IGBT device with MOS controllable hole path

    公开(公告)号:US10923583B2

    公开(公告)日:2021-02-16

    申请号:US16601609

    申请日:2019-10-15

    Abstract: The present invention relates to the technical field of power semiconductor devices, particularly to an insulated gate bipolar transistor with a MOS controllable hole path. According to the present invention, a MOS controllable gate structure formed by a gate dielectric layer, a MOS control gate electrode and a P-type MOS channel region are embedded in a P+ floating p-body region of the conventional IGBT structure. The MOS region is equivalent to a switch controlled by a gate voltage. When the device is turned on under a forward voltage, the potential of the p-body region is floated to store holes, reducing the saturation conduction voltage drop of the device. Under the condition of turn-off and short-circuit, the hole extracting path is provided and the Miller capacitance is lowered, thereby lowering the turn-off losses and enhancing the short-circuit withstand capability.

    Optical device, imaging device, focus driving method, and method for moving lens center

    公开(公告)号:US20210041762A1

    公开(公告)日:2021-02-11

    申请号:US16988648

    申请日:2020-08-08

    Abstract: An optical device includes a first electrode layer, a first alignment layer, a liquid crystal layer, a second alignment layer, and a second electrode layer being arranged in turn along a light transmission direction; wherein the first electrode layer comprises a first electrode, a second electrode, and a first impedance membrane arranged between the first electrode and the second electrode, and the first electrode and the second electrode are respectively arranged on opposite ends of the first impedance membrane; the second electrode layer has a structure similar to that of the first electrode layer. The four electrodes form a light transmission hole being shaped as a parallelogram. The present invention solves the problem that the focal length of the liquid crystal lens cannot be accurately adjusted due to the instability of the impedance of the impedance membrane of the present liquid crystal lens.

    IGBT DEVICE WITH MOS CONTROLLABLE HOLE PATH
    56.
    发明申请

    公开(公告)号:US20200235231A1

    公开(公告)日:2020-07-23

    申请号:US16601609

    申请日:2019-10-15

    Abstract: The present invention relates to the technical field of power semiconductor devices, particularly to an insulated gate bipolar transistor with a MOS controllable hole path. According to the present invention, a MOS controllable gate structure formed by a gate dielectric layer, a MOS control gate electrode and a P-type MOS channel region are embedded in a P+ floating p-body region of the conventional IGBT structure. The MOS region is equivalent to a switch controlled by a gate voltage. When the device is turned on under a forward voltage, the potential of the p-body region is floated to store holes, reducing the saturation conduction voltage drop of the device. Under the condition of turn-off and short-circuit, the hole extracting path is provided and the Miller capacitance is lowered, thereby lowering the turn-off losses and enhancing the short-circuit withstand capability.

    Bipolar-CMOS-DMOS semiconductor device and manufacturing method

    公开(公告)号:US10607987B2

    公开(公告)日:2020-03-31

    申请号:US16255851

    申请日:2019-01-24

    Abstract: A BIPOLAR-CMOS-DMOS (BCD) semiconductor device and manufacturing method, which can integrate a Junction Field-Effect Transistor (JFET), two classes of Vertical Double-diffusion Metal Oxide Semiconductor (VDMOS), a Lateral Insulated-Gate Bipolar Transistor (LIGBT) and seven kinds of Laterally Diffused Metal Oxide Semiconductor (LDMOS), a low-voltage Negative channel Metal Oxide Semiconductor (NMOS), a low-voltage Positive channel Metal Oxide Semiconductor (PMOS), a low-voltage Negative-Positive-Negative (NPN) transistor and a low-voltage Positive-Negative-Positive (PNP) transistor, and a diode in the same chip. Bipolar devices in the analog circuit, power components in the switch circuit, Complementary Metal Oxide Semiconductor (CMOS) devices in the logic circuit and other kinds of lateral and vertical components are integrated. This present invention saves costs at the same time greatly improve chip integration. The manufacturing method of the present invention is simple, and the difficulty of process is relatively less.

    Coaxial resonant cavity and system and method for measuring dielectric constant of material

    公开(公告)号:US10553926B2

    公开(公告)日:2020-02-04

    申请号:US15739169

    申请日:2017-07-19

    Abstract: The present disclosure is related to the microwave measuring field, and in particularly to a coaxial resonant cavity and system and method for measuring the dielectric constant of material. The coaxial resonant cavity includes a coupling mechanism and a cavity body. The coupling mechanism is accommodated in the cavity body for exciting or coupling microwaves inside the cavity body. The coaxial resonant cavity further includes a probe extending out of the cavity body and being coaxial with the cavity body. The cavity body is shaped as an annular column, and a ratio of an outer radius of the annular column to an inner radius of the annular column is (3-5):1. The present disclosure still provides a system and method for measuring the dielectric constant of material using the coaxial resonant cavity.

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