摘要:
According to an aspect of the present invention, there is provided a nonvolatile semiconductor memory device including: a memory cell array including: memory cell blocks each having series-connected memory cells; wordlines; and a bitline pair connected to the memory cell blocks, one functioning as a readout bitline, the other one functioning as a reference bitline; an amplification circuit connected to the bitline pair to amplify a signal difference therebetween; and a reference voltage generation circuit including: a dummy memory cell block that has the same configuration as the memory cell block, that has one terminal connected to a first dummy plate line and that has the other terminal connected to the reference bitline; and a paraelectric capacitor that has one terminal connected to a second dummy plate line and that has the other terminal connected to the reference bitline.
摘要:
An amplifying circuit receives an output from a comparator. The output is provided to each gate of first, second and third transistors. First and second resistors are connected in series. The first and second resistors and a first diode are connected to a drain of the first transistor. Second diodes are connected in parallel. The second diodes are connected to one end of a third resistor. The other end of the third resistor is connected to a drain of the second transistor. Fourth and fifth resistors are connected in series. One end of the fourth resistor is connected to the drain of the second transistor. The comparator receives first and second feedback voltages respectively obtained from a connection node between the first and second resistors and a connection node between the fourth and fifth resistors. A drain of the third transistor outputs a reference voltage.
摘要:
A voltage detection circuit of the present invention includes an NMOS transistor diode-connected, a gate and a drain thereof being supplied with a power supply voltage, a resistor connected between a source of the NMOS transistor and a ground potential, and a source voltage detection circuit receiving a voltage of the source, wherein an NMOS type transistor is employed as the NMOS transistor, a channel width and a channel length of the NMOS type transistor being set in such a manner that an operating point on a VG-ID curve of the NMOS type transistor may come to a certain point, at the certain point, a drain current of the NMOS type transistor being constant even if the temperature fluctuates.
摘要:
According to an aspect of the present invention, there is provided a power supply circuit including: a detection circuit that is connected to an external power supply voltage and that outputs a first signal indicating whether the external power supply voltage is in a dropped-state in which the external power supply voltage is dropped below a reference voltage; a control circuit that includes: a delay circuit that outputs a second signal acquired by delaying the first signal for a reference time; and a determination circuit that outputs a third signal based on the first signal and the second signal; a generation circuit that generates internal power supply voltage from the external power supply voltage and that supplies the internal power supply voltage; and an interruption circuit that interrupts the internal power supply voltage supplied from the generation circuit based on the third signal.
摘要:
A reference voltage generator circuit comprises a first current path and a second current path. The first current path is formed between an input terminal supplied with a first reference voltage and an output terminal and including a first diode and a first resistor serially connected from the input terminal. The second current path is formed between the input terminal and the output terminal and including a second diode, a second resistor and a third resistor serially connected from the input terminal. A comparator is supplied with a voltage on a node between the first diode and the first resistor and a voltage on a node between the second resistor and the third resistor for comparative amplification. A transistor is connected between the output terminal and a second reference voltage and having a control terminal to receive an output from the first comparator.
摘要:
A supply voltage sensing circuit comprises an internal power supply circuit, which provides a constant output voltage regardless of the supply voltage. A delay circuit generates a delayed signal by delaying a variation in the output voltage. A divider circuit generates a divided voltage by dividing the supply voltage at a certain division ratio. A p-type MOS transistor has a source given the delayed signal and a gate given the divided voltage and turns on when the supply voltage lowers below a certain value. An output circuit provides an output voltage based on a drain voltage on the p-type MOS transistor.
摘要:
A first bit line is connected to a memory cell. A second bit line is connected to a dummy cell having a dummy capacitor, and supplied with an electric potential which is complementary to the electric potential of the first bit line. A sense amplifier compares and amplifies the first and second bit lines. A sense amplifier supply voltage generation circuit supplies the sense amplifier with a sense amplifier supply voltage to be used in the comparison and amplification by the sense amplifier. The sense amplifier supply voltage is supplied to a reference potential generation circuit. When data is read out from the memory cell to the first bit line, the reference potential generation circuit supplies, to the second bit line via the dummy cell, a reference potential which fluctuates with a positive correlation to the fluctuation in sense amplifier supply voltage.
摘要:
A semiconductor memory device includes a memory cell array, a sense amplifier, and a voltage generator. The memory cell array has a plurality of memory cells. Each of the memory cells is written with “0” or “1” as reference data after “0” or “1” as cell data has been read out from the memory cell. The sense amplifier compares and amplifies the reference data and the cell data read from a memory cell. The voltage generator keeps constant rate of change with time of at least one potential supplied for a read operation for the time interval from readout of the cell data is started until completion of readout of the reference data.
摘要:
A semiconductor memory device includes a memory cell array, a sense amplifier, and a voltage generator. The memory cell array has a plurality of memory cells. Each of the memory cells is written with “0” or “1” as reference data after “0” or “1” as cell data has been read out from the memory cell. The sense amplifier compares and amplifies the reference data and the cell data read from a memory cell. The voltage generator keeps constant rate of change with time of at least one potential supplied for a read operation for the time interval from readout of the cell data is started until completion of readout of the reference data.
摘要:
A semiconductor device comprises a memory cell array, bit line, /bit line complementary to the bit line, reference voltage generating circuit and sense amplifier. The bit line is connected to the memory cells and applied with a voltage read from each memory cell of the memory cell array. The /bit line is supplied with a reference voltage. The reference voltage generating circuit generates the reference voltage that has temperature dependence for compensating a change in the voltage, read to the bit line, due to temperature. The reference voltage generating circuit controls the reference voltage such that the reference voltage assumes a midpoint of trails of a signal value distribution indicative of “0” data and a signal value distribution indicative of “1” data. The sense amplifier compares the voltage, read to the bit line, with the reference voltage supplied to the /bit line, and amplifies the difference therebetween.