摘要:
A recording apparatus for a video signal in which first and second heads for recording and reproducing are attached through electrostrictive elements to a rotary drum with an angular spacing of substantially 180.degree. therebetween. When a video signal is recorded, a pilot signal recorded by the first head over a predetermined interval is reproduced by the second head while a pilot signal recorded by the second head and spaced apart by a predetermined number of recording tracks is reproduced by the first head. Reproduced levels of the pilot signals are compared so as to control a drive voltage for the electrostrictive elements and thus to adjust a step difference between the first and second heads in the recording mode.
摘要:
The present invention has for its object to provide a charged particle beam irradiation method and a charged particle beam apparatus which can suppress unevenness of electrification even when a plurality of different kinds of materials are contained in a pre-dosing area or degrees of density of patterns inside the pre-dosing area differs with positions.To accomplish the above object, a charged particle beam irradiation method and a charged particle beam apparatus are provided according to which the pre-dosing area is divided into a plurality of divisional areas and electrifications are deposited to the plural divisional areas by using a beam under different beam irradiation conditions. With the above construction, the electrifications can be deposited to the pre-dosing area on the basis of such an irradiation condition that the differences in electrification at individual positions inside the pre-dosing area can be suppressed and consequently, an influence an electric field has upon the charged particle beam and electrons given off from the sample can be suppressed.
摘要:
A scanning electron microscope having a charged particle beam that when in a state being irradiated toward a sample, a voltage is applied to the sample so that the charged particle beam does not reach the sample. The scanning electron microscope also detects information on a potential of a sample using a signal obtained, and a device for automatically adjusting conditions based on the result of measuring.
摘要:
A scanning electron microscope having a charged particle beam that when in a state being irradiated toward a sample, a voltage is applied to the sample so that the charged particle beam does not reach the sample. The scanning electron microscope also detects information on a potential of a sample using a signal obtained, and a device for automatically adjusting conditions based on the result of measuring.
摘要:
A mold assembly includes a product cavity for producing an insert-molded product and a projection-forming cavity for, if an insert of the product is irregularly deformed or disposed in wrong orientation, forming a projection on the insert-molded product. The projection, if present on the product, blocks most of the light emitted from a light-emitting element. A photodetector detects the intensity of the received light and when the detected light intensity is less than a predetermined value due to the presence of the projection, the product is judged to be rejected. Visual inspection or optical sensors judge the product to be rejected if the product has a through-hole closed and to be acceptable if the through-hole of the product is open. This judgment does not require an X-ray inspection device or radiologists.
摘要:
The present invention has for its object to provide a charged particle beam irradiation method and a charged particle beam apparatus which can suppress unevenness of electrification even when a plurality of different kinds of materials are contained in a pre-dosing area or degrees of density of patterns inside the pre-dosing area differs with positions.To accomplish the above object, a charged particle beam irradiation method and a charged particle beam apparatus are provided according to which the pre-dosing area is divided into a plurality of divisional areas and electrifications are deposited to the plural divisional areas by using a beam under different beam irradiation conditions. With the above construction, the electrifications can be deposited to the pre-dosing area on the basis of such an irradiation condition that the differences in electrification at individual positions inside the pre-dosing area can be suppressed and consequently, an influence an electric field has upon the charged particle beam and electrons given off from the sample can be suppressed.
摘要:
Disclosed herein are a method for applying, while a charged particle beam is in a state being irradiated toward the sample, a voltage to the sample so that the charged particle beam does not reach the sample (hereafter such state may be referred to as a mirror state) and detecting information on a potential of a sample using a signal obtained then, and a device for automatically adjusting conditions of the device based on the result of measuring.
摘要:
An airport baggage receiving and handling method receives a passenger's baggage, identifies the baggage and processes the baggage for the passenger's flight. The method includes providing identification information, storing a result of a baggage security check, retrieving the baggage security check result, conveying the baggage security check result to the passenger, and forwarding the baggage after the baggage security check is satisfied. The identification information identifies the passenger, the baggage, and the passenger and the baggage with respect to each other, when the passenger undergoes a check-in procedure. The baggage security check result is retrieved based on the identification information of the passenger at the time of the passenger's security check. If the baggage security check result is a rejection, the passenger is permitted to satisfy the rejection. As a result, only baggage that has satisfied the security check is forwarded to a sorting section.
摘要:
An object of the present invention is to provide a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on the sample induced by the charged particle beam application, or detecting a compensation value for a change in a condition for the apparatus caused by the sample being electrically charged. In order to achieve the above object, the present invention provides a method and apparatus for applying a voltage to a sample so that a charged particle beam does not reach the sample (hereinafter, this may be referred to as “mirror state”) in a state in which the charged particle beam is applied toward the sample, and detecting information relating to a potential on the sample using signals obtained by that voltage application.
摘要:
In a method and apparatus for measuring a potential on a surface of a sample using a charged particle beam while restraining a change in the potential on the sample induced by the charged particle beam application, or detecting a compensation value for a change in a condition for the apparatus caused by the sample being electrically charged, a voltage is applied to a sample such that a charged particle beam does not reach the sample (referred to as “mirror state”) when the charged particle beam is applied toward the sample. Information is detected, relating to a potential on the sample using signals obtained by the voltage application.