Surface examining apparatus for detecting the presence of foreign
particles on two or more surfaces
    62.
    发明授权
    Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces 失效
    表面检查装置,用于检测两个或多个表面上的外来颗粒的存在

    公开(公告)号:US4886975A

    公开(公告)日:1989-12-12

    申请号:US348177

    申请日:1989-05-02

    IPC分类号: G01N21/94 G01N21/956

    摘要: An apparatus usable with an object having surfaces, for examining the states of the surfaces, includes on irradiating system for irradiating the surfaces of the object with a single light beam, and a plurality of light-receiving systems provided in association with the surfaces of the object, respectively, the plural light-receiving systems being arranged to receive light scatteringly reflected from the surfaces of the object, respectively, and to produce outputs corresponding to the states of the surfaces of the object, respectively.

    摘要翻译: 可用于具有用于检查表面状态的表面的物体的装置包括用于用单个光束照射物体的表面的照射系统,以及与所述物体的表面相关联地设置的多个光接收系统 目的是分别将多个光接收系统分别接收从物体的表面散射地反射的光,并分别产生与物体的表面的状态相对应的输出。