公开(公告)号：US07071463B2

公开(公告)日：2006-07-04

申请号：US10388586

申请日：2003-03-17

Applicant: Andrew R. Bowdler

Inventor： Andrew R. Bowdler

IPC: H01J49/36

CPC classification number: H01J49/405 ,  H01J49/0009

Abstract: In its most general terms the invention compensates for the effect of the mass offset in the prior art calibration method. This can be achieved either by correcting for the offset or assigning mass to the peaks in such a way that the offset is avoided. Accordingly in a first aspect there is provided a method of calibrating a reflectron time-of-flight mass spectrometer using a spectrum generated by fragment ions wherein a measured mass value is modified to take account of the effect of post source decay and that modified value is used for calibration. A modified calibration function can then be defined and used to determine actual fragment ion masses of an unknown compound.

Abstract translation: 在本发明的最普遍的术语中，本发明补偿了现有技术的校准方法中的质量偏移的影响。 这可以通过校正偏移或将质量分配给峰值来实现，使得避免偏移。 因此，在第一方面中，提供了使用由碎片离子产生的光谱来校准反射器飞行时间质谱仪的方法，其中测量的质量值被修改以考虑到后源衰变的影响，并且修改的值为 用于校准。 然后可以定义修改的校准函数并用于确定未知化合物的实际碎片离子质量。

公开(公告)号：US20040113065A1

公开(公告)日：2004-06-17

申请号：US10723721

申请日：2003-11-24

Inventor： Jurgen Grotemeyer ,  Andreas Uphoff ,  Sohnke Schmidt ,  Tassilo Muskat

IPC: H01J049/40

CPC classification number: H01J49/405

Abstract: A reflector is provided as well as a time-of-flight mass spectrometer with a reflector. The mass spectrometers is used for determining the chemical structure of molecules as well as for the quantitative analysis of unknown mixtures of substances. Design effort is minimized, especially for the reflector. The reflector is present in the time-of-flight mass spectrometer to generate an electrostatic field permitting the best possible focusing for the deflection of the ions. The reflector body is made in one piece as a radially symmetrical trough. The reflector is preferably made of a stainless steel or a carrier material with conductive coating and is polished on the inner side of the trough.

Abstract translation: 提供反射器以及具有反射器的飞行时间质谱仪。 质谱仪用于确定分子的化学结构以及物质的未知混合物的定量分析。 设计努力最小化，特别是对于反射器。 反射器存在于飞行时间质谱仪中以产生允许尽可能聚焦以实现离子偏转的静电场。 反射器体作为径向对称的槽制成一体。 反射器优选地由不锈钢或具有导电涂层的载体材料制成，并且在槽的内侧被抛光。

公开(公告)号：US06740872B1

公开(公告)日：2004-05-25

申请号：US10298169

申请日：2002-11-15

Applicant: Armin Holle

Inventor： Armin Holle

IPC: B01D5944

CPC classification number: H01J49/405

Abstract: The invention relates to an energy-focusing and space-angle focusing reflector for time-of-flight mass spectrometers. The invention consists in producing an adjustable space-angle focusing system by means of an adjustably weaker field with curved equipotential lines at the end of the reflector instead of a fully homogeneous electrical reflection field.

Abstract translation: 本发明涉及一种用于飞行时间质谱仪的能量聚焦和空间角聚焦反射器。 本发明在于通过在反射器的末端具有弯曲的等电位线的可调节较弱的场来产生可调节的空间角度聚焦系统，而不是完全均匀的电反射场。

公开(公告)号：US20040094703A1

公开(公告)日：2004-05-20

申请号：US10298169

申请日：2002-11-15

Applicant: Bruker Daltonik GMBH

Inventor： Armin Holle

IPC: H01J049/40

CPC classification number: H01J49/405

Abstract: The invention relates to an energy-focusing and space-angle focusing reflector for time-of-flight mass spectrometers. The invention consists in producing an adjustable space-angle focusing system by means of an adjustably weaker field with curved equipotential lines at the end of the reflector instead of a fully homogeneous electrical reflection field.

Abstract translation: 本发明涉及一种用于飞行时间质谱仪的能量聚焦和空间角聚焦反射器。 本发明在于通过在反射器的末端具有弯曲的等电位线的可调节较弱的场来产生可调节的空间角度聚焦系统，而不是完全均匀的电反射场。

公开(公告)号：US06607414B2

公开(公告)日：2003-08-19

申请号：US10055273

申请日：2002-01-23

Applicant: Timothy J. Cornish ,  Harry K. Charles ,  Paul D. Wienhold

Inventor： Timothy J. Cornish ,  Harry K. Charles ,  Paul D. Wienhold

IPC: H01J102

CPC classification number: H01J49/405 ,  G21K1/06 ,  H05K1/118 ,  H05K3/0014 ,  H05K2201/09018 ,  H05K2203/1327

Abstract: A novel technique utilizing the precision of printed circuit board design and the physical versatility of thin, flexible substrates is disclosed to produce a new type of ion reflector. A precisely defined series of thin conductive strips (traces) are etched onto a flat, flexible circuit board substrate. Preferably, the thin conductive strips are further apart at one end of the substrate and get increasingly closer towards the other end of the substrate. The flexible substrate is then rolled into a tube to form the reflector body, with the conductive strips forming the rings of the ion reflector. The spacing between the traces, and hence the ring spacing, can be readily varied by adjusting the conductor pattern on the substrate sheet during the etching process. By adjusting the spacing between the rings, the characteristics of the field created by the reflectron can be easily customized to the needs of the user.

Abstract translation: 公开了一种利用印刷电路板设计的精确性和薄的柔性基板的物理通用性的新技术，以产生新型的离子反射器。 将精确定义的一系列薄导电条（迹线）蚀刻到平坦，柔性的电路板基板上。 优选地，薄导电条在衬底的一端处进一步分开，并且越来越靠近衬底的另一端。 然后将柔性基材卷成管以形成反射体，导电条形成离子反射体的环。 通过在蚀刻工艺期间调节衬底片上的导体图案，可以容易地改变迹线之间的间隔以及因此的环间隔。 通过调整环之间的间距，可以根据用户的需要轻松定制由反射镜产生的场的特性。

公开(公告)号：US20020033447A1

公开(公告)日：2002-03-21

申请号：US09946838

申请日：2001-09-06

Inventor： Andrew R. Bowdler

IPC: B01D059/44

CPC classification number: H01J49/405 ,  H01J49/0009

Abstract: In its most general terms the invention compensates for the effect of the mass offset in the prior art calibration method. This can be achieved either by correcting for the offset or assigning mass to the peaks in such a way that the offset is avoided. Accordingly in a first aspect there is provided a method of calibrating a reflectron time-of-flight mass spectrometer using a spectrum generated by fragment ions wherein the mass of the fragment ion is assigned using the mono-isotopic peak only. In other words a value corresponding to the mass of the fragment ion used for calibration is assigned using the fragment ion mono-isotopic peak only and said value is used to calibrate the spectrometer.

Abstract translation: 在本发明的最普遍的术语中，本发明补偿了现有技术的校准方法中的质量偏移的影响。 这可以通过校正偏移或将质量分配给峰值来实现，使得避免偏移。 因此，在第一方面，提供了使用由碎片离子产生的光谱校准反射器飞行时间质谱仪的方法，其中仅使用单同位素峰分配片段离子的质量。 换句话说，对应于用于校准的碎片离子的质量的值仅使用片段离子单同位素峰来分配，并且所述值用于校准光谱仪。

公开(公告)号：US5376788A

公开(公告)日：1994-12-27

申请号：US67758

申请日：1993-05-26

Applicant: Kenneth G. Standing ,  Werner Ens

Inventor： Kenneth G. Standing ,  Werner Ens

IPC: H01J49/40

CPC classification number: H01J49/164 ,  H01J49/0045 ,  H01J49/403 ,  H01J49/405

Abstract: An improved apparatus and method for the analysis of ions generated by matrix-assisted laser desorption is disclosed. This apparatus and method enhances the mass spectral resolution compared to previous devices and methods by producing electrical modulation of the kinetic energy imparted to the generated ions in a matrix-assisted laser desorption mass spectrometer. This modulation causes parent ions of interest to be substantially reflected (and detected) or substantially not reflected (and not detected) within the spectrometer, while fragment ions produced from the parent ion of interest are substantially reflected (and detected) independent of said modulation. A difference signal is generated between electrical signals sensed when the parent ions are reflected and electrical signals sensed when the parent ions are not reflected thereby mitigating the effects on the mass spectrum of the undesired fragment ions.

Abstract translation: 公开了一种用于分析由基质辅助激光解吸产生的离子的改进的装置和方法。 与以前的装置和方法相比，该装置和方法通过在矩阵辅助激光解吸质谱仪中产生赋予生成的离子的动能的电调制来提高质谱分辨率。 该调制使得感兴趣的母体离子在光谱仪内基本上被反射（并被检测）或基本上不被反射（并且未检测到），而从感兴趣的母体离子产生的碎片离子基本上被反射（并被检测）而与所述调制无关。 当母体离子被反射时检测到的电信号之间产生差异信号，并且当母体离子不反射时感测到电信号，从而减轻对不需要的碎片离子的质谱的影响。

公开(公告)号：US3727047A

公开(公告)日：1973-04-10

申请号：US3727047D

申请日：1971-07-22

Applicant: AVCO CORP

Inventor： JANES G

IPC: H01J49/40 ,  B01D59/44

CPC classification number: H01J49/405

Abstract: In a time of flight mass spectrometer ions accelerated from the source are reflected by a soft reflection field toward the detector, the magnitude and direction of the reflection field being such as to lengthen the time of flight of ions of relatively high initial kinetic energy more than ions of relatively low initial kinetic energy so that ions of the same mass to charge ratio, but of different initial velocity will have the same total time of flight from the source to the detector. Thus, ions of a given charge to mass ratio which enter the system at different initial energies at a given time will all arrive at the detector at the same time.

Abstract translation: 在飞行时间内，从源极加速的质谱仪离子通过软反射场向检测器反射，反射场的大小和方向使得比较高的初始动能的离子的飞行时间大于 离子具有相对低的初始动能，使得具有相同质荷比的离子，但具有不同初始速度的离子将具有从源到检测器的相同的总飞行时间。 因此，在给定时间以不同初始能量进入系统的给定电荷质量比的离子将同时到达检测器。

公开(公告)号：US12027359B2

公开(公告)日：2024-07-02

申请号：US17056999

申请日：2019-05-31

Applicant: Micromass UK Limited

Inventor： Peter Carney ,  Soji Chummar ,  Jason Lee Wildgoose ,  Ruth Wamsley

IPC: H01J49/06 ,  H01J49/00 ,  H01J49/04 ,  H01J49/40

CPC classification number: H01J49/068 ,  H01J49/0031 ,  H01J49/04 ,  H01J49/065 ,  H01J49/401 ,  H01J49/405

Abstract: A Time of Flight analyser comprising a flight tube (160) and a reflectron (170), wherein the reflectron comprises a stack of electrodes (172) that are compressed against the flight tube such that they remain parallel to each other under compression.

公开(公告)号：US20240030018A1

公开(公告)日：2024-01-25

申请号：US18359547

申请日：2023-07-26

Applicant: Micromass UK Limited

Inventor： Anatoly Verenchikov ,  Mikhail Yavor

IPC: H01J49/40

CPC classification number: H01J49/406 ,  H01J49/405

Abstract: Improved ion mirrors 30 (FIG. 3) are proposed for multi-reflecting TOF MS and electrostatic traps. Minor and controlled variation by means of arranging a localized wedge field structure 35 at the ion retarding region was found to produce major tilt of ion packets time fronts 39. Combining wedge reflecting fields with compensated deflectors is proposed for electrically controlled compensation of local and global misalignments, for improved ion injection and for reversing ion motion in the drift direction. Fine ion optical properties of methods and embodiments are verified in ion optical simulations.