Abstract:
An image forming apparatus is capable of scanning a document having a larger size than the flat. For example, it is possible to scan an A3 document using a scanning sensor having a slight larger size than an A4 document, and also it is possible to obtain a high quality of the A3 document image.
Abstract:
An A4-size scanner capable of scanning an A3 document. The A4-size scanner includes a scanning part, a transferring roller member that is disposed at an upper side of the flat glass to be orthogonal to a length direction of the automatic document feeding unit and the scanning sensor so that the document having a double size of a scanning capacity of the scanning sensor and introduced onto the flat glass in the length direction of the automatic document feeding unit and the scanning sensor is transferred to a transferring roller, and a transferring roller member driving motor that is connected with the transferring roller which dividedly scans the document having a larger size than the scanning capacity of the scanning sensor; and an image processing part which performs an image processing for composing two images which are dividedly scanned through the scanning part.
Abstract:
Provided are display apparatuses and methods of operating the same. In a display apparatus, a display image may be continuously held for longer than about 10 msec after the power of the display panel is turned off. The display apparatus may indicate a liquid crystal display (LCD) apparatus including an oxide thin film transistor (TFT). Off leakage current of the oxide TFT may be less than about 10−14 A.
Abstract:
A method for forming a semiconductor device includes forming a gate dielectric layer over a substrate; forming a first conductive layer over the substrate; forming a dielectric layer over the first conductive layer; forming a second conductive layer over the dielectric layer; forming a sacrificial layer over the second conductive layer; patterning the sacrificial and other layers to form a plurality of gate electrode patterns; forming a buried oxide layer over and between the gate electrode patterns; and removing the sacrificial layer to form a plurality of trenches surrounded by the buried oxide layer. A metal layer is formed within the trench to form a plurality of metal gate structures, the metal layer contacting the second conductive layer that is exposed by the removal of the sacrificial layer.
Abstract:
A method of forming a gate of a semiconductor device comprising providing a semiconductor substrate over which a gate insulating layer, a first conductive layer, a dielectric layer, and a second conductive layer are sequentially formed, the semiconductor substrate defining gate line regions; removing he second conductive layer between gate line regions; removing the dielectric layer so that a top surface of the first conductive layer between the gate line regions is exposed; performing a first etch process in order to lower a height of the first conductive layer between the gate line region; removing he dielectric layer between the gate line regions; and, performing a second etch process in order to remove the first conductive layer between the gate line regions.
Abstract:
A p-type semiconductor carbon nanotube and a method of manufacturing the same are provided. The p-type semiconductor carbon nanotube includes a carbon nanotube; and a halogen element that is attached to an inner wall of the carbon nanotube and accepts electrons from the carbon nanotube to achieve p-type doping of the carbon nanotube. The p-type semiconductor carbon nanotube is stable at high temperatures and can maintain intrinsic good electrical conductivity of the carbon nanotube. The p-type semiconductor carbon nanotube can be relatively easily obtained using a conventional method of manufacturing a carbon nanotube, thereby significantly broadening the range of application of the carbon nanotube to electronic devices.
Abstract:
The present invention relates to a method of fabricating a semiconductor device. According to the method, a first insulating layer having a contact hole formed therein is formed over a semiconductor substrate. A second insulating layer is gap filled within the contact hole. A third insulating layer having a trench formed therein is formed over the semiconductor substrate including the contact hole. The second insulating layer gap filled within the contact hole is removed. A contact plug and a bit line are formed within the contact hole and the trench.
Abstract:
A liquid crystal display device having a digitizer and a method for fabricating the same are disclosed in the present invention. The liquid crystal display device includes a liquid crystal display device module, a printed circuit board located in close proximity to a support main of the liquid crystal display device module, and a fixing device to insert a digitizer.
Abstract:
Provided is a method of operating a nonvolatile memory device to perform an erase operation. The method includes applying a composite pulse including a direct current (DC) pulse and a DC perturbation pulse to the nonvolatile memory device to perform the erase operation.
Abstract:
A nanowire device having a structure allowing for formation of p-type and n-type doped portions in a nanowire, and a method of fabricating the same. The nanowire device includes a substrate, a first electrode layer formed on the substrate, a second electrode layer facing the first electrode layer, a plurality of nanowires interposed at a predetermined interval between the first electrode layer and the second electrode layer to connect the same, and an electrolyte containing an electrolytic salt filling spaces between the nanowires.