Abstract:
A high frequency SAW device and the substrate thereof are disclosed. The disclosed high frequency SAW device does not need to use the conventional and expensive sapphire substrate as its substrate. Besides, the disclosed substrate for a high-frequency SAW device can replace the conventional sapphire substrate in the use of the substrate for a high frequency SAW device. The disclosed high frequency SAW device comprises: a substrate; a first buffering layer forming on the surface of the substrate; a second buffering layer forming on the surface of the first buffering layer; a piezoelectric layer forming on the surface of the second buffering layer; an input transformation unit; and an output transformation unit, wherein the input transformation unit and the output transformation unit are formed in pairs on the surface of or beneath the piezoelectric layer.
Abstract:
A method for adjusting a serial data signal having multiple sets of bits includes the following steps. First, one set of bits in the serial data signal is over-sampled to generate a first set of over-sampled bits. Next, every adjacent two bits of the first set of over-sampled bits are compared to generate one set of edge bits. Then, a delay operation is determined according to the set of edge bits. Afterwards, a displacement operation is executed on next sets of bits in the serial data signal according to the delay operation.
Abstract:
A function reference method of a development tool and a system thereof are disclosed. According to the function reference method, new function database and classified data are described with a text file or a database format file. After the file is read by an add-in module of the development tool, the desired function or object can be loaded into the editing workspace of the development tool through a hierarchical menu or by detecting an input string. Therefore, users can quickly searching and loading new functions.
Abstract:
The present invention provides a digital circuit comprising an inverter gate delay line and a delay adjustment circuit. The inverter gate delay line comprises a series of a plurality of inverter gates that receives a serial data. The delay adjustment circuit comprises a replica inverter gate delay line comprising a series of a plurality of inverter gates and being configured to receive a first signal, a plurality of flip flops, each one of the plurality of flip flops electrically connected to the corresponding inverter gates of the replica inverter gate delay line, wherein the plurality of flip flops store binary information and the first flip flop of the plurality of flip flops receives a second signal which has a time delay with respect to the first signal, an encoder being electrically connected to the plurality of flip flops and determining the numbers of the needed inverter gates of the inverter gate delay line based on the binary information stored in the plurality of flip flops, and a delay selector being electrically connected to the encoder and the plurality of inverter gates of the inverter gate delay line and causing the serial data delayed by the inverter gates of the inverter gate delay line, wherein the numbers of the inverter gates of the inverter gate delay line are determined by an output of the encoder.
Abstract:
A multi-channel receiver, digital edge tuning circuit and a method for operating the same is disclosed. The digital edge tuning circuit for tuning phases of an input signal and a clock signal, comprises a delay-tuning circuit for receiving the input signal and delaying the input signal to generate a fine-tuned signal; a delay set comprising a plurality of delays connected serially one by one, the input of the delay set coupled to the fine-tune circuit, for receiving the fine-tuned signal; a plurality of sample/hold circuits, each of the sample/hold circuits coupled to a corresponding output of one of the delays and the fine-tune circuit, for sampling and holding the corresponding output; and a dynamic edge tuning circuit, coupled to the sample/hold circuits, for controlling a common delay time delayed by the delay-tuning circuit according to which one of the sample/hold circuits samples a data edge of the input signal.