Spectrophotometer
    44.
    发明授权
    Spectrophotometer 有权
    分光光度计

    公开(公告)号:US08767204B2

    公开(公告)日:2014-07-01

    申请号:US13493736

    申请日:2012-06-11

    CPC classification number: G01J3/08 G01J3/027 G01J3/42

    Abstract: A spectrophotometer 10 includes built-in detector 24 and external detector 32. When a mountable/removable optical path switcher 23a is installed in a specimen chamber 23, measurement based on detection signals from built-in detector 24 is replaced by measurement based on detection signals from external detector 32. The spectrophotometer further includes a measurement data threshold-value storage unit 51 that stores threshold value T for measurement data from built-in detector 24 or external detector 32, and a light-receiving detector recognition unit 52 that recognizes which detector is able to receive the measuring light beam based on the results of a comparison between threshold value T and measurement data from built-in detector 24 or external detector 32 while the measuring light beam is being introduced into specimen chamber 23.

    Abstract translation: 分光光度计10包括内置检测器24和外部检测器32.当将可安装/可拆卸光路切换器23a安装在样本室23中时,基于来自内置检测器24的检测信号的测量被基于检测信号 分光光度计还包括测量数据阈值存储单元51,其存储来自内置检测器24或外部检测器32的测量数据的阈值T,以及光接收检测器识别单元52,其识别哪个检测器 能够基于来自内置检测器24或外部检测器32的阈值T与测量数据之间的比较结果同时测量光束被引入到样本室23中而接收测量光束。

    TEMPERATURE MEASURING DEVICE OF A POWER SEMICONDUCTOR APPARATUS
    45.
    发明申请
    TEMPERATURE MEASURING DEVICE OF A POWER SEMICONDUCTOR APPARATUS 有权
    功率半导体器件的温度测量装置

    公开(公告)号:US20130060499A1

    公开(公告)日:2013-03-07

    申请号:US13607017

    申请日:2012-09-07

    Abstract: A temperature measuring device of a power semiconductor apparatus that accurately detects chip temperature even where a gradient of the measured characteristic line segment is different from a designed gradient, including a chip temperature detecting circuit that includes an A/D converter delivering a measurement value of a digital converted forward voltage across a temperature detecting diode and an operational processing unit for calibration and chip temperature calculation. In calibration processing, different known reference voltages are applied by a reference connected in place of the diode and a gradient of the line segment connecting the measurement values is calculated. The gradient is stored in a memory with an offset correction value that is one of the measurement values. A chip temperature is calculated based on a forward voltage across the diode calculated based on the measurement value and the stored values of the gradient and the offset correction value.

    Abstract translation: 功率半导体装置的温度测量装置,即使在测得的特性线段的梯度与设计梯度不同的情况下也能精确地检测芯片温度,包括芯片温度检测电路,该芯片温度检测电路包括A / D转换器,该A / D转换器将测量值 温度检测二极管上的数字转换正激电压和用于校准和芯片温度计算的运算处理单元。 在校准处理中,通过连接代替二极管的基准来施加不同的已知参考电压,并且计算连接测量值的线段的梯度。 梯度存储在具有作为测量值之一的偏移校正值的存储器中。 基于基于测量值计算的二极管上的正向电压和斜率的存储值以及偏移校正值来计算芯片温度。

    Spectrophotometer
    46.
    发明申请
    Spectrophotometer 有权
    分光光度计

    公开(公告)号:US20130003060A1

    公开(公告)日:2013-01-03

    申请号:US13493736

    申请日:2012-06-11

    CPC classification number: G01J3/08 G01J3/027 G01J3/42

    Abstract: A spectrophotometer 10 includes built-in detector 24 and external detector 32. When a mountable/removable optical path switcher 23a is installed in a specimen chamber 23, measurement based on detection signals from built-in detector 24 is replaced by measurement based on detection signals from external detector 32. The spectrophotometer further includes a measurement data threshold-value storage unit 51 that stores threshold value T for measurement data from built-in detector 24 or external detector 32, and a light-receiving detector recognition unit 52 that recognizes which detector is able to receive the measuring light beam based on the results of a comparison between threshold value T and measurement data from built-in detector 24 or external detector 32 while the measuring light beam is being introduced into specimen chamber 23.

    Abstract translation: 分光光度计10包括内置检测器24和外部检测器32.当将可安装/可拆卸光路切换器23a安装在样本室23中时,基于来自内置检测器24的检测信号的测量被基于检测信号 分光光度计还包括测量数据阈值存储单元51,其存储来自内置检测器24或外部检测器32的测量数据的阈值T,以及光接收检测器识别单元52,其识别哪个检测器 能够基于来自内置检测器24或外部检测器32的阈值T与测量数据之间的比较结果同时测量光束被引入到样本室23中而接收测量光束。

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