摘要:
CMP process control array groups are fabricated upon the surface of the wafer for viewing through an optical microscope. The array groups include a plurality of test arrays, where each array includes a plurality of projecting test features. Each of the projecting test features are formed with the same projecting height and have a hard upper surface layer, such as diamond-like-carbon (DLC). All of the projecting test features within an array are formed with the same diameter, and the diameter of projecting test features of a particular array differs from the diameter of projecting test features in another array. The diameters are chosen such that the DLC surface is removed in specifically designed time increments, such as 5 seconds, from array to array, where projecting test features with the DLC surface removed appear as bright white, while the arrays with test features that retain some DLC surface are significantly darker.
摘要:
A laser, such as a horizontal cavity surface emitting laser, with internal polarization rotation may be used in thermally assisted recording in hard disk drives. The desired polarization of the laser may be accomplished with two beam reflections off of facets within the laser. The facets may be formed in a single ion beam etching step. The laser may be used on a thermally assisted recording head to produce a polarized beam that is aligned with a track direction of the disk.
摘要:
A magnetic read sensor having improved robustness to withstand thermal variations resulting from thermal fly height heating. Improved thermal robustness comes as a result of improved pinned layer pinning. The read head includes an AFM layer having an increased thickness to provide a higher blocking temperature. The read head further includes a pinned layer structure that includes a first magnetic layer adjacent to and exchange coupled with the AFM layer. The first layer comprises a Co—Fe layer with an increased Fe content of 20-30 atomic percent. The pinned layer structure also includes a second magnetic layer that is antiparallel coupled with the AP1 layer. The AP2 layer can be a multi-layer structure that includes a layer of CoFe, a layer of Co—Fe—Hf formed on the layer of Co—Fe, a layer of Co—Fe—B formed on the layer of Co—Fe—Hf, and a second layer of Co—Fe formed on the layer of Co—Fe—B.
摘要:
A current perpendicular to plane (CPP) magnetoresistive sensor having a current path defined by first and second overlying insulation layers between which an electrically conductive lead makes content with a surface of the sensor stack. The current path being narrower than the width of the sensor stack allows the outer edges of the sensor stack to be moved outside of the active area of the sensor. This results in a sensor that is unaffected by damage at outer edges of the sensor layers. The sensor stack includes a free layer that is biased by direct exchange coupling with a layer of antiferromagnetic material (AFM layer). The strength of the exchange field can be controlled by adding Cr to the AFM material to ensure that the exchange field is sufficiently weak to avoid pinning the free layer.
摘要:
A process for forming a plurality of sliders for use in thermally-assisted recording (TAR) disk drives includes a wafer-level process for forming a plurality of aperture structures, and optionally abutting optical channels, on a wafer surface prior to cutting the wafer into individual sliders. The wafer has a generally planar surface arranged into a plurality of rectangularly-shaped regions. In each rectangular region a first metal layer is deposited on the wafer surface, followed by a layer of radiation-transmissive aperture material, which is then lithographically patterned to define the width of the aperture, the aperture width being parallel to the length of the rectangularly-shaped region. A second metal layer is deposited over the patterned layer of aperture material. The resulting structure is then lithographically patterned to define an aperture structure comprising aperture material surrounded by metal and having parallel radiation entrance and exit faces orthogonal to the wafer surface.
摘要:
Embodiments of the present invention provide a workpiece transportation control method and system that automatically processes a plurality of steps in a successive manner, thereby enhancing production efficiency. According to one embodiment, a transportation control method includes the steps of: monitoring the state of an automated manufacturing system to see if there is a request for transporting a workpiece; extracting the subsequent step path for the workpiece when a transportation request is issued; calculating a standard necessary period along the extracted step path; converting the subsequent standard necessary period into an evaluation value, issuing a transportation request, stacking tasks in response to other transportation requests; and selecting a workpiece with the shortest subsequent standard necessary period from the stacked transportation requests.
摘要:
Embodiments of the invention provide a perpendicular magnetic recording medium having a granular structured magnetic recording layer including many columnar grains, and grain boundary layers containing oxide, wherein a high medium S/N ratio is obtained while securing head flyability and durability. In an embodiment, the perpendicular magnetic recording medium includes a granular structured magnetic recording layer having many columnar grains, as well as grain boundary layers including oxide respectively. Assuming that the columnar grains are divided equally in the film thickness direction into a protective layer side portion and an intermediate layer side portion, and the diameter of the protective layer side portion is larger than that of the intermediate layer side portion.
摘要:
A magnetic head slider suitable for a disk drive measuring 1.8 inches or less in disk size incorporates preventive measures against the decreases in lifting force that occur in small sliders with a slider width of 0.8 mm or less. The present invention improves the inclination margins of the flying slider in a rolling direction at the lowest flying point, and achieves low flying height and stable flying. The slider is constructed with stepped surfaces on the slider's leading-side flying surface formed up of shallow-grooved surfaces and a deep-grooved surface so that a trailing-side width W2 between the stepped surfaces is smaller than a leading-side width W1.
摘要:
Embodiments of the present invention provide a magnetic head and a magnetic disk drive using the same, which is capable of increasing efficiency in changing the flying height of an element portion by heat generation of a heater in the magnetic head using the heater as well as capable of suppressing the change of the flying height of the element portion at the time of recording. In a magnetic head according to one embodiment of the invention, when a portion is defined as a “heater immobility line”, in which a position of the positive pressure generation surface does not vary when the electricity is distributed to a heater, and a portion is defined as a “write immobility line”, in which a position of the positive pressure generation surface does not vary at the time of recording, the area of the raised region surrounded by the heater immobility line is smaller than the area of the raised region surrounded by the write immobility line.
摘要:
A method for predicting the failure of a data storage device having a slider heater is disclosed. For slider heaters exhibiting a decreasing resistance aging characteristic, a failure warning is produced when heater resistance suddenly increases 2 to 5%, or dR/dt changes sign from negative to positive. For slider heaters exhibiting an increasing resistance aging characteristic, a failure warning is produced when the heater resistance suddenly drops 2 to 5%, or dR/dt changes sign from positive to negative. Additionally, random changes in heater resistance exceeding nominal measurement error may also be utilized to produce a failure warning. This method provides advance warning of potential data read/write errors well before the open circuit failure of the slider heater occurs.