Polymer, resist composition and patterning process
    41.
    发明授权
    Polymer, resist composition and patterning process 有权
    聚合物,抗蚀剂组合物和图案化工艺

    公开(公告)号:US07601479B2

    公开(公告)日:2009-10-13

    申请号:US10936753

    申请日:2004-09-09

    CPC分类号: G03F7/0397 Y10S430/111

    摘要: A polymer comprising recurring units of formulae (1) to (4) wherein R1, R3, R4 and R7 are hydrogen or methyl, R2 is an acid labile group, R5 and R6 are hydrogen or hydroxyl, and R8 is a lactone structure group and having a Mw of 1,000-50,000 is provided. A resist composition comprising the inventive polymer has a sensitivity to high-energy radiation, improved resolution and etching resistance and lends itself to lithographic micropatterning with electron beams or deep UV.

    摘要翻译: 包含式(1)至(4)的重复单元的聚合物,其中R1,R3,R4和R7是氢或甲基,R2是酸不稳定基团,R5和R6是氢或羟基,R8是内酯结构基团, 提供Mw为1,000-50,000的Mw。 包含本发明聚合物的抗蚀剂组合物对高能量辐射具有敏感性,改进的分辨率和耐蚀刻性,并且使其自身适用于具有电子束或深紫外线的光刻微图案。

    Lactone-containing compound, polymer, resist composition, and patterning process
    44.
    发明申请
    Lactone-containing compound, polymer, resist composition, and patterning process 有权
    含内酯的化合物,聚合物,抗蚀剂组合物和图案化工艺

    公开(公告)号:US20070160929A1

    公开(公告)日:2007-07-12

    申请号:US11649251

    申请日:2007-01-04

    IPC分类号: G03C1/00

    摘要: Lactone-containing compounds having formula (1) are novel wherein A1 is a polymerizable functional group having a double bond, R1 is a monovalent C1-C10 hydrocarbon group in which some or all hydrogen atoms are substituted by fluorine atoms, and W is CH2, O or S. They are useful as monomers to produce polymers for the formulation of radiation-sensitive resist compositions which have high transparency to radiation of up to 500 nm and exhibit good development properties. Radiation-sensitive resist compositions comprising the polymers as base resin exhibit high resolution and prevent dissolution in water and penetration of water when processed by immersion lithography.

    摘要翻译: 具有式(1)的含内酯的化合物是新颖的,其中A 1是具有双键的可聚合官能团,R 1是一价C 1 - 其中一些或全部氢原子被氟原子取代的烃基,W是CH 2,O或S.它们可用作单体, 生产用于配制辐射敏感抗蚀剂组合物的聚合物,其具有高达500nm的辐射的高透明度并且显示出良好的显影性能。 包含作为基础树脂的聚合物的辐射敏感性抗蚀剂组合物当通过浸渍光刻处理时表现出高分辨率并防止溶解在水中并渗入水中。

    Positive resist composition and patterning process
    47.
    发明申请
    Positive resist composition and patterning process 有权
    正抗蚀剂组成和图案化工艺

    公开(公告)号:US20080124652A1

    公开(公告)日:2008-05-29

    申请号:US11984614

    申请日:2007-11-20

    IPC分类号: G03F7/20 G03C1/73

    摘要: A positive resist composition comprises (A) a resin component which becomes soluble in an alkaline developer under the action of an acid, and (B) an acid generator. The resin (A) is a polymer comprising tertiary alkyl protective group units having a hydrophobic tetracyclo[4.4.0.12,5.17,10]-dodecane structure, hydroxyadamantane units, monocyclic lactone units, and carboxylic acid units. The acid generator (B) is a specific sulfonium salt compound.

    摘要翻译: 正型抗蚀剂组合物包含(A)在酸作用下变得可溶于碱性显影剂的树脂组分和(B)酸产生剂。 树脂(A)是包含具有疏水性四环[4.4.0.1 2,5,7,10-] - 十二烷结构的叔烷基保护基单元的聚合物,羟基金刚烷 单体,单环内酯单元和羧酸单元。 酸产生剂(B)是特定的锍盐化合物。

    Positive resist composition and patterning process
    49.
    发明授权
    Positive resist composition and patterning process 有权
    正抗蚀剂组成和图案化工艺

    公开(公告)号:US07541133B2

    公开(公告)日:2009-06-02

    申请号:US11984614

    申请日:2007-11-20

    IPC分类号: G03F7/004 G03F7/30

    摘要: A positive resist composition comprises (A) a resin component which becomes soluble in an alkaline developer under the action of an acid, and (B) an acid generator. The resin (A) is a polymer comprising tertiary alkyl protective group units having a hydrophobic tetracyclo[4.4.0.12,5.17,10]-dodecane structure, hydroxyadamantane units, monocyclic lactone units, and carboxylic acid units. The acid generator (B) is a specific sulfonium salt compound.

    摘要翻译: 正型抗蚀剂组合物包含(A)在酸作用下变得可溶于碱性显影剂的树脂组分和(B)酸产生剂。 树脂(A)是包含具有疏水性四环[4.4.0.12,5.17,10] - 十二烷结构的叔烷基保护基单元,羟基金刚烷单元,单环内酯单元和羧酸单元的聚合物。 酸产生剂(B)是特定的锍盐化合物。