Abstract:
In one set of embodiments, a circuit may be implemented to deliver accurately ratioed currents to a remotely located semiconductor device that has a substantially non-linear input-output characteristic that varies with temperature and is subject to effects of electromagnetic interference (EMI). The circuit may be configured to use common mode rejection by establishing an identical impedance at each of the two terminals of the remotely located semiconductor device, in lieu of coupling shunting capacitor(s) across the terminals, in order to reject EMI signals while performing temperature measurements using the remotely located semiconductor device. This may facilitate maintaining fast sampling times when performing temperature measurements, while providing a more effective method for handling EMI induced currents that may lead to temperature measurement errors, thereby eliminating those errors.
Abstract:
A communication system, clock recovery circuit, and method are provided for allowing data to be transmitted across a communication system and between clock recovery circuits absent a clock master specifically designed for one node of the communication system. Absent a clock master, the communication system is permitted to enter into an all slave mode, with periodic unlock conditions possibly rotating about the communication system ring topology. However, the unlock condition can be readily detected and if the received data bitstream formed into a recovered clock exceeds a threshold above or is less than a threshold below a reference clock generated during instances of unlock, then the clock recovery circuit will fix the synchronizing clock to the reference clock, and cause the bitstream to resynchronize to the reference clock before the reference clock is again disabled to allow the communication system to re-enter the all slave and rotating unlock condition. Periodic application of a reference clock interspersed with periodic application of a clock having transitions equal to the incoming bitstream proves advantageous in avoiding a design where a dedicated master must be used within a specified communication system node.
Abstract:
System and method for switching logic in a Universal Serial Bus hub. The USB hub may include upstream logic and downstream logic for sending and receiving information from a host controller and a USB device respectively. The USB hub may include a plurality of ports operable to couple to a plurality of devices, including a first port coupled to the upstream logic and a second port coupled to the downstream logic. The USB hub may also include switching logic operable to switch the upstream and the downstream logic with respect to the first port and the second port respectively. The switching logic may switch the upstream and downstream logic by decoupling the first port from the upstream logic, decoupling the second port from the downstream logic, and coupling the second port to the upstream logic. Additionally, the first port may be coupled to the downstream logic.
Abstract:
In one set of embodiments, trimming of a reference, which may be a bandgap reference and which is configured on an integrated circuit, may be controlled by an algorithm executed by logic circuitry also configured on the integrated circuit. The bandgap reference may be configured to generate a reference voltage provided to an analog to digital converter (ADC) comprised in a temperature sensor that may also be configured on the integrated circuit. The logic circuitry may be configured to execute one or more of a variety of test algorithms, for example a Successive Approximation Method or remainder processing, that are operable to adjust values of reference trim bits used in trimming the bandgap reference. A tester system configured to perform testing of the integrated circuit may initiate execution of the test algorithm, thereby initiating the trimming process, and may wait for the test algorithm to complete within a previously defined amount of time, or may poll the logic circuitry to determine when the trimming process is complete.
Abstract:
A temperature sensor circuit and system providing accurate digital temperature readings using a local or remote temperature diode. In one set of embodiments a change in diode junction voltage (ΔVBE) proportional to the temperature of the diode is captured and provided to an analog to digital converter (ADC), which may perform required signal conditioning functions on ΔVBE, and provide a digital output corresponding to the temperature of the diode. DC components of errors in the measured temperature that may result from EMI noise modulating the junction voltage (VBE) may be minimized through the use of a front-end sample-and-hold circuit coupled between the diode and the ADC, in combination with a shunt capacitor coupled across the diode junction. The sample-and-hold-circuit may sample VBE at a frequency that provides sufficient settling time for each VBE sample, and provide corresponding stable ΔVBE samples to the ADC at the ADC operating frequency. The ADC may therefore be operated at its preferred sampling frequency rate without incurring reading errors while still averaging out AC components of additional errors induced by sources other than EMI.
Abstract:
A control signal value, such as a duty cycle value for a Pulse Width Modulated (PWM) generator output, for controlling and/or powering a fan may be calculated using an autofan function configured with dynamic hysteresis control (DHC). As part of the DHC, the PWM duty cycle value may be determined by applying a hysteresis component at every point of the autofan function relating the PWM duty cycle to temperature. The PWM duty cycle value may be computed based on two functions, each function relating the PWM duty cycle to temperature, the first function applied when the temperature is increasing, and the second function applied when the temperature is decreasing. When a newly computed PWM duty cycle value falls within a range of duty cycle values defined by the hysteresis value, the current duty cycle of the PWM generator output may remain unchanged, minimizing noise resulting from the fan changing speed.
Abstract:
A method for implementing a counter in memory, e.g., non-volatile memory such as flash memory. A first number of first binary values indicating a first portion of a current number of the counter in a binary field may be stored in a portion of memory. Storing the first number may also include increasing the number of first binary values in the binary field. Additionally, a second number indicating a second portion of the current number of the counter may be stored in another portion of memory. The second number may specify the number of times the first binary values has comprised the entirety of the binary field. Thus, the first number and second number may specify the current number of the counter. Storing the first and second number may be performed a plurality of times to implement a counting function of the counter.
Abstract:
In one embodiment, a monitoring device (e.g., a slave device) may be configured to perform a plurality of monitoring functions. For example, the monitoring device may comprise a watchdog timer configured to monitor communications between the processing unit (e.g., a host processor) and the monitoring device. The watchdog timer may cause the monitoring device to enter a failsafe mode of operation if the processing unit fails to communicate with the monitoring device within a predetermined period of time. Additionally, the monitoring device may be configured to perform thermal management functions via one or more temperature sensors. The monitoring device may enter the failsafe mode of operation if a sensed temperature exceeds a predetermined temperature limit. Furthermore, the monitoring device may also comprise a status unit that is operable to provide the processing unit an indication of a state of the monitoring device.
Abstract:
A method for implementing a counter in memory, e.g., non-volatile memory such as flash memory. A first number of first binary values indicating a first portion of a current number of the counter in a binary field may be stored in a portion of memory. Storing the first number may also include increasing the number of first binary values in the binary field. Additionally, a second number indicating a second portion of the current number of the counter may be stored in another portion of memory. The second number may specify the number of times the first binary values has comprised the entirety of the binary field. Thus, the first number and second number may specify the current number of the counter. Storing the first and second number may be performed a plurality of times to implement a counting function of the counter.
Abstract:
In one set of embodiments, a circuit may be implemented to deliver accurately ratioed currents to a remotely located semiconductor device that has a substantially non-linear input-output characteristic that varies with temperature and is subject to effects of electromagnetic interference (EMI). The circuit may be configured to use common mode rejection by establishing an identical impedance at each of the two terminals of the remotely located semiconductor device, in lieu of coupling shunting capacitor(s) across the terminals, in order to reject EMI signals while performing temperature measurements using the remotely located semiconductor device. This may facilitate maintaining fast sampling times when performing temperature measurements, while providing a more effective method for handling EMI induced currents that may lead to temperature measurement errors, thereby eliminating those errors.