Testing of curved X-ray gratings
    53.
    发明授权

    公开(公告)号:US11421984B2

    公开(公告)日:2022-08-23

    申请号:US16955978

    申请日:2018-12-11

    Abstract: The present invention relates to a method, and a corresponding device, for testing a radius of curvature and/or for detecting inhomogeneities of a curved X-ray grating for a grating-based X-ray imaging device. The method comprises generating a beam of light diverging from a source point, propagating along a main optical axis and having a line-shaped beam profile. The method comprises reflecting the beam off a concave reflective surface of the grating. A principal axis of the concave reflective surface coincides with the main optical axis and the source point is at a predetermined distance from a point where the main optical axis intersects the concave reflective surface. The method comprises determining whether a projection of the reflected beam in a plane at or near the source point is present outside a central region around the source point, in which an absence of this projection outside the central region indicates that a radius of curvature of the concave reflective surface corresponds to the predetermined distance and/or that the reflective surface is substantially homogeneously curved along a curve formed by the beam impinging on the concave reflective surface.

    Test object for calibration of an x-ray imaging device

    公开(公告)号:US10813618B2

    公开(公告)日:2020-10-27

    申请号:US16307659

    申请日:2017-06-08

    Abstract: A calibration method and corresponding object for calibrating an X-ray imaging system with respect to dark field imaging is disclosed. The calibration object (1) generically comprises a plurality of sections (10, 20), wherein at least a part of the sections comprises two different materials, respectively. One material (101, 201) in a corresponding section leads to attenuation of passing X-ray beams and the other material (102, 202) is a dark field active material leading to small-angle scattering signals of incident X-rays. The ratio of the two materials in one section varies from section to section. The calibration object can be used to calibrate an X-ray imaging system with respect to a non-linear behavior of the dark field visibility.

    Apparatus for X-ray imaging an object

    公开(公告)号:US10779776B2

    公开(公告)日:2020-09-22

    申请号:US15779107

    申请日:2016-11-21

    Abstract: The present invention relates to an apparatus for X-ray imaging an object. It is described to provide (20) data relating to the detection of X-rays, wherein an X-ray detector is configured to be positioned relative to an X-ray source such that at least a part of a region between the X-ray source and the X-ray detector is an examination region for accommodating an object. An X-ray interferometer arrangement is configured to be positioned relative to the examination region. At least one X-ray dark field factor and at least one transmission factor are determined for the X-ray radiation transmitted through at least part of the object is determined. An intensity of X-ray radiation to be emitted towards the at least part of the object is controlled as a function of the determined at least one dark field factor and the determined at least one transmission factor.

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