摘要:
A structure for testing a luminescent film includes a Lambertian light source, an integrating sphere having an input port, and a measuring device. The Lambertian light source includes a mixing chamber having an input port and an output port, and a light emitter coupled to the input port. During testing the luminescent film is positioned between the output port of the mixing chamber and the input port of the integrating sphere. The measuring device is optically coupled to the integrating sphere.
摘要:
A system for measuring properties of a thin film coated glass having a light source, a spectrometer, at least one pair of probes, a first optical fiber switch and a second optical fiber switch. The pair of probes includes a first probe located on one side of a glass sheet and a second probe located on the opposite side of the glass sheet, directly across from the first probe. The first and second optical fiber switches are adapted to couple either probe to the light source and/or the spectrometer. Because the design of the system is optically symmetrical, calibration may be performed without the use of a reference material such as a tile or mirror. Each of the first and second probes has a first leg and a second leg that are separated from each other by a distance n so that angled reflections may be detected.
摘要:
Illuminating light emitted from a light source is led via a condenser lens, an optical fiber, a half-silvered mirror, and a condenser lens to a reflector. The reflector reflects the illuminating light to a CCD device through a telecentric optical system which comprises the condenser lens, the half-silvered mirror, and an aperture member. The illuminating light applied to the CCD device is greatly reduced in amount as it passes through a light-transmissive sheet-like body twice. The light-transmissive sheet-like body itself or an edge thereof can be detected with high accuracy even if the light-transmissive sheet-like body has a high transmittance.
摘要:
In an inspection device, an inspection light projector and an auxiliary light emitter respectively project an inspection light and auxiliary light onto a position of a filmstrip. After transmitting the filmstrip, the inspection light is received by a defect detector. When receiving the inspection light, the defect detector generates a data signal and sends it to a controller. In the controller, a threshold of a level of the data signal is memorized, and the level of the data signal is compared with the threshold. If the level of the data signal becomes under the threshold, the controller determines that the filmstrip has a coloring defect. Further, if there is a dust on the filmstrip, the level of the data signal becomes higher. Because the auxiliary light is diffused by the dust, and a part of the auxiliary light is received by the defect detector.
摘要:
The method for evaluating schlieren in glassy or crystalline optical materials includes irradiating a test sample of the optical material with light and producing a shadow image of the test sample on a projection screen. The shadow image of the test sample is received in an electronic image receiving device, such as a digital camera, and is compared with another shadow image of schlieren obtained with a comparison sample by means of interferometry. Then the optical material of the test sample is evaluated with the help of the comparison results.
摘要:
A laser beam L from a laser 2 is introduced from an introducing surface into a transparent substrate 1 by using mirrors 31 and 32. The laser beam introduced through the transparent substrate 1 repeats a total reflection on the surfaces (main surfaces and end surfaces) of the transparent substrate 1 and enters a state in which the laser beam is almost confined in the substrate 1. When an ununiform portion such as a scratch exists on the surface of the transparent substrate 1, however, total reflecting conditions are not satisfied and the light leaks out of the ununiform portion. The leaked light is formed as an image on a CCD 6 by a lens system 7 and an image process is executed by an image processing apparatus 12. In a detected image, the ununiform portion in which the scratch or the like exists is brightly seen in a linear or a dot form in a black background, so that the ununiform portion such as a very fine scratch can be detected.
摘要:
An inspection system for viewing substrate or coated substrate features, wherein a directed light source is projected through a coated substrate onto a viewing surface such that features or irregularities in the substrate or in the coating of the coated substrate are displayed. The inspection system includes a projection system including a light source positioned adjacent the second major surface of the optically transmissive substrate, and a viewing screen positioned adjacent the first major surface of the substrate. The substrate is positioned in optical alignment along an optical path between the light source and the viewing screen such that irregularities in the coated top surface of the substrate can be visually observed on the viewing screen by a user. In one aspect the substrate is coated. Optionally, the directed light source is a laser scanner assembly.
摘要:
Inspection of an optical object for the existence therein of inhomogeneities, comprises providing a diverging beam of inspection radiation and directing the beam on the optical object so that each point thereof is illuminated at a single angle; projecting the beam through the optical object on a projection screen and obtaining thereby a shadow pattern thereof, the optical inhomogeneities being distinguishable in the shadow pattern owing to the difference in the brightness of the areas corresponding thereto over the background brightness of the pattern; imaging the shadow pattern via the optical object in such a manner that the rays forming the image pass through each point of the optical object at an angle corresponding to the angle at which the point is illuminated; and detecting and analyzing the image of the shadow pattern.
摘要:
An optical member inspection apparatus is disclosed. A light shielding plate functions to cast a shadow region so that a line sensor receives an image producing a particular defined image data output, generally speaking a dark image representing an absence of light from an illuminator. When an inspection target optical member is inserted in the light path to intersect that shadow region, the line sensor produces the same image data in the event that there is no defect in the optical member. However, a defect in the optical member will enable light from outside that shadow region to be diffused to impinge on the line sensor thereby producing a change in the image data output. Evaluation of the change in the image data output can provide an indication of the degree of defectiveness.
摘要:
For evaluating the optical quality of a glass product utilizing a projection technique, a camera and a computer, the image observed is compared with a reference image reconstructed by means of a convolution window which is displaced over the entire projected image. The illumination at the boundaries is reconstructed by an extrapolation by two-dimensional linear regression.