Imaging with enhanced x-ray radiation

    公开(公告)号:US10765383B2

    公开(公告)日:2020-09-08

    申请号:US15743304

    申请日:2016-07-12

    Abstract: The invention relates to an X-ray imaging apparatus (2), comprising: a source (4) for generating X-ray radiation, an object receiving space (6) for arranging an object of interest for X-ray imaging, an X-ray collimator arrangement (8) arranged between the source (4) and the collimator arrangement (8), and an X-ray mirror arrangement (10). The mirror arrangement (10) comprises for example two tapered mirrors (22) facing each other and adapted for guiding X-ray radiation of the source (4) to the collimator arrangement (8). Consequently, the X-ray intensity at the object receiving space (6) is increased. In order to limit the X-ray radiation to an area, where the X-ray radiation can be utilized form imaging, an angle of spread Θm between the mirrors (22) and a length LM of each mirror (22) is adapted, such that a number of total reflections of X-ray radiation, provided by the source (4), at the mirrors (22) is limited. The limitation provides the effect that an angle of reflection Θr of the totally reflected X-ray radiation is limited. Consequently, an X-ray intensity at the object receiving space (6) is increased while constrains are provided, which prevent a large increase of a width of the X-ray radiation provided at the object receiving space (6), which effectively improves an imaging quality of an object of interest being arrangeable at the object receiving space (6).

    Correction in slit-scanning phase contrast imaging

    公开(公告)号:US09839407B2

    公开(公告)日:2017-12-12

    申请号:US14896783

    申请日:2014-06-27

    Abstract: The present invention relates to calibration in X-ray phase contrast imaging. In order to remove the disturbance due to individual gain factors, a calibration filter grating (10) for a slit-scanning X-ray phase contrast imaging arrangement is provided that comprises a first plurality of filter segments (11) comprising a filter material (12) and a second plurality of opening segments (13). The filter segments and the opening segments are arranged alternating as a filter pattern (15). The filter material is made from a material with structural elements (14) comprising structural parameters in the micrometer region. The filter grating is movably arranged between an X-ray source grating (54) and an analyzer grating (60) of an interferometer unit in a slit-scanning system of a phase contrast imaging arrangement. The slit-scanning system is provided with a pre-collimator (55) comprising a plurality of bars (57) and slits (59). The filter pattern is aligned with the pre-collimator pattern (61).

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