摘要:
According to an aspect of the present invention, there is provided a voltage step-down circuit including: a first NMOS connected between an external and an internal power-supply voltages through a PMOS turned ON during an active state and turned OFF during a standby state; a second NMOS connected between the external and the internal power-supply voltages; and a current control circuit that sinks a current from the internal power-supply voltage to a ground level for a certain period of time after an operation state is switched from the active state to the standby state.
摘要:
A voltage generating circuit comprising: a switching device which includes a first end connected to a high potential side power source, and which becomes conductive in a first mode and becomes non-conductive in a second mode; a first transistor including a first main electrode connected to a second end of the switching device, a second main electrode connected to an output terminal, and a gate connected to a gate potential supply node; a second transistor including a first main electrode connected to the high potential side power source, a second main electrode connected to the output terminal, and a gate connected to the gate potential supply node; and a gate voltage stabilizing circuit that suppresses a fluctuation in potential of the potential supply node, the fluctuation accompanying a change between the first and second modes.
摘要:
According to an aspect of the invention, there is provided, a semiconductor device, including an internal voltage generation circuit generating a prescribed voltage, a first test circuit connecting to a voltage-supplying wiring, one end of the voltage-supplying wiring being connected to a source wiring and the other end of the voltage-supplying wiring being connected to the internal voltage generation circuit, the first test circuit being supplied an outer voltage from the source wiring and a voltage of the internal voltage generation circuit through the voltage-supplying wiring, the first test circuit generating a prescribed resistance value on a basis of a control input from an outer portion in a test mode.
摘要:
According to an aspect of the present invention, there is provided a voltage generation circuit including: first and second reference terminals to output first and second reference voltages, respectively; first PMOS and first NMOS transistors connected between high and low level power supply lines in series; an output terminal connected between the first PMOS and first NMOS transistors; a first operational amplifier including: first input terminals each including a gate of a PMOS transistor to be connected to one of the second reference terminal and the output terminal, and a first output terminal connected to the first PMOS transistor; and a second operational amplifier including: second input terminals each including a gate of an NMOS transistor to be connected to one of the first reference terminal and the output terminal, and a second output terminal connected to the first NMOS transistor.
摘要:
A memory includes a memory cell array including destructive read-out type memory cells; a decoder selecting a cell; a sense amplifier configured to detect the data; and a read and write controller controlling a read operation and a write operation, wherein the read and write controller outputs a logical value of a write enable signal at the start of the read operation in a first period and makes the write enable signal invalid after the read operation starts during the first period, on the basis of the write enable signal and a restore signal keeping an activated state during the first period, the write enable signal being a signal allowing the write operation, the first period being a period from when the read operation starts to when a restore operation for writing the data back to the memory cell is completed.
摘要:
A discharge order control circuit includes a pool circuit, a delay circuit and a discharge unit to control a discharge order of internal power supplies. The pool circuit stores electric charges provided from a potential of an external power supply. The delay circuit operates on the electric charges stored in the pool circuit and delays a discharge signal generated when potential of the external power supply is lowered to a predetermined potential level. The delay circuit includes an inverter array having a plurality of stages each containing an inverter. The plurality of stages include a final stage that outputs the delayed discharge signal. Only the inverter of the final stage generates an RC delay. The discharge unit discharges a internal power supply included in the internal power supplies in response to the delayed discharge signal output from the inverter of the final stage of the inverter array.
摘要:
A supply voltage sensing circuit comprises an internal power supply circuit, which provides a constant output voltage regardless of the supply voltage. A delay circuit generates a delayed signal by delaying a variation in the output voltage. A divider circuit generates a divided voltage by dividing the supply voltage at a certain division ratio. A p-type MOS transistor has a source given the delayed signal and a gate given the divided voltage and turns on when the supply voltage lowers below a certain value. An output circuit provides an output voltage based on a drain voltage on the p-type MOS transistor.
摘要:
A dummy capacitor drive potential VDC is given to one electrode of a dummy capacitor, and a reference potential for determining a data value of a memory cell is generated in the other electrode thereof. A potential generator circuit for generating the potential VDC is composed of a BGR circuit outputting a potential VBGRTEMP having temperature dependency, and resistors R3 and R4, which are series-connected between an output terminal of the BGR circuit and a ground point. The potential VDC is output from a connection point of the resistors R3 and R4. Temperature dependency of the potential VDC is adjusted based on a resistance ratio of resistors R1-1, R1-2 and R2, and the absolute value is adjusted based on a resistance ratio of resistors R3 and R4.
摘要:
A ferroelectric memory comprising a plurality of memory cells each including a ferroelectric capacitor and a switch transistor, and operating in a test mode in which, after polarized data is written into the memory cell by applying a first electric potential difference between both electrodes of ferroelectric capacitors of the plurality of memory cells, and before reading of the polarized data from the memory cells is carried out, a second electric potential difference smaller than the first electric potential difference is applied between both the electrodes of the ferroelectric capacitors in a direction opposite to that at the time of writing the polarized data.
摘要:
A semiconductor integrated circuit device includes first and second bit lines (BLs), first and second plate lines (PLs), a first series connected TC unit type structure connected between the first BL and the first PL, a second series connected TC unit type structure connected between the second BL and the second PL, a PL potential control circuit, and a BL potential control circuit. The PL potential control circuit controls a potential of the first PL from a first potential to a second potential and a potential of the second PL from the first potential to a third potential, when the first series connected TC unit type structure is selected. The BL potential control circuit controls a potential of the second BL to the third potential, after charges are transferred from the first series connected TC unit type structure to the first BL.