摘要:
A lubricant supply device is to be fitted to a nut member engaging with a screw shaft through rolling members to supply lubricant to the screw shaft along with a relative rotational motion of the nut member to the screw shaft. The device comprises an application member, a lubricant storage member and a control device. The application member for applying the lubricant on the screw shaft has at least one tongue portion, which is capable of coming into contact with at least one of rolling-member running surface of the screw shaft. The number of the at least one tongue portion is identical with or larger than the number of the rolling-member running surface. The lubricant storage member supplies the lubricant to the application member. The control device controls an amount of the lubricant supplied from the lubricant storage member to the application member.
摘要:
According to one embodiment, a system includes a memory, a controller which controls an operation of the memory in a data program, and data bus which connects the memory to the controller. The memory comprises a memory cell array with memory cells which have a bit assignment to 2x (x is an integer number of 3 or more) threshold distributions, each memory cell storing x bits, and a control circuit which controls the data program of x bits to the memory cells. The controller comprises a first step generating y bit (y is an integer number and y
摘要:
According to one embodiment, a nonvolatile semiconductor memory device includes a memory cell array and a controller. The controller is configured to perform a verify operation using a first verification voltage and a second verification voltage (first verification voltage
摘要:
According to one embodiment, a nonvolatile semiconductor memory device includes a memory cell array connected to word lines and bit lines, and formed by arranging a plurality of memory cells in a matrix, each memory cell storing one of n values (n is a natural number of not less than 2), and a control circuit configured to write data in the memory cells by controlling potentials of the word lines and the bit lines in accordance with input data. The control circuit performs a write verify operation a plurality of number of times by changing a voltage level, stores data of the voltage level at which verify pass occurs, and determines a write voltage based on the stored data of the voltage level.
摘要:
A memory cell array is connected to a word line and a bit line, and configured so that a plurality of memory cells storing one level of n levels (n is a natural number more than 4) in one memory cell are arrayed in a matrix. A control circuit controls a potential of the word line and the bit line in accordance with input data, and writs data in the memory cell. The control circuit applies a write voltage corresponding to write data to a memory cell. The write voltage differs for each write data. A verify operation is executed for each write data after a write voltage application operation ends with respect to all n levels.
摘要:
A non-volatile semiconductor memory device comprises a memory cell array including a plurality of memory cells arrayed capable of storing information in accordance with variations in threshold voltage. A likelihood calculator has a plurality of likelihood calculation algorithms for deriving a likelihood value about a stored data bit from a threshold value read out of the memory cell. An error correction unit executes error correction through iterative processing using the likelihood value obtained at the likelihood calculator. A likelihood calculator controller changes among the likelihood calculation algorithms in the likelihood calculator based on a certain value of the number of iterations in the iterative processing obtained from the error correction unit.
摘要:
A memory cell array includes a plurality of memory cells in each of which a plurality of bits are stored. A sense amplifier detects data read from a memory cell selected from the memory cell array. At the time of a write verify operation for verifying write data, when a threshold voltage of the memory cell exceeds a predetermined checkpoint, the data control unit converts write data to be written to the memory cell into data of the number of times indicating the remaining number of write voltage application times, inverts only one bit of the data of the number of times each time a write voltage application operation is performed, and changes a definition of the data of the number of times to thereby perform a subtraction operation.
摘要:
A non-volatile semiconductor memory device, allocates data contained in an ECC frame as a first data group to be stored in a first memory cell group composed of a plurality of first memory cells selected by a first word line and a second data group to be stored in a second memory cell group composed of a plurality of second memory cells selected by a second word line.
摘要:
A nonvolatile semiconductor memory for setting control voltages to be supplied to an internal circuit, to an external reference voltage inputted from outside, has a parameter control circuit. The parameter control circuit causes a parameter register to sequentially output the plurality of parameters to a voltage generating control circuit. The parameter control circuit counts, for a fixed period of time, the number of oscillations of each of the trimming flag signals sequentially outputted from the voltage generating control circuit in response to the parameters. The parameter control circuit stores counted values corresponding to the parameters. The parameter control circuit selects the parameter having a maximum counted value as a parameter corresponding to the control voltage closest to the external reference voltage.
摘要:
In a memory cell array, memory cells enabled to store plural-bit data are arranged in matrix. The bit-line control circuit is connected to bit-lines to control the bit-lines. A word line control circuit applies a plural-bit data read voltage as a word line voltage to the word line. The plural-bit data read voltage is larger than an upper limit of one of plural threshold voltage distributions and smaller than a lower limit of another threshold voltage distribution. Furthermore, it applies a soft-value read voltage as a word line voltage to the word line. The soft-value read voltage is smaller than an upper limit of a threshold voltage distribution and larger than a lower limit thereof. The likelihood calculation circuit calculates likelihood of the plural-bit data stores in the memory cells based on the soft-value.