Method and apparatus for regulating a cooling device fitted to a switchgear cabinet

    公开(公告)号:US10172259B2

    公开(公告)日:2019-01-01

    申请号:US13261402

    申请日:2011-02-09

    IPC分类号: H05K7/20

    摘要: The invention relates to a method for regulating a cooling device fitted in or to a switchgear cabinet, by means of a regulating device, wherein the temperature of the switchgear cabinet interior air is detected and an interior fan assigned thereto for generating an interior air flow through an evaporator and providing cooling air is switched on if the detected temperature of the switchgear cabinet interior air exceeds an upper setpoint temperature, and is switched off if the detected temperature falls below a lower setpoint temperature, and the invention relates to an apparatus for carrying out the method. A reduced energy consumption and an increased service life with reliable operation are achieved by virtue of the fact that after the interior fan has been switched off owing to the lower setpoint temperature being undershot, a timekeeping is started and the interior fan is switched on after a predetermined first time duration for a predetermined second time duration and is then switched off again if the detected temperature still falls below the upper setpoint temperature, as long as the second time duration proceeds, that the intermittent time-controlled mode of operation of the interior fan is cyclically repeated until the upper setpoint temperature is exceeded, after which the interior fan is operated in continuous operation, and that the timekeeping and the intermittent time-controlled mode of operation of the interior fan are started anew if the lower setpoint temperature is undershot.

    METHOD AND APPARATUS FOR REGULATING A COOLING DEVICE FITTED TO A SWITCHGEAR CABINET
    52.
    发明申请
    METHOD AND APPARATUS FOR REGULATING A COOLING DEVICE FITTED TO A SWITCHGEAR CABINET 审中-公开
    用于调节连接到开关柜的冷却装置的方法和装置

    公开(公告)号:US20130037253A1

    公开(公告)日:2013-02-14

    申请号:US13261402

    申请日:2011-02-09

    IPC分类号: F25B49/00 H05K7/20

    CPC分类号: H05K7/20609 H05K7/207

    摘要: The invention relates to a method for regulating a cooling device fitted in or to a switchgear cabinet, by means of a regulating device, wherein the temperature of the switchgear cabinet interior air is detected and an interior fan assigned thereto for generating an interior air flow through an evaporator and providing cooling air is switched on if the detected temperature of the switchgear cabinet interior air exceeds an upper setpoint temperature, and is switched off if the detected temperature falls below a lower setpoint temperature, and the invention relates to an apparatus for carrying out the method. A reduced energy consumption and an increased service life with reliable operation are achieved by virtue of the fact that after the interior fan has been switched off owing to the lower setpoint temperature being undershot, a timekeeping is started and the interior fan is switched on after a predetermined first time duration for a predetermined second time duration and is then switched off again if the detected temperature still falls below the upper setpoint temperature, as long as the second time duration proceeds, that the intermittent time-controlled mode of operation of the interior fan is cyclically repeated until the upper setpoint temperature is exceeded, after which the interior fan is operated in continuous operation, and that the timekeeping and the intermittent time-controlled mode of operation of the interior fan are started anew if the lower setpoint temperature is undershot.

    摘要翻译: 本发明涉及一种通过调节装置来调节装配在开关柜中或与开关柜相连的冷却装置的方法,其中检测出开关柜内部空气的温度和分配给其的内部风扇以产生内部空气流通过 如果开关柜内部空气的检测温度超过上限设定点温度,则蒸发器和提供冷却空气被接通,并且如果检测到的温度低于较低设定点温度则关闭,本发明涉及一种用于执行 方法。 由于在内部风扇由于较低的设定点温度被关闭而关闭之后实现了可靠的操作,从而降低了能量消耗和延长了使用寿命,并开始计时,并且内部风扇在 预定的第一时间持续预定的第二持续时间,并且如果检测到的温度仍然低于上述设定点温度,则再次关闭,只要第二持续时间进行,内部风扇的间歇时间控制操作模式 循环重复,直到超过上限设定点温度,之后内部风扇连续运行,并且如果低于设定点温度较低,则内部风扇的计时和间歇时间控制运行模式将重新启动。

    CLIMATE CONTROL DEVICE
    53.
    发明申请
    CLIMATE CONTROL DEVICE 失效
    气候控制装置

    公开(公告)号:US20100107655A1

    公开(公告)日:2010-05-06

    申请号:US12311955

    申请日:2007-10-09

    IPC分类号: F25B21/02 F25D17/06 F28D1/00

    CPC分类号: F25B21/02 F25B2321/0252

    摘要: The invention relates to a climate control device having a cooling air outlet (10a) for cooled air (12a), and a heated air outlet (10b) for heated air (12b), wherein the air to be cooled (14a) is cooled by means of the cold side (16a) of a Peltier element arrangement (18) and is blown out by means of a cooling air feed device (20a) via the cooled air outlet (10a), and wherein the air to be heated (14b) is heated by means of the warm side (16b) of the Peltier element arrangement (18) and is blown out by means of a heated air feed device (20b) via the heated air outlet (10b). Each of the warm side (16b) and/or the cold side (16a) of the Peltier element arrangement (18) is coupled to a coolant circuit (22a; 22b), to which an air/fluid heat exchanger arrangement (28a; 28b) is connected. The device is used, for example, for cooling or ventilating a housing, particularly of a control cabinet.

    摘要翻译: 本发明涉及一种具有用于冷却空气(12a)的冷却空气出口(10a)和用于加热空气(12b)的加热空气出口(10b)的气候控制装置,其中待冷却空气(14a)由 平板元件装置(18)的冷侧(16a)的装置,并且经由冷却空气出口(10a)通过冷却空气供给装置(20a)吹出,并且其中待加热空气(14b) 通过珀尔帖元件装置(18)的暖侧(16b)加热,并通过加热空气出口(10b)通过加热空气供给装置(20b)吹出。 珀尔帖元件装置(18)的暖边(16b)和/或冷侧(16a)中的每一个联接到冷却剂回路(22a; 22b),空气/流体热交换器装置(28a; 28b ) 已连接。 该装置例如用于冷却或通风外壳,特别是控制柜。

    Gas-sensitive field-effect transistor with air gap
    55.
    发明授权
    Gas-sensitive field-effect transistor with air gap 失效
    具有气隙的气敏场效应晶体管

    公开(公告)号:US07459732B2

    公开(公告)日:2008-12-02

    申请号:US11396243

    申请日:2006-03-31

    IPC分类号: H01L27/108

    CPC分类号: G01N27/002 G01N27/414

    摘要: A gas-sensitive field-effect transistor may be formed from a substrate with a gas-sensitive layer and a transistor processed separately and then assembled. The substrate may be patterned to form spacers by which the height of an air gap between the transistor and the sensitive layer may be adjustable to a relatively precise degree. Formation of the spacers can be achieved by patterning the substrate using material-removal techniques. The height of the spacers may be adjusted in the layer thickness of the gas-sensitive layer and for the transistor fabricated using a CMOS process. Suitable techniques for producing recesses between the spacers include, for example, polishing, cutting, sandblasting, lithographic dry etching, or wet-chemical etching. Suitable materials for the substrate may include, for example, glass, ceramic, aluminum oxide, silicon, or a dimensionally stable polymer. Following preparation of the substrate and the transistor, the two elements of the transistor are joined, for example, using flip-chip methods or adhesive-bonding technology.

    摘要翻译: 气体敏感场效应晶体管可以由具有气体敏感层的衬底和分开处理的晶体管形成,然后组装。 衬底可以被图案化以形成间隔物,通过该间隔物,晶体管和敏感层之间的气隙的高度可以相对精确地调节。 可以通过使用材料去除技术对衬底进行图案化来实现间隔物的形成。 间隔物的高度可以在气敏层的层厚度和使用CMOS工艺制造的晶体管中进行调整。 用于在间隔件之间产生凹槽的合适技术包括例如抛光,切割,喷砂,光刻干蚀刻或湿法化学蚀刻。 用于基材的合适材料可以包括例如玻璃,陶瓷,氧化铝,硅或尺寸稳定的聚合物。 在准备衬底和晶体管之后,晶体管的两个元件例如使用倒装芯片方法或粘接技术连接。

    Method for initialization of electronic circuit units, and electric circuit
    56.
    发明授权
    Method for initialization of electronic circuit units, and electric circuit 有权
    电子电路单元初始化方法及电路

    公开(公告)号:US07449925B2

    公开(公告)日:2008-11-11

    申请号:US11392522

    申请日:2006-03-29

    IPC分类号: H03L7/00

    摘要: In a method for initializing at least one electronic circuit unit of an electric circuit, a supply voltage is applied to a power supply connection unit of the electronic circuit in order to supply electrical power to the electronic circuit unit. A reference signal is applied to the electronic circuit unit via a reference signal connection unit. A blocking unit connected to the reference signal connection unit blocks the electronic circuit unit until the reference signal is supplied. An input signal to the electronic circuit unit is supplied via an input signal connection unit of the electronic circuit and an output signal is output by an output signal connection unit of the electronic circuit. The output signal is dependent on the input signal and the reference signal supplied to the electronic circuit unit.

    摘要翻译: 在用于初始化电路的至少一个电子电路单元的方法中,将电源电压施加到电子电路的电源连接单元,以向电子电路单元提供电力。 参考信号通过参考信号连接单元施加到电子电路单元。 连接到参考信号连接单元的阻挡单元阻止电子电路单元直到提供参考信号。 通过电子电路的输入信号连接单元提供到电子电路单元的输入信号,并且由电子电路的输出信号连接单元输出输出信号。 输出信号取决于提供给电子电路单元的输入信号和参考信号。

    SEMICONDUCTOR MEMORY DEVICE AND METHOD
    57.
    发明申请
    SEMICONDUCTOR MEMORY DEVICE AND METHOD 审中-公开
    半导体存储器件和方法

    公开(公告)号:US20080155313A1

    公开(公告)日:2008-06-26

    申请号:US11958976

    申请日:2007-12-18

    IPC分类号: G06F11/00

    CPC分类号: G11C29/4401 G11C29/84

    摘要: A semiconductor memory device with redundant memory cells and a method for operating a semiconductor memory device is disclosed. One embodiment provides at least one memory cell and at least one redundant memory cell. The method includes reading out data written in the memory cell; determining whether the read-out data concur with target data; reprogramming or reconfiguring, respectively, the semiconductor device, so that the redundant memory cell replaces the memory cell if the read-out data do not concur with the target data; and writing the target data in the redundant memory cell already during the reprogramming or reconfiguring, respectively.

    摘要翻译: 公开了一种具有冗余存储单元的半导体存储器件和用于操作半导体存储器件的方法。 一个实施例提供至少一个存储器单元和至少一个冗余存储单元。 该方法包括读出写入存储单元的数据; 确定读出的数据是否与目标数据一致; 重新编程或重新配置半导体器件,使得如果读出的数据不符合目标数据,则冗余存储器单元替换存储器单元; 并且分别在重新编程或重新配置期间将目标数据写入冗余存储器单元中。

    IC Chip Package, Test Equipment and Interface for Performing a Functional Test of a Chip Contained Within Said Chip Package
    58.
    发明申请
    IC Chip Package, Test Equipment and Interface for Performing a Functional Test of a Chip Contained Within Said Chip Package 审中-公开
    IC芯片封装,用于执行所述芯片封装内包含的芯片的功能测试的测试设备和接口

    公开(公告)号:US20080079455A1

    公开(公告)日:2008-04-03

    申请号:US11866677

    申请日:2007-10-03

    IPC分类号: G01R31/26

    摘要: An interface between a test access port of an integrated circuit chip and a test equipment, which is designed to perform a functional test of the chip, is provided. The interface includes electric pads on either sides of the chip and the test equipment. The pads are arranged to interact by means of capacitive coupling, when a test data signal is input to one of the pads. Preferably, both pads are connected with either a receiver or a driver depending on the direction of the data flow. The electric pads relating to the chip's side may be arranged within the wiring substrate of a chip package, particularly along edge portion of the substrate, which encompasses an inner portion of the substrate, in which a ball-grid-array can be formed.

    摘要翻译: 提供集成电路芯片的测试访问端口和被设计用于执行芯片的功能测试的测试设备之间的接口。 接口包括芯片两侧的电焊盘和测试设备。 当测试数据信号被输入到其中一个焊盘时,焊盘被布置成通过电容耦合相互作用。 优选地,两个焊盘根据数据流的方向与接收器或驱动器连接。 与芯片侧相关的电焊盘可以布置在芯片封装的布线基板内,特别是沿着基板的边缘部分,其包围可以形成球栅阵列的基板的内部。

    METHOD AND SYSTEM FOR TESTING A MEMORY DEVICE
    59.
    发明申请
    METHOD AND SYSTEM FOR TESTING A MEMORY DEVICE 审中-公开
    用于测试存储器件的方法和系统

    公开(公告)号:US20070250745A1

    公开(公告)日:2007-10-25

    申请号:US11735176

    申请日:2007-04-13

    IPC分类号: G11C29/00

    摘要: A system and method for testing a memory device is disclosed. One embodiment includes a plurality of memory cells. Each of the memory cells can be controlled by an address. A test memory for storing test results is provided. An address comparing unit is configured to determine whether the address of a memory cell lies in a predetermined address space. A controllable unit for storing test results is connected with the test memory and the address comparing unit. The controllable unit is controlled by the address comparing unit such that error information of the tested memory cell is only stored in the test memory if the address of the tested memory cell lies in the selected address space.

    摘要翻译: 公开了一种用于测试存储器件的系统和方法。 一个实施例包括多个存储单元。 每个存储单元都可以通过地址进行控制。 提供了用于存储测试结果的测试存储器。 地址比较单元被配置为确定存储器单元的地址是否位于预定的地址空间中。 用于存储测试结果的可控单元与测试存储器和地址比较单元连接。 可控单元由地址比较单元控制,使得所测试的存储器单元的错误信息仅存储在测试存储器中,如果所测试的存储器单元的地址位于所选择的地址空间中。

    Gas-sensitive field-effect transistor with air gap
    60.
    发明申请
    Gas-sensitive field-effect transistor with air gap 失效
    具有气隙的气敏场效应晶体管

    公开(公告)号:US20060260737A1

    公开(公告)日:2006-11-23

    申请号:US11396243

    申请日:2006-03-31

    IPC分类号: B32B37/00

    CPC分类号: G01N27/002 G01N27/414

    摘要: A gas-sensitive field-effect transistor may be formed from a substrate with a gas-sensitive layer and a transistor processed separately and then assembled. The substrate may be patterned to form spacers by which the height of an air gap between the transistor and the sensitive layer may be adjustable to a relatively precise degree. Formation of the spacers can be achieved by patterning the substrate using material-removal techniques. The height of the spacers may be adjusted in the layer thickness of the gas-sensitive layer and for the transistor fabricated using a CMOS process. Suitable techniques for producing recesses between the spacers include, for example, polishing, cutting, sandblasting, lithographic dry etching, or wet-chemical etching. Suitable materials for the substrate may include, for example, glass, ceramic, aluminum oxide, silicon, or a dimensionally stable polymer. Following preparation of the substrate and the transistor, the two elements of the transistor are joined, for example, using flip-chip methods or adhesive-bonding technology.

    摘要翻译: 气体敏感场效应晶体管可以由具有气体敏感层的衬底和分开处理的晶体管形成,然后组装。 衬底可以被图案化以形成间隔物,通过该间隔物,晶体管和敏感层之间的气隙的高度可以相对精确地调节。 可以通过使用材料去除技术对衬底进行图案化来实现间隔物的形成。 间隔物的高度可以在气敏层的层厚度和使用CMOS工艺制造的晶体管中进行调整。 用于在间隔件之间产生凹槽的合适技术包括例如抛光,切割,喷砂,光刻干蚀刻或湿法化学蚀刻。 用于基材的合适材料可以包括例如玻璃,陶瓷,氧化铝,硅或尺寸稳定的聚合物。 在准备衬底和晶体管之后,晶体管的两个元件例如使用倒装芯片方法或粘接技术连接。