中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

283 records (took 0.019 seconds)

    TOF MS detection system with improved dynamic range
    2.
    发明授权
    TOF MS detection system with improved dynamic range 有权

    公开(公告)号：US11881387B2

    公开(公告)日：2024-01-23

    申请号：US17056965

    申请日：2019-05-23

    Applicant: Micromass UK Limited

    Inventor： Anatoly Verenchikov

    IPC: H01J49/40 ,  H01J49/00 ,  H01J49/02 ,  H01J49/06

    CPC classification number: H01J49/406 ,  H01J49/005 ,  H01J49/0036 ,  H01J49/025 ,  H01J49/061 ,  H01J49/401

    Abstract: Apparatus and method are proposed for the strong improvement of dynamic range (DR) of detectors and of data systems for time-of-flight mass spectrometers (TOF MS) with periodically repetitive signals. TOF separated ions are converted into secondary particles, primarily electrons, and the flow of secondary particles is controllably attenuated to sustain the data acquisition system in a counting mode above the electronic noise threshold. The acquisition time is split between at least two time segments, characterized by alternated transmission efficiency SE of secondary particles. Using strong electron suppression (SE«1) is employed for recording intense ion peak, while counting ions with either ADC, or TDC, or ADC with extracting peak centroids. A longer time segment employs an efficient electron transfer (SE=1) for detecting weak ion species. In another independent aspect, an ion-optical element is provided upstream of the ion detector and is configured to deflect, reflect or retard ions such that ions that have been scattered or fragmented in the time of flight region do not impact on the ion detector.

    TIME-OF-FLIGHT MASS SPECTROMETER AND TUNING METHOD FOR THE SAME
    3.
    发明公开
    TIME-OF-FLIGHT MASS SPECTROMETER AND TUNING METHOD FOR THE SAME 审中-公开

    公开(公告)号：US20230386817A1

    公开(公告)日：2023-11-30

    申请号：US18295900

    申请日：2023-04-05

    Applicant: Shimadzu Corporation

    Inventor： Kosuke UCHIYAMA ,  Tomoyuki OSHIRO

    IPC: H01J49/40

    CPC classification number: H01J49/401

    Abstract: In a TOFMS measurement unit, an ion acceleration section accelerates ions to send them into a flight space, within which a flight-field creation section creates, an electric field for causing ions to fly. A controller unit operates the measurement unit so as to repeat a measurement for a predetermined sample while varying a voltage applied to an electrode in the measurement unit, and calculates mass-resolving power based on each measurement result. An approximate function calculator unit finds an approximate function representing a relationship between the voltage and the mass-resolving power, based on data of combinations of the voltage and the mass-resolving power obtained under the control of the controller unit. A voltage determiner unit determines a voltage value corresponding to a target value of the mass-resolving power by the approximate function, and determines the voltage value as a voltage to be applied to the electrode in the TOFMS concerned.

    ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
    5.
    发明公开
    ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS 审中-公开

    公开(公告)号：US20230170204A1

    公开(公告)日：2023-06-01

    申请号：US18159300

    申请日：2023-01-25

    Applicant: Micromass UK Limited

    Inventor： Anatoly Verenchikov ,  Mikhail Yavor

    IPC: H01J49/40 ,  H01J49/00 ,  H01J49/02 ,  H01J49/06 ,  H01J49/16 ,  H01J49/42

    CPC classification number: H01J49/406 ,  H01J49/0031 ,  H01J49/025 ,  H01J49/061 ,  H01J49/164 ,  H01J49/401 ,  H01J49/405 ,  H01J49/4245

    Abstract: Improved pulsed ion sources and pulsed converters are proposed for multi-pass time-of-flight mass spectrometer, either multi-reflecting (MR) or multi-turn (MT) TOF. A wedge electrostatic field 45 is arranged within a region of small ion energy for electronically controlled tilting of ion packets 54 time front. Tilt angle γ of time front 54 is strongly amplified by a post-acceleration in a flat field 48. Electrostatic deflector 30 downstream of the post-acceleration 48 allows denser folding of ion trajectories, whereas the injection mechanism allows for electronically adjustable mutual compensation of the time front tilt angle, i.e. γ=0 for ion packet in location 55, for curvature of ion packets, and for the angular energy dispersion. The arrangement helps bypassing accelerator 40 rims, adjusting ion packets inclination angles α2, and what is most important, compensating for mechanical misalignments of the optical components.

    Time-of-flight mass spectrometer
    6.
    发明授权
    Time-of-flight mass spectrometer 有权

    公开(公告)号：US10020181B2

    公开(公告)日：2018-07-10

    申请号：US15504541

    申请日：2014-08-19

    Applicant: SHIMADZU CORPORATION

    Inventor： Daisuke Okumura

    IPC: H01J49/40 ,  H01J49/06

    CPC classification number: H01J49/401 ,  H01J49/0045 ,  H01J49/062 ,  H01J49/24 ,  H01J49/40

    Abstract: An ion transport optical system is disposed between a collision cell and an orthogonal acceleration unit. When releasing ions that are held in the collision cell, an accelerating electric field in which a large potential difference exists is created between an exit-side end of an ion guide and a first stage of the ion transport optical system, and a decelerating electric field in which a relatively small potential difference exists is created between a final stage of the ion transport optical system and an entrance end of the orthogonal acceleration unit. In the accelerating electric field, the velocity of ions is increased overall by imparting a large amount of energy to the ions, and spreading of ions in the ion travel direction that is caused by differences between the mass-to-charge ratios of the ions is reduced.

    Orthogonal acceleration coaxial cylinder mass analyser
    7.
    发明授权
    Orthogonal acceleration coaxial cylinder mass analyser 有权

    公开(公告)号：US09997345B2

    公开(公告)日：2018-06-12

    申请号：US15301179

    申请日：2015-04-01

    Applicant: MICROMASS UK LIMITED

    Inventor： John Brian Hoyes ,  David J. Langridge ,  Jason Lee Wildgoose

    IPC: H01J49/00 ,  H01J49/40 ,  H01J49/42 ,  H01J49/02

    CPC classification number: H01J49/401 ,  H01J49/0031 ,  H01J49/025 ,  H01J49/406 ,  H01J49/4245 ,  H01J49/427

    Abstract: A mass analyzer is disclosed comprising an annular ion guide comprising a first annular ion guide section and a second annular ion guide section, wherein the annular ion guide comprises: (i) an inner cylindrical electrode arrangement which is axially segmented and comprises a plurality of first electrodes and (ii) an outer cylindrical electrode arrangement which is axially segmented and comprises a plurality of second electrodes. Ions are introduced into the first annular ion guide section so that the ions form substantially stable circular orbits. Ions are orthogonally accelerated from the first annular ion guide section into the second annular ion guide section and one or more parabolic DC potentials are maintained along a portion of the second annular ion guide section so that ions undergo simple harmonic motion. An inductive ion detector is arranged and adapted to detect ions within the second annular ion guide section.

    APPARATUS FOR DETECTING CONSTITUENTS IN A SAMPLE AND METHOD OF USING THE SAME
    8.
    发明申请
    APPARATUS FOR DETECTING CONSTITUENTS IN A SAMPLE AND METHOD OF USING THE SAME 审中-公开

    公开(公告)号：US20180158665A1

    公开(公告)日：2018-06-07

    申请号：US15370947

    申请日：2016-12-06

    Applicant: Rapiscan Systems, Inc.

    Inventor： Gary A. Eiceman ,  Stephen J. Davila ,  Stefan R. Lukow ,  Hartwig Schmidt

    IPC: H01J49/40 ,  G01N27/62 ,  H01J49/00

    CPC classification number: H01J49/401 ,  G01N27/622 ,  H01J49/0045

    Abstract: An apparatus for detecting constituents in a sample includes first and second drift tubes defining first and second drift regions, and a controllable electric field device within a fragmentation region coupled to the first and second drift tubes. The apparatus also includes a first ion shutter positioned between the first drift and fragmentation regions. The apparatus further includes a control system configured to regulate the first ion shutter, thereby facilitating injection of a selected portion of ions from the first drift region into the fragmentation region. The control system is also configured to regulate the controllable device to modify the selected portion of ions to generate predetermined ion fragments within the fragmentation region, thereby facilitating injection of a selected portion of the predetermined fragmented ions into the second drift region. A method of detecting constituents in a sample is facilitated through such an apparatus.

Patent Agency Ranking