VCSEL based low coherence emitter for confocal 3D scanner

    公开(公告)号:US10756511B2

    公开(公告)日:2020-08-25

    申请号:US16192359

    申请日:2018-11-15

    Abstract: Methods and apparatus for measuring objects comprise a plurality of light sources to generate a plurality of light beams directed toward a spot generator array comprising a plurality of spot generating lenses. The plurality of light sources is separated from the spot generator array with a separation distance sufficient to overlap the plurality of light beams at each of the spot generating lenses. The overlap of each of the beams at each of the spot generating lenses provides smoothing of the energy profile of the light energy incident on the spot generating lenses. The spot generator array generates focused spots comprising overlapping focused beams. The overlapping beams may comprise overlapping beams of a vertical cavity surface emitting laser (VCSEL) array, and the overlapping focused beams can decrease optical artifacts.

    CALIBRATION OF AN INTRAORAL SCANNER
    52.
    发明申请

    公开(公告)号:US20200214811A1

    公开(公告)日:2020-07-09

    申请号:US16823156

    申请日:2020-03-18

    Abstract: A method of generating a three-dimensional virtual model of an intraoral object includes capturing, by an intraoral scanner for performing intraoral scans, surface scan data of the intraoral object while changing a position of at least one lens of focusing optics of the intraoral scanner, wherein the surface scan data comprises depth data for a plurality of points of the intraoral object. The method further includes adjusting the depth data for one or more of the plurality of points based at least in part on a value associated with a temperature of at least a portion of the imaging apparatus. The method further includes generating the three-dimensional virtual model of the intraoral object using the adjusted depth data.

    Chromatic confocal system
    53.
    发明授权

    公开(公告)号:US10260869B2

    公开(公告)日:2019-04-16

    申请号:US15668197

    申请日:2017-08-03

    Abstract: A system for determining surface topography of a three-dimensional structure is provided. The system can include an illumination unit configured to output a two-dimensional array of light beams each comprising a plurality of wavelengths. An optical assembly can focus the plurality of wavelengths of each light beam to a plurality of focal lengths so as to simultaneously illuminate the structure over a two-dimensional field of view. A detector and a processor are used to generate data representative of the surface topography of the three-dimensional structure based on the measured characteristics of the light reflected from the structure.

    Apparatus and method for measuring surface topography optically

    公开(公告)号:US10258437B2

    公开(公告)日:2019-04-16

    申请号:US15811365

    申请日:2017-11-13

    Abstract: An apparatus is described for determining surface topography of a three-dimensional structure. The apparatus can include a probe and an illumination unit configured to output a plurality of light beams. In many embodiments, the apparatus includes a light focusing assembly. The light focusing assembly can receive and focus each of a plurality of light beams to a respective external focal point. The light focusing assembly can be configured to overlap the plurality of light beams within a focus changing assembly in order to move the external focal points along a direction of propagation of the light beams. The apparatus can include a detector having an array of sensing elements configured to measure a characteristic of each of a plurality of light beams returning from the illuminated spots and a processor coupled to the detector and configured to generate data representative of topography of the structure based on the measured characteristic.

    Confocal imaging apparatus with curved focal surface

    公开(公告)号:US09675430B2

    公开(公告)日:2017-06-13

    申请号:US14825173

    申请日:2015-08-13

    Abstract: A confocal imaging apparatus includes an illumination module to generate an array of light beams. Focusing optics perform confocal focusing of an array of light beams onto a non-flat focal surface and direct the array of light beams toward a three dimensional object to be imaged. A translation mechanism adjusts a location of at least one lens to displace the non-flat focal surface along an imaging axis. A detector measures intensities of an array of returning light beams that are reflected off of the three dimensional object and directed back through the focusing optics. Intensities of the array of returning light beams are measured for locations of the at least one lens for determination of positions on the imaging axis of points of the three dimensional object. Detected positions of one or more points are adjusted to compensate for the non-flat focal surface.

    CONFOCAL SURFACE TOPOGRAPHY MEASUREMENT WITH FIXED FOCAL POSITIONS
    60.
    发明申请
    CONFOCAL SURFACE TOPOGRAPHY MEASUREMENT WITH FIXED FOCAL POSITIONS 审中-公开
    具有固定焦点位置的共焦表面测量

    公开(公告)号:US20160113742A1

    公开(公告)日:2016-04-28

    申请号:US14980580

    申请日:2015-12-28

    Abstract: An apparatus is described for measuring surface topography of a three-dimensional structure. In many embodiments, the apparatus is configured to focus each of a plurality of light beams to a respective fixed focal position relative to the apparatus. The apparatus measures a characteristic of each of a plurality of returned light beams that are generated by illuminating the three-dimensional structure with the light beams. The characteristic is measured for a plurality of different positions and/or orientations between the apparatus and the three-dimensional structure. Surface topography of the three-dimensional structure is determined based at least in part on the measured characteristic of the returned light beams for the plurality of different positions and/or orientations between the apparatus and the three-dimensional structure.

    Abstract translation: 描述了一种用于测量三维结构的表面形貌的装置。 在许多实施例中,该装置被配置成将多个光束中的每一个聚焦到相对于该装置的相应的固定焦点位置。 该装置测量通过用光束照射三维结构而产生的多个返回光束中的每一个的特性。 测量该装置和三维结构之间的多个不同位置和/或取向的特性。 至少部分地基于对于设备和三维结构之间的多个不同位置和/或取向的返回光束的测量特性来确定三维结构的表面形貌。

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