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公开(公告)号：US1375837A
公开(公告)日：1921-04-26
申请号：US11949416
申请日：1916-09-11
Applicant: EDWIN FOSTER CHARLES
Inventor： EDWIN FOSTER CHARLES
IPC: G01R1/10
CPC classification number: G01R1/10
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公开(公告)号：US12210039B2
公开(公告)日：2025-01-28
申请号：US17721294
申请日：2022-04-14
Applicant: Tektronix, Inc.
Inventor： Joshua J. O'Brien , Josiah A. Bartlett
Abstract: A measurement probe for producing a test signal for a measurement instrument includes a probe head structured to be connected to at least a first testing point and a second testing point of a Device Under Test (DUT), a current detector in the measurement probe structured to determine a current flowing between the first testing point and the second testing point of the DUT, a first selectable signal path that causes a voltage signal from the first testing point or a voltage signal from the second testing point to be routed to the measurement instrument as a selected voltage test signal, and a second selectable signal path that causes a current signal from an output of the current detector to be routed to the measurement instrument as a selected current test signal. Methods of testing a DUT using the measurement probe are also described, as well as a system for measuring signals from a DUT using the measurement probe.
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公开(公告)号：US20160223584A1
公开(公告)日：2016-08-04
申请号：US15098037
申请日：2016-04-13
Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Inventor： Mill-Jer WANG , Kuo-Chuan LIU , Ching-Nen PENG , Hung-Chih LIN , Hao CHEN
CPC classification number: G01R31/2893 , G01R1/0483 , G01R1/06722 , G01R31/2867 , G01R31/2875 , G01R31/318513
Abstract: A testing holder for a chip unit, a multi site holding frame for plural chip units and a method for testing a die thereof are provided. The proposed multi site holding frame for testing plural chip units simultaneously includes a first holder frame having a plurality of testing holders. Each of the plurality of testing holders includes a holder body containing a specific one of the plural chip units, and a pressure releasing device formed on the holder body to release an insertion pressure when the specific one of the plural chip units is inserted in the holder body.
Abstract translation: 提供了用于芯片单元的测试保持器，用于多个芯片单元的多站点保持框架和用于测试其芯片的方法。 所提出的用于同时测试多个芯片单元的多站点保持框架包括具有多个测试保持器的第一保持架。 多个测试夹具中的每一个包括一个包含多个芯片单元中的特定一个的保持器本体，以及形成在保持器主体上以当多个芯片单元中的特定一个插入保持器中时释放插入压力的压力释放装置 身体。
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24.发明授权Apparatus for measuring an electrical quantity with an adjustable zero position and double pivot arrangement 失效用于测量具有可调零位置和双重枢轴布置的电量的装置
公开(公告)号：US4956601A
公开(公告)日：1990-09-11
申请号：US361934
申请日：1989-06-05
Applicant: Jacques Palencher , Gabriel Jaillant
Inventor： Jacques Palencher , Gabriel Jaillant
CPC classification number: G01R1/10
Abstract: Apparatus for measuring an electrical quantity comprises a fixed body and a movable device having a pivot shaft fixed to an indicator needle which moves in front of a graduated scale. The movable device is pivotably mounted in the fixed body by pivot pins and corresponding bearings. The pivot pins are provided at the ends of the shaft while the bearings face the pins on the fixed body. The movable device is further supported relative to the fixed body by knives and corresponding bearings which receive edges of the knives. The knives are fixed to the movable device and the bearings are provided near the ends of the shaft. The edges of the knives and the pivot pins together with the corresponding bearings are aligned with each other.
Abstract translation: 用于测量电量的装置包括固定体和可移动装置，其具有固定在指示针上的枢轴，该指针针在刻度尺前移动。 可移动装置通过枢轴销和对应的轴承可枢转地安装在固定体中。 枢轴销设置在轴的端部，而轴承面对固定体上的销钉。 可移动装置通过接收刀的边缘的刀和对应的轴承相对于固定体进一步被支撑。 刀被固定到可移动装置，并且轴承设置在轴的端部附近。 刀和枢轴销的边缘与相应的轴承一起对准。
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公开(公告)号：US3907556A
公开(公告)日：1975-09-23
申请号：US33100773
申请日：1973-02-09
Applicant: HAAS CARL
Inventor： REIFF KARL H
CPC classification number: C22C5/04
Abstract: High quality factor, low torsion modulus alloys especially useful as tension bands for measuring instruments are composed essentially of platinum or palladium admixed with at least one element of Groups III, IV, V and VI of the Periodic Table excluding boron, carbon, nitrogen and oxygen.
Abstract translation: 特别适用于测量仪器的张力带的高品质因子，低扭转模量合金基本上由与元素周期表第III，IV，V和VI族至少一种元素混合的铂或钯组成，不包括硼，碳，氮和氧 。
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Patent Agency Ranking26.发明授权Automatic working liquid sampler for providing liquid samples for spectrographic wear analysis 失效用于提供液体样品的自动工作液体取样器进行光谱磨损分析
公开(公告)号：US3730001A
公开(公告)日：1973-05-01
申请号：US3730001D
申请日：1972-02-08
Applicant: GOODWIN R
Inventor： GOODWIN R
Abstract: A system which takes a sample of a working liquid in a machine for subsequent study, such as by spectrographic analysis. The sample is taken after a predetermined amount of machine usage has accumulated. The system comprises accumulating means for recording machine usage and providing a control output which activates a sampling means to take a sample of the working liquid. Delay means are preferably incorporated to assure that the sample is representative of the overall condition within the machine of the working liquid being so sampled.
Abstract translation: 将机器中的工作液样品作为后续研究的系统，例如通过光谱分析。 在累积了预定量的机器使用量之后取样。 该系统包括用于记录机器使用的累积装置，并提供一个控制输出，该控制输出激活采样装置以取样工作液体。 优选地结合延迟装置以确保样品代表正在如此采样的工作液体的机器内的总体状况。
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公开(公告)号：US3559061A
公开(公告)日：1971-01-26
申请号：US3559061D
申请日：1968-03-18
Applicant: MOTOROLA INC
Inventor： CAWTHORNE ARTHUR DAVID
Abstract: A METER MOVEMENT SUPPLIES A VISCUAL INDICATION ON A METER FACE. A SET POINT UNIT INCLUDING A SLIDE WIRE IS ADJUSTABLE FROM IN FRONT OF THE METER FACE AND HAS INDICATOR IN FRONT OF THE METER FACE FOR INDICATING THE SET POINT SETTING. THE SLIDE WIRE HAS AN IMPEDANCE DISTRIBUTION CONLINEAR WITH THE GRADUATIONS ON THE METER FACE. THE METER
HOUSING IS IN TWO PORTIONS, ONE PORTION SUPPORTING THE METER MOVEMENT AND THE OTHER SET POINT ASSEMBLY.-
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30.发明授权Shock-absorbing bearing for movable elements of small mechanisms, notably of measuring instrument 失效减震轴承用于可移动元件的小型机构，特别是测量仪器
公开(公告)号：US3005667A
公开(公告)日：1961-10-24
申请号：US82576959
申请日：1959-07-08
Applicant: PARECHOC SA
Inventor： EDOUARD LORETAN
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