Recording apparatus for video signal
    41.
    发明授权
    Recording apparatus for video signal 失效
    视频信号记录装置

    公开(公告)号:US4677504A

    公开(公告)日:1987-06-30

    申请号:US832673

    申请日:1986-02-25

    摘要: A recording apparatus for a video signal in which first and second heads for recording and reproducing are attached through electrostrictive elements to a rotary drum with an angular spacing of substantially 180.degree. therebetween. When a video signal is recorded, a pilot signal recorded by the first head over a predetermined interval is reproduced by the second head while a pilot signal recorded by the second head and spaced apart by a predetermined number of recording tracks is reproduced by the first head. Reproduced levels of the pilot signals are compared so as to control a drive voltage for the electrostrictive elements and thus to adjust a step difference between the first and second heads in the recording mode.

    摘要翻译: 一种视频信号的记录装置,其中用于记录和再现的第一和第二磁头通过电致伸缩元件附接到旋转磁鼓,其间的角度间隔大致为180°。 当记录视频信号时,第一磁头在预定间隔记录的导频信号由第二磁头再现,而由第二磁头记录并由预定数量的记录磁迹隔开的导频信号由第一磁头再现 。 对导频信号的再现电平进行比较,以便控制电致伸缩元件的驱动电压,从而在记录模式中调节第一和第二磁头之间的阶差。

    Mold for insert molding
    45.
    发明授权
    Mold for insert molding 有权
    模具用于嵌件成型

    公开(公告)号:US08827675B2

    公开(公告)日:2014-09-09

    申请号:US13433425

    申请日:2012-03-29

    IPC分类号: B29C45/14 B29C45/76 A61B5/15

    摘要: A mold assembly includes a product cavity for producing an insert-molded product and a projection-forming cavity for, if an insert of the product is irregularly deformed or disposed in wrong orientation, forming a projection on the insert-molded product. The projection, if present on the product, blocks most of the light emitted from a light-emitting element. A photodetector detects the intensity of the received light and when the detected light intensity is less than a predetermined value due to the presence of the projection, the product is judged to be rejected. Visual inspection or optical sensors judge the product to be rejected if the product has a through-hole closed and to be acceptable if the through-hole of the product is open. This judgment does not require an X-ray inspection device or radiologists.

    摘要翻译: 模具组件包括用于产生嵌件成型产品的产品空腔和用于如果产品的插入件不规则地变形或以错误的方向布置的突起形成腔,则在插入成型产品上形成突起。 如果存在于产品上的投影阻挡了从发光元件发射的大部分光。 光电检测器检测接收光的强度,并且当检测到的光强度由于投影的存在而小于预定值时,判断产品被拒绝。 目视检查或光学传感器判断产品是否有通孔关闭而被拒绝,如果产品的通孔打开,则可以接受。 该判断不需要X射线检查装置或放射科医师。

    Electron Beam Irradiation Method and Scanning Electron Microscope
    46.
    发明申请
    Electron Beam Irradiation Method and Scanning Electron Microscope 有权
    电子束照射方法和扫描电子显微镜

    公开(公告)号:US20130009057A1

    公开(公告)日:2013-01-10

    申请号:US13580288

    申请日:2011-02-09

    IPC分类号: H01J37/29

    摘要: The present invention has for its object to provide a charged particle beam irradiation method and a charged particle beam apparatus which can suppress unevenness of electrification even when a plurality of different kinds of materials are contained in a pre-dosing area or degrees of density of patterns inside the pre-dosing area differs with positions.To accomplish the above object, a charged particle beam irradiation method and a charged particle beam apparatus are provided according to which the pre-dosing area is divided into a plurality of divisional areas and electrifications are deposited to the plural divisional areas by using a beam under different beam irradiation conditions. With the above construction, the electrifications can be deposited to the pre-dosing area on the basis of such an irradiation condition that the differences in electrification at individual positions inside the pre-dosing area can be suppressed and consequently, an influence an electric field has upon the charged particle beam and electrons given off from the sample can be suppressed.

    摘要翻译: 本发明的目的是提供一种带电粒子束照射方法和带电粒子束装置,其即使在预给料区域中包含多种不同种类的材料或图案密度程度时也能抑制通电不均匀性 预给药区域内的位置与位置不同。 为了实现上述目的,提供一种带电粒子束照射方法和带电粒子束装置,根据该装置,预给料区域被分成多个分区,并且通过使用下面的束将电气沉积到多个分区域 不同的束照射条件。 通过上述结构,可以基于这样一种照射条件将电气沉积到预给料区域,即可以抑制预给料区域内各个位置的通电差异,从而影响电场 可以抑制带电粒子束和从样品发出的电子。

    Baggage receiving and handling method in airport, baggage receiving and
handling system in airport, and baggage automatic handling apparatus
    48.
    发明授权
    Baggage receiving and handling method in airport, baggage receiving and handling system in airport, and baggage automatic handling apparatus 失效
    机场行李接收处理方法,机场行李接收处理系统和行李自动处理装置

    公开(公告)号:US5793639A

    公开(公告)日:1998-08-11

    申请号:US711740

    申请日:1996-09-10

    申请人: Minoru Yamazaki

    发明人: Minoru Yamazaki

    IPC分类号: B64F1/36 G07B15/00 G06F19/00

    摘要: An airport baggage receiving and handling method receives a passenger's baggage, identifies the baggage and processes the baggage for the passenger's flight. The method includes providing identification information, storing a result of a baggage security check, retrieving the baggage security check result, conveying the baggage security check result to the passenger, and forwarding the baggage after the baggage security check is satisfied. The identification information identifies the passenger, the baggage, and the passenger and the baggage with respect to each other, when the passenger undergoes a check-in procedure. The baggage security check result is retrieved based on the identification information of the passenger at the time of the passenger's security check. If the baggage security check result is a rejection, the passenger is permitted to satisfy the rejection. As a result, only baggage that has satisfied the security check is forwarded to a sorting section.

    摘要翻译: 机场行李接收和处理方法接收乘客行李,识别行李并处理乘客的行李。 该方法包括提供身份信息,存储行李安全检查的结果,检索行李安全检查结果,将行李安全检查结果传达给乘客,以及在行李安全检查被满足后转发该行李。 当乘客进行登机手续时,识别信息识别乘客,行李,乘客和行李。 根据乘客安全检查时乘客的身份信息检索行李安全检查结果。 如果行李安全检查结果被拒绝,则允许乘客满足拒绝。 因此,只有满足安全检查的行李才会转发到分拣部分。

    Method for detecting information of an electronic potential on a sample and charged particle beam apparatus
    49.
    发明授权
    Method for detecting information of an electronic potential on a sample and charged particle beam apparatus 有权
    用于检测样品和带电粒子束装置上的电位的信息的方法

    公开(公告)号:US08487250B2

    公开(公告)日:2013-07-16

    申请号:US13568922

    申请日:2012-08-07

    IPC分类号: H01J37/26

    摘要: An object of the present invention is to provide a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on the sample induced by the charged particle beam application, or detecting a compensation value for a change in a condition for the apparatus caused by the sample being electrically charged. In order to achieve the above object, the present invention provides a method and apparatus for applying a voltage to a sample so that a charged particle beam does not reach the sample (hereinafter, this may be referred to as “mirror state”) in a state in which the charged particle beam is applied toward the sample, and detecting information relating to a potential on the sample using signals obtained by that voltage application.

    摘要翻译: 本发明的目的是提供一种方法和装置,用于使用带电粒子束测量样品表面上的电位,同时抑制由带电粒子束施加引起的样品上的电位变化,或检测补偿 用于由样品带电引起的装置的状况改变的值。 为了实现上述目的,本发明提供了一种向样品施加电压使得带电粒子束不能到达样品的方法和装置(以下称为“镜像状态”),其中 将带电粒子束施加到样品的状态,以及使用通过该电压施加获得的信号检测与样品上的电位有关的信息。