Plasma Vapor Deposition
    31.
    发明申请
    Plasma Vapor Deposition 有权
    等离子体气相沉积

    公开(公告)号:US20090065349A1

    公开(公告)日:2009-03-12

    申请号:US11851269

    申请日:2007-09-06

    IPC分类号: C23C14/00

    摘要: A plasma vapor deposition system is described for forming a feature on a semiconductor wafer. The plasma vapor deposition comprises a primary target electrode and a plurality of secondary target electrodes. The deposition is performed by sputtering atoms off the primary and secondary target electrodes.

    摘要翻译: 描述了用于在半导体晶片上形成特征的等离子体气相沉积系统。 等离子体气相沉积包括主要目标电极和多个次要目标电极。 通过从初级和次级目标电极溅射原子来进行沉积。

    Method and apparatus for sputtering
    32.
    发明申请
    Method and apparatus for sputtering 审中-公开
    溅射的方法和装置

    公开(公告)号:US20080173538A1

    公开(公告)日:2008-07-24

    申请号:US11655488

    申请日:2007-01-19

    IPC分类号: C23C14/34

    摘要: A sputtering apparatus includes a target electrode and a bias source electrically coupled to the target electrode. A wafer chuck is spaced from the target electrode. The wafer chuck is partitioned into a plurality of zones, each zone being coupled to receive an AC signal having an amplitude that can vary by zone. At least one RF coil is positioned adjacent a space between the target electrode and the wafer chuck.

    摘要翻译: 溅射装置包括目标电极和与靶电极电耦合的偏压源。 晶片卡盘与目标电极间隔开。 晶片卡盘被划分成多个区域,每个区域被耦合以接收具有可以随区域变化的幅度的AC信号。 至少一个RF线圈被定位成邻近目标电极和晶片卡盘之间的空间。

    Methods of forming silicide
    33.
    发明授权
    Methods of forming silicide 有权
    形成硅化物的方法

    公开(公告)号:US07399702B2

    公开(公告)日:2008-07-15

    申请号:US11048236

    申请日:2005-02-01

    申请人: Chan Lim Bum Ki Moon

    发明人: Chan Lim Bum Ki Moon

    IPC分类号: H01L21/44

    摘要: Methods of fully siliciding semiconductive materials of semiconductor devices are disclosed. A preferred embodiment comprises depositing an alloy comprised of a first metal and a second metal over a semiconductive material. The device is heated, causing atoms of the semiconductive material to move towards and bond to the atoms of the second metal, leaving vacancies in the semiconductive material, and causing atoms of the first metal to move into the vacancies in the semiconductive material.

    摘要翻译: 公开了半导体器件半导体材料完全硅化的方法。 优选的实施方案包括在半导体材料上沉积由第一金属和第二金属组成的合金。 该器件被加热,导致半导体材料的原子向第二金属的原子移动并且结合到第二金属的原子上,在半导体材料中留下空位,并使第一金属的原子移动到半导体材料中的空位中。