公开(公告)号：US20220192801A1

公开(公告)日：2022-06-23

申请号：US17694462

申请日：2022-03-14

Applicant: Align Technology, Inc.

Inventor： Yossef Atiya ,  Tal Verker

IPC: A61C9/00 ,  A61C1/08 ,  A61B5/00 ,  A61B1/247 ,  A61B1/06 ,  A61B1/00 ,  G01B11/24 ,  G01B11/30

Abstract: An apparatus includes a probe and an illumination unit configured to output light. The apparatus includes a light focusing assembly comprising an image space lens, an object space lens and a focus changing assembly between the image space lens and the object space lens. The light focusing assembly has at least one of the following properties: 1) at least a portion of the focus changing assembly is located at a back focal length of the object space lens, 2) the light focusing assembly is free of moving parts, or 3) the light focusing assembly comprises double telecentric confocal optics. The apparatus includes a detector to measure characteristics of incident light returning from an illuminated patient's teeth and a processor coupled to the detector and configured to generate data representative of a topography of the patient's teeth based on the one or more measured characteristics of the incident light.

公开(公告)号：US20210022611A1

公开(公告)日：2021-01-28

申请号：US17037398

申请日：2020-09-29

Applicant: Align Technology, Inc.

Inventor： Yossef Atiya ,  Tal Verker ,  Nir Makmel

IPC: A61B5/00 ,  G02B13/16 ,  G02B6/26 ,  F21V8/00 ,  G01B11/24 ,  G01B11/245 ,  A61C9/00 ,  G02B5/04 ,  G02B23/24

Abstract: An apparatus for dental imaging comprises a light source for generating light, an optics system for focusing the light, and a light-guiding part having an entrance face and an exit face. The light source, the optics system and the light-guiding part are arranged such that the light passes through the optics system, enters the light-guiding part via the entrance face, and exits the light-guiding part via the exit face. The optics system is configured such that, upon entering the light-guiding part, an outermost chief ray of the light with respect to an optical axis of the optics system is divergent to the optical axis and an outermost marginal ray of the light with respect to the optical axis is parallel or divergent to the optical axis.

公开(公告)号：US10756511B2

公开(公告)日：2020-08-25

申请号：US16192359

申请日：2018-11-15

Applicant: Align Technology, Inc.

Inventor： Yossef Atiya ,  Tal Verker

IPC: H01S5/00 ,  H01S5/068 ,  H01S5/183 ,  H01S5/42

Abstract: Methods and apparatus for measuring objects comprise a plurality of light sources to generate a plurality of light beams directed toward a spot generator array comprising a plurality of spot generating lenses. The plurality of light sources is separated from the spot generator array with a separation distance sufficient to overlap the plurality of light beams at each of the spot generating lenses. The overlap of each of the beams at each of the spot generating lenses provides smoothing of the energy profile of the light energy incident on the spot generating lenses. The spot generator array generates focused spots comprising overlapping focused beams. The overlapping beams may comprise overlapping beams of a vertical cavity surface emitting laser (VCSEL) array, and the overlapping focused beams can decrease optical artifacts.

公开(公告)号：US20200214811A1

公开(公告)日：2020-07-09

申请号：US16823156

申请日：2020-03-18

Applicant: Align Technology, Inc.

Inventor： Tal Verker ,  Adi Levin ,  Ofer Saphier ,  Maayan Moshe

IPC: A61C9/00 ,  G02B21/00 ,  G02B23/24 ,  G01B11/24 ,  G02B23/26 ,  G02B27/00

Abstract: A method of generating a three-dimensional virtual model of an intraoral object includes capturing, by an intraoral scanner for performing intraoral scans, surface scan data of the intraoral object while changing a position of at least one lens of focusing optics of the intraoral scanner, wherein the surface scan data comprises depth data for a plurality of points of the intraoral object. The method further includes adjusting the depth data for one or more of the plurality of points based at least in part on a value associated with a temperature of at least a portion of the imaging apparatus. The method further includes generating the three-dimensional virtual model of the intraoral object using the adjusted depth data.

公开(公告)号：US10260869B2

公开(公告)日：2019-04-16

申请号：US15668197

申请日：2017-08-03

Applicant: ALIGN TECHNOLOGY, INC.

Inventor： Yossef Atiya ,  Tal Verker

IPC: G01B11/25 ,  A61C9/00 ,  G01B11/24 ,  A61C1/08 ,  A61B1/00 ,  A61B1/04 ,  A61B1/06 ,  A61B1/24 ,  A61B5/107 ,  A61B5/00

Abstract: A system for determining surface topography of a three-dimensional structure is provided. The system can include an illumination unit configured to output a two-dimensional array of light beams each comprising a plurality of wavelengths. An optical assembly can focus the plurality of wavelengths of each light beam to a plurality of focal lengths so as to simultaneously illuminate the structure over a two-dimensional field of view. A detector and a processor are used to generate data representative of the surface topography of the three-dimensional structure based on the measured characteristics of the light reflected from the structure.

公开(公告)号：US10258437B2

公开(公告)日：2019-04-16

申请号：US15811365

申请日：2017-11-13

Applicant: Align Technology, Inc.

Inventor： Yossef Atiya ,  Tal Verker

IPC: A61C9/00 ,  A61B1/00 ,  A61B1/247 ,  A61C1/08 ,  A61B5/00 ,  A61B1/06 ,  G01B11/24 ,  G01B11/30

Abstract: An apparatus is described for determining surface topography of a three-dimensional structure. The apparatus can include a probe and an illumination unit configured to output a plurality of light beams. In many embodiments, the apparatus includes a light focusing assembly. The light focusing assembly can receive and focus each of a plurality of light beams to a respective external focal point. The light focusing assembly can be configured to overlap the plurality of light beams within a focus changing assembly in order to move the external focal points along a direction of propagation of the light beams. The apparatus can include a detector having an array of sensing elements configured to measure a characteristic of each of a plurality of light beams returning from the illuminated spots and a processor coupled to the detector and configured to generate data representative of topography of the structure based on the measured characteristic.

公开(公告)号：US20180235738A1

公开(公告)日：2018-08-23

申请号：US15811365

申请日：2017-11-13

Applicant: Align Technology, Inc.

Inventor： Yossef Atiya ,  Tal Verker

IPC: A61C9/00 ,  A61B1/00 ,  A61B1/06 ,  G01B11/30 ,  A61C1/08 ,  A61B1/247 ,  G01B11/24 ,  A61B5/00

CPC classification number: A61C9/0066 ,  A61B1/00009 ,  A61B1/00011 ,  A61B1/00045 ,  A61B1/0676 ,  A61B1/247 ,  A61B5/0013 ,  A61B5/0022 ,  A61B5/0088 ,  A61B5/7228 ,  A61B2562/0233 ,  A61C1/088 ,  A61C9/0046 ,  A61C9/0053 ,  G01B11/24 ,  G01B11/30

Abstract: An apparatus is described for determining surface topography of a three-dimensional structure. The apparatus can include a probe and an illumination unit configured to output a plurality of light beams. In many embodiments, the apparatus includes a light focusing assembly. The light focusing assembly can receive and focus each of a plurality of light beams to a respective external focal point. The light focusing assembly can be configured to overlap the plurality of light beams within a focus changing assembly in order to move the external focal points along a direction of propagation of the light beams. The apparatus can include a detector having an array of sensing elements configured to measure a characteristic of each of a plurality of light beams returning from the illuminated spots and a processor coupled to the detector and configured to generate data representative of topography of the structure based on the measured characteristic.

公开(公告)号：US09844427B2

公开(公告)日：2017-12-19

申请号：US15220336

申请日：2016-07-26

Applicant: Align Technology, Inc.

Inventor： Yossef Atiya ,  Tal Verker

IPC: A61C9/00 ,  A61B1/247 ,  G01B11/30 ,  A61B1/00 ,  A61C1/08 ,  A61B5/00 ,  A61B1/06 ,  G01B11/24

CPC classification number: A61C9/0066 ,  A61B1/00009 ,  A61B1/00011 ,  A61B1/00045 ,  A61B1/0676 ,  A61B1/247 ,  A61B5/0013 ,  A61B5/0022 ,  A61B5/0088 ,  A61B5/7228 ,  A61B2562/0233 ,  A61C1/088 ,  A61C9/0046 ,  A61C9/0053 ,  G01B11/24 ,  G01B11/30

Abstract: An apparatus is described for determining surface topography of a three-dimensional structure. The apparatus can include a probe and an illumination unit configured to output a plurality of light beams. In many embodiments, the apparatus includes a light focusing assembly. The light focusing assembly can receive and focus each of a plurality of light beams to a respective external focal point. The light focusing assembly can be configured to overlap the plurality of light beams within a focus changing assembly in order to move the external focal points along a direction of propagation of the light beams. The apparatus can include a detector having an array of sensing elements configured to measure a characteristic of each of a plurality of light beams returning from the illuminated spots and a processor coupled to the detector and configured to generate data representative of topography of the structure based on the measured characteristic.

公开(公告)号：US20170328704A1

公开(公告)日：2017-11-16

申请号：US15668197

申请日：2017-08-03

Applicant: ALIGN TECHNOLOGY, INC.

Inventor： Yossef Atiya ,  Tal Verker

IPC: G01B11/25 ,  A61C9/00

CPC classification number: G01B11/25 ,  A61B1/00009 ,  A61B1/04 ,  A61B1/06 ,  A61B1/0638 ,  A61B1/24 ,  A61B5/0088 ,  A61B5/1076 ,  A61B5/1079 ,  A61B5/4547 ,  A61C1/088 ,  A61C9/006 ,  A61C9/0066 ,  G01B11/24 ,  G01B2210/50

Abstract: A system for determining surface topography of a three-dimensional structure is provided. The system can include an illumination unit configured to output a two-dimensional array of light beams each comprising a plurality of wavelengths. An optical assembly can focus the plurality of wavelengths of each light beam to a plurality of focal lengths so as to simultaneously illuminate the structure over a two-dimensional field of view. A detector and a processor are used to generate data representative of the surface topography of the three-dimensional structure based on the measured characteristics of the light reflected from the structure.

公开(公告)号：US20170248412A1

公开(公告)日：2017-08-31

申请号：US15593680

申请日：2017-05-12

Applicant: ALIGN TECHNOLOGY, INC.

Inventor： Erez Lampert ,  Adi Levin ,  Tal Verker

IPC: G01B11/25 ,  G02B3/00 ,  G02B23/24 ,  A61C9/00 ,  G01S17/08

CPC classification number: G01B11/2513 ,  A61C9/0053 ,  A61C9/006 ,  G01B11/24 ,  G01B11/25 ,  G01B11/2518 ,  G01B11/303 ,  G01S17/08 ,  G02B3/0056 ,  G02B21/0028 ,  G02B21/006 ,  G02B23/2461 ,  G02B23/26

Abstract: An apparatus is described for measuring surface topography of a three-dimensional structure. In many embodiments, the apparatus is configured to focus each of a plurality of light beams to a respective fixed focal position relative to the apparatus. The apparatus measures a characteristic of each of a plurality of returned light beams that are generated by illuminating the three-dimensional structure with the light beams. The characteristic is measured for a plurality of different positions and/or orientations between the apparatus and the three-dimensional structure. Surface topography of the three-dimensional structure is determined based at least in part on the measured characteristic of the returned light beams for the plurality of different positions and/or orientations between the apparatus and the three-dimensional structure.