具有相对较低的电容，如被测器件所见。

    Membrane probing system
    24.
    发明授权
    Membrane probing system 失效

    公开(公告)号：US07355420B2

    公开(公告)日：2008-04-08

    申请号：US10223863

    申请日：2002-08-19

    Applicant: Kenneth Smith ,  Reed Gleason

    Inventor： Kenneth Smith ,  Reed Gleason

    IPC: G01R31/02 ,  G01R31/26

    CPC classification number: G01R1/0735

    Abstract: A membrane probing assembly includes a probe card with conductors supported thereon, wherein the conductors include at least a signal conductor located between a pair of spaced apart guard conductors. A membrane assembly includes a membrane with contacts thereon, and supporting at least a signal conductor located between a pair of spaced apart guard conductors. The guard conductors of the probe card are electrically interconnected proximate the interconnection between the probe card and the membrane assembly. The guard conductors of the membrane assembly are electrically interconnected proximate the interconnection between the probe card and the membrane assembly.

    Localizing a temperature of a device for testing
    29.
    发明授权
    Localizing a temperature of a device for testing 有权
    定位设备的温度进行测试

    公开(公告)号：US07330041B2

    公开(公告)日：2008-02-12

    申请号：US11086126

    申请日：2005-03-21

    Applicant: Bruce McFadden

    Inventor： Bruce McFadden

    IPC: G01R31/02

    CPC classification number: G01R31/2874 ,  G01R31/2891

    Abstract: Wafers or other structures comprising a plurality of dies or devices are tested at non-ambient temperatures by inducing a first heat flux through a substantial portion of a surface of the structure to modify a temperature of the structure and inducing a second heat flux through a local area of a surface of the structure, proximate the device under test, to modify the temperature the device under test.

    Abstract translation: 包括多个管芯或器件的晶片或其他结构在非环境温度下通过引导通过结构表面的大部分的第一热通量来改变结构的温度并引起通过局部的第二热通量 结构的表面的区域，靠近被测设备，以修改被测设备的温度。

    System for detecting molecular structure and events
    30.
    发明申请
    System for detecting molecular structure and events 审中-公开
    检测分子结构和事件的系统

    公开(公告)号：US20080012578A1

    公开(公告)日：2008-01-17

    申请号：US11710151

    申请日：2007-02-22

    Applicant: Richard Campbell

    Inventor： Richard Campbell

    IPC: G01R27/26

    CPC classification number: G01N27/221 ,  G01R27/26

    Abstract: The molecular structure of a medium and the occurrence of events effecting the molecular structure of a medium are determined by measuring the effect on the resonant frequency and/or the dissipated current of an oscillating electric field when a sample of a medium under test occupies a portion of the region of the field.

    Abstract translation: 介质的分子结构和影响介质的分子结构的事件的发生通过测量当被测介质的样品占据部分的谐振频率和/或振荡电场的耗散电流时的影响来确定 的领域。

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