Monitor-detector assembly on silicon wafer board
    31.
    发明授权
    Monitor-detector assembly on silicon wafer board 失效
    硅晶片板上的显示器检测器组件

    公开(公告)号:US5694048A

    公开(公告)日:1997-12-02

    申请号:US414893

    申请日:1995-03-31

    CPC classification number: G01R31/2884

    Abstract: An optical subassembly for monitoring the emission of a semi-conductor laser is disclosed. The subassembly is diced from a wafer having mounted thereon the devices to be tested as well as the testing optical devices. The devices of the wafer are burned-in and those sections of the wafer having lasers that pass the burn-in testing are diced and form the subassemblies of the present invention.

    Abstract translation: 公开了一种用于监测半导体激光器的发射的光学子组件。 子组件从其上安装有要测试的器件的晶片以及测试光学器件切片。 将晶片的器件烧入,并且通过老化测试的具有激光器的晶片的那些部分被切割并形成本发明的子组件。

    Optoelectronic integration of holograms using (110) oriented silicon on
(100) oriented silicon waferboard
    32.
    发明授权
    Optoelectronic integration of holograms using (110) oriented silicon on (100) oriented silicon waferboard 失效
    (100)定向硅晶片上的(110)取向硅的全息图的光电集成

    公开(公告)号:US5420953A

    公开(公告)日:1995-05-30

    申请号:US198028

    申请日:1994-02-17

    CPC classification number: G02B6/4204 G02B6/4249 G02B6/423

    Abstract: The disclosure describes an optical interconnect which utilizes a silicon waferboard (1) with grooves (3,4) etched to expose preferred crystallographic planes to effect alignment of focusing elements (5) between optical waveguides (6) and optoelectronic devices (2). The focusing elements (5) are made of silicon wafers and are etched to expose crystal planes which compliment crystal planes of cavities or grooves which are etched in the waferboard. The focusing elements may have holograms (7) formed thereon for efficient focusing to the optical waveguide (6).

    Abstract translation: 本公开描述了一种光学互连件,其利用硅片板(1),其具有蚀刻以暴露优选结晶平面的凹槽(3,4)以实现光波导(6)和光电子器件(2)之间的聚焦元件(5)的对准。 聚焦元件(5)由硅晶片制成,并被蚀刻以暴露掺杂在晶片板中蚀刻的空腔或凹槽的晶面的晶面。 聚焦元件可以具有形成在其上的全息图(7),以有效地聚焦到光波导(6)。

    Tilted notched for passive optical alignment
    38.
    发明授权
    Tilted notched for passive optical alignment 失效
    倾斜切口用于无源光学对准

    公开(公告)号:US5966486A

    公开(公告)日:1999-10-12

    申请号:US918897

    申请日:1997-08-27

    CPC classification number: G02B6/4224 G02B6/423 G02B6/4249

    Abstract: A technique for passive alignment of an opto-electronic device, such as laser, by alignment fiducials to a silicon wafer board utilizes a tilted notch in the opto-electronic device. This system overcomes limitations using standard etched notches for previous passive alignment systems. Specifically, the tilted notch presents a range of offset distances between the edge of the notch and the active light-emitting spot of the laser. Depending on the location at which the wafer is diced or cleaved, the distance from the notch on the laser to the laser stripe can be adjusted after the laser wafer is fabricated.

    Abstract translation: 通过对准基准将光电器件(例如激光器)无源对准到硅晶片板的技术利用光电器件中的倾斜凹口。 该系统克服了以前的被动对准系统使用标准蚀刻凹口的局限性。 具体地说,倾斜凹口在凹口的边缘和激光器的主动发光点之间呈现偏移距离的范围。 根据晶片切割或切割的位置,可以在制造激光晶片之后调整从激光器上的凹口到激光条纹的距离。

    Controlled impedance lines connected to optoelectronic devices
    40.
    发明授权
    Controlled impedance lines connected to optoelectronic devices 失效
    连接到光电子器件的受控阻抗线

    公开(公告)号:US5519363A

    公开(公告)日:1996-05-21

    申请号:US251061

    申请日:1994-05-31

    CPC classification number: H01P3/085 H01P3/081

    Abstract: A dielectric substrate of a material such as silicon is used to provide controlled impedance waveguides for coupling an optoelectronic device to an electronic device. The impedance is controlled by varying the thickness of the dielectric between the signal lines and the ground plane. In the preferred embodiment, the crystallographic structure of the silicon is employed to achieve great precision of the dielectric thickness.

    Abstract translation: 使用诸如硅的材料的介质衬底来提供用于将光电子器件耦合到电子器件的受控阻抗波导。 通过改变信号线和接地平面之间的电介质的厚度来控制阻抗。 在优选实施例中,硅的晶体结构用于实现电介质厚度的高精度。

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