摘要:
Computing accurately and effectively the impact of clock skew on statistical slack in the presence of statistically variable timing quantities that accounts for both common path credit in the common portion of the clock tree, and RSS credit in the non-common of the clock tree. The clock skew is measured on a per launch and capture path-pair basis as a function of on the post-CPPR path-specific slack (including RSS credit), total mean value of latch-to-latch delay, RSS value of random latch-to-latch delay, test guard time and test adjust. The method includes: performing an initial block-based SSTA including CPPR analysis; selecting at least one launch and capture path-pair for skew analysis; for the at least one path pair, recording post CPPR slack, total mean value of latch-to-latch delay, RSS value of latch to latch delay, test guard time and test adjust; and quantifying the impact of clock skew on statistical slack thereof.
摘要:
Systems and methods for statistical clock cycle computation and closing timing of an integrated circuit design to a maximum clock cycle or period. The method includes loading a design and timing model for at least one circuit path of an integrated circuit or a region of the integrated circuit into a computing device. The method further includes performing a statistical static timing analysis (SSTA) of the at least one circuit path using the loaded design and timing model to obtain slack canonical data. The method further includes calculating a maximum circuit clock cycle for the integrated circuit or the specified region of the integrated circuit in linear canonical form based upon the slack canonical data obtained from the SSTA.
摘要:
In embodiments of a statistical static timing analysis (SSTA) method, system and program storage device, the interdependence between the setup time and hold time margins of a circuit block (e.g., a latch, flip-flop, etc., which requires the checking of setup and hold timing constraints) is determined, taking into account possible variations in multiple parameters (e.g., using a variation-aware characterizing technique). A parameterized statistical static timing analysis (SSTA) of a circuit incorporating the circuit block is performed in order to determine, in statistical parameterized form, setup and hold times for the circuit block. Based on the interdependence between the setup and hold time margins, setup and hold time constraints can be determined in statistical parameterized form. Finally, the setup and hold times determined during the SSTA can be checked against the setup and hold time constraints to determine, if the time constraints are violated or not and to what degree.
摘要:
A computer-implemented method that simulates NPskew effects on a combination NFET (Negative Field Effect Transistor)/PFET (Positive Field Effect Transistor) semiconductor device using slew perturbations includes performing a timing test by a computing device, by: (1) evaluating perturb slews in Strong N/Weak P directions on the combination semiconductor device for a timing test result; (2) evaluation perturb slews in Weak N/Strong P directions on the combination semiconductor device for a timing test result; and (3) evaluating unperturbed slews in a balanced condition on the combination semiconductor device for a timing test result. After each test is performed, a determination is made as to which evaluation of the perturbed and unperturbed slews produces a most conservative timing test result for the combination semiconductor device. An NPskew effect adjusted timing test result is finally output based on determining the most conservative timing test result.
摘要:
An approach for covering multiple selective timing corners in a single statistical timing run is described. In one embodiment, a single statistical timing analysis is run on the full parameter space that covers unlimited process parameters/environment conditions. Results from the statistical timing analysis are projected for selected corners. Timing closure is performed on the corners having the worst slacks.
摘要:
A method, system, and integrated circuit including selectively added timing margin. The method, for integrating statistical timing and automatic test pattern generation (ATPG) to selectively add timing margin in an integrated circuit, includes identifying, while a chip is in design, paths that are unable to be robustly tested “at speed” during manufacturing test, running statistical timing to calculate a margin to be applied to the paths, updating design specifications for margin to be applied to the paths, and optimizing chip logic based on updated design specifications.
摘要:
A computer system for partitioning the columns of a matrix A. The computer system includes a processor and a memory unit coupled to the processor. Program code in the memory unit, when executed by the processor, implements the method. Matrix A is provided in a memory device and has n columns and m rows; wherein n is an integer of at least 3; and wherein m is an integer of at least 1. The n columns is partitioned into a closed group of p clusters, p being a positive integer of at least 2 and less than n. The partitioning includes an affinity -based merging of clusters of pairs of clusters of the matrix A based on an affinity between the clusters in each pair of clusters being merged. Each cluster consists of one or more columns of matrix A. The p clusters are stored in a computer-readable storage device.
摘要:
Methods for statistical slew propagation in static statistical timing analysis. The method includes projecting a canonical approximation of an input slew over a timing path to a first corner and using the projected input slew to calculate a delay and an output slew at the first corner. The method further includes perturbing the canonical approximation of the input slew to a different corner, calculating a delay and an output slew at the different corner using the perturbed input slew canonical, and determining a sensitivity of the delay and the output slew to a plurality of parameters, simultaneous with implicit sensitivity calculations to the input slew, with finite difference calculations between the first corner and perturbed data.
摘要:
A method of performing statistical timing analysis of a logic design, including effects of signal coupling, includes performing a deterministic analysis to determine deterministic coupling information for at least one aggressor/victim net pair of the logic design. Additionally, the method includes performing a statistical timing analysis in which the deterministic coupling information for the at least one aggressor/victim net pair is combined with statistical values of the statistical timing analysis to determine a statistical effective capacitance of a victim of the aggressor/victim net pair. Furthermore, the method includes using the statistical effective capacitance to determine timing data used in the statistical timing analysis.
摘要:
There is provided a system and method for statistical timing analysis and optimization of an electrical circuit having two or more digital elements. The system includes at least one parameter input and a statistical static timing analyzer and electrical circuit optimizer. The at least one parameter input is for receiving parameters of the electrical circuit. At least one of the parameters has at least one of a non-Gaussian probability distribution and a non-linear delay effect. The statistical static timing analyzer and electrical circuit optimizer is for calculating at least one of a signal arrival time and a signal required time for the electrical circuit using the at least one parameter and for modifying a component size of the electrical circuit to alter gate timing characteristics of the electrical circuit based upon the at least one of the signal arrival time and the signal required time.