摘要:
In a non-oriented electromagnetic steel sheet including about 0.01 wt % or less of C, about 1.0 wt % or less of Si, Mn in a range of about 0.1 wt % to 1.5 wt %, Al in a range of about 0.2 wt % to 1.5 wt %; the steel sheet having a critical amount of about 2 to 80 ppm rare earth metal, and the quantities of Ti and Zr in the steel sheet being limited to about 15 ppm or less of Ti, and about 80 ppm or less of Zr. The sheet exhibits excellent magnetic characteristics, such as iron loss, even when punched and laminated sheets are stress relief annealed at a low temperature for a short period of time.
摘要:
A process is disclosed for the production of a non-oriented electromagnetic steel strip having its magnetic characteristics uniformly retained in the product coil. The process involves by full- or semi-processing, hot rolling a steel slab containing not more than about 0.03% by weight of C, not more than about 3% by weight of Si and not more than about 2% by weight of Al such that the equation [Si wt %]+3 [Al wt %]-6 [C wt %] is in the range of about 0 to 2; and cold rolling the hot rolled steel strip in a known manner, followed optionally by finish annealing and also optionally by skin-pass rolling. The coil is finish rolled at a peripheral roll speed between about 500 to 1,500 mpm at the final stand. The peripheral roll speed at the final finish rolling stand is also controlled within a range of no more than about 300 mpm. Hot rolling is completed at a temperature Tf (.degree. C.) in an alpha-phase temperature zone and not less than about {750+30 ([Si wt %]+3 [Al wt %]-6 [C wt %])}.
摘要:
A cold-rolled steel sheet for deep drawing having an improved bake hardenability is disclosed, which comprises 0.005-0.015 wt% of C, not more than 1.0 wt% of Si, not more than 1.0 wt% of Mn, not more than 0.15 wt% of P, 0.0005-0.10 wt% of Al, not more than 0.003 wt% of S and not more than 0.004 wt% of N provided that S+N is not more than 0.005 wt%, and Ti satisfying 1.ltoreq.Ti*/C.ltoreq.20, in which Ti* (%)=Ti(%)-48/14N(%)-48/32S(%). Such a cold-rolled steel sheet is obtained by continuously annealing the steel sheet after the cold rolling, provided that a residence time over a temperature region above recrystallization temperature is within 300 seconds.
摘要:
Disclosed herein is a method of manufacturing a base steel sheet, which method comprises combined steps of: not rolling a steel slab containing not more than 0.0070% by weight of C (hereinafter referred to briefly as "%"), not more than 0.1% of Si, not more than 0.5% of Mn, 0.010 to 0.080% of Al, not more than 0.0050% of N, not more than 0.030% of S provided that the ratio of Mn/S is not less than 10, and not more than 0.030% of P while the hot rolling being terminated at a finish temperature of not less than 800.degree. C.; cold rolling thus obtained hot rolled steel sheet in an ordinary manner; continuously annealing the cold rolled steel sheet in which heating is done up to a temperature from a recrystallization temperature to 800.degree. C., followed by cooling; and then temper rolling the annealing steel sheet at a reduction of not less than 7% by using two or more stand rolling mill, whereby the thus obtained base sheet, to be surface-treated may be utilized for a tinplate or a tin free steel in which no stretcher strain is formed even after baking treatment.
摘要:
In a method of forming a pattern according to an embodiment, a first oblique linear pattern arranged at a first oblique angle with respect to a first parallel linear pattern and a second oblique linear pattern arranged at a second oblique angle with respect to the first parallel linear pattern are formed. Then, a pattern is formed in a region in which the first oblique linear pattern overlaps the second oblique linear pattern. A second parallel linear pattern is formed using the first parallel linear pattern and the pattern such that the second parallel linear pattern is divided by the overlap region. At least one of the first and second oblique angles is an angle other than a right angle.
摘要:
An electron beam recording apparatus is disclosed that records information onto the surface of a sample by using an electron beam. The electron beam recording apparatus includes an electron source that irradiates the electron beam, a magnetic detector that is configured to move onto and out of an irradiation axis and acquires magnetic information on the irradiation axis, a convergence position control part that calculates a convergence position correction amount for correcting a convergence position of the electron beam with respect to the surface of the sample based on the magnetic information, and a convergence position adjusting part that adjusts the convergence position of the electron beam with respect to the surface of the sample. The convergence position control part causes the convergence position adjusting part to adjust the convergence position of the electron beam with respect to the surface of the sample based on the convergence position correction amount.
摘要:
There is provided a renal disease testing method comprising a complex detection step of detecting a complex of human uromodulin and human IgA in a sample derived from urine collected from a subject. It is preferred that the renal disease testing method of the invention further comprises a determination step of assessing the whether the renal disease is IgA nephropathy based on the ratio of the amount of the complex detected in the complex detection step to the amount of urinary proteins in the sample. The renal disease testing method of the invention has good detection sensitivity and specificity, and can conveniently and safely assess the existence of a renal disease (preferably, IgA nephropathy).
摘要:
A photo mask formed with patterns to be transferred to a substrate using an exposure apparatus, the photo mask comprising a pattern row having three or more hole patterns surrounded by a shielding portion or a semitransparent film and arranged along one direction, and an assist pattern surrounded by the shielding portion or semitransparent film and having a longitudinal direction and a latitudinal direction, the assist pattern being located at a specified distance from the pattern row in a direction orthogonal to the one direction, the longitudinal direction of the assist pattern being substantially parallel with the one direction, the longitudinal length of the assist pattern being equivalent to or larger than the longitudinal length of the pattern row, the assist pattern being not transferred to the substrate.
摘要:
A photo mask formed with patterns to be transferred to a substrate using an exposure apparatus, the photo mask comprising a pattern row having three or more hole patterns surrounded by a shielding portion or a semitransparent film and arranged along one direction, and an assist pattern surrounded by the shielding portion or semitransparent film and having a longitudinal direction and a latitudinal direction, the assist pattern being located at a specified distance from the pattern row in a direction orthogonal to the one direction, the longitudinal direction of the assist pattern being substantially parallel with the one direction, the longitudinal length of the assist pattern being equivalent to or larger than the longitudinal length of the pattern row, the assist pattern being not transferred to the substrate.
摘要:
There is disclosed a mask pattern data forming method comprising arranging patterns with a minimum pitch in parallel or vertically in an X or Y direction, where directions diagonally connected with respect to respective centers of gravity of the double-pole or the quadrupole illumination are defined as the X and Y direction, classifying patterns or pattern groups with a pitch larger than the patterns with the minimum pitch into a pattern type with a pitch whose exposure margin is larger than that of the patterns with the minimum pitch and a pattern type with a pitch whose exposure margin is smaller than that of the patterns with the minimum pitch; and arranging patterns or pattern groups classified into the pattern type whose exposure margin is smaller than that of the patterns with the minimum pitch in a direction deflected by 45° or 135° from the patterns with the minimum pitch.