摘要:
A Digital Design Method which may be automated is for obtaining timing closure in the design of large, complex, high-performance digital integrated circuits. The methodincludes the use of a tuner on random logic macros that adjusts transistor sizes in a continuous domain. To accommodate this tuning, logic gates are mapped to parameterized cells for the tuning and then back to fixed gates after the tuning. Tuning is constrained in such a way as to minimize “binning errors” when the design is mapped back to fixed cells. Further, the critical sections of the circuit are marked in order to make the optimization more effective and to fit within the problem-size constraints of the tuner. A specially formulated objective function is employed during the tuning to promote faster global timing convergence, despite possibly incorrect initial timing budgets. The specially formulated objective function targets all paths that are failing timing, with appropriate weighting, rather than just targeting the most critical path. Finally, the addition of multiple threshold voltage gates allows for increased performance while limiting leakage power.
摘要:
Disclosed is a method for enhanced efficiency and effectiveness in achieving timing closure of large, complex, high-performance digital integrated circuits. Circuit macros are re-optimized and re-tuned in the timing closure loop by means of a reformulated objective function that allows the optimizer to improve the slack of all signals rather than just the most critical one(s). The incentive to improve the timing of a sub-critical signal is a diminishing function of the criticality of the signal. Thus all signals are improved during the optimization, with the highest incentive to improve on the most critical signals, leading to faster and more effective overall timing closure.
摘要:
A method for performing a static timing analysis on an integrated circuit chip or module taking into account the effect of wiring interconnection coupling is described. The wiring interactions are modeled as appropriate equivalent grounded capacitances, allowing traditional delay calculation methods to be applied. The method includes the steps of assigning a pessimistic value to the wiring coupling interaction between nets forming the integrated circuit chip; performing the static timing analysis using computed timing parameters which are a function of net capacitance, the net capacitance being based on the pessimistic value of the coupling interaction between the nets; updating the net capacitance of selected nets based on 1) an overlap between an arrival time window of each of the selected nets and a possible arrival time window of each of the other nets which are coupled to the each of selected nets, and 2) on the slew of each of the selected nets and the slew of each of the other nets which are coupled to the selected nets; and updating the static timing analysis based on the updated net capacitances of the selected nets.
摘要:
A method for analyzing and optimizing a design, such as a circuit design, which relates to the application of at least one optimization procedure, evaluating the benefit and net cost of the optimization procedure and then through the checkpoint manager, recording and reversing changes of the design. The execution and reversal of multiple optimizations may occur in a trial mode followed by evaluation of the executed and reversed designs and then the reinstatement of the best optimization.
摘要:
A system, method and program product for modeling load effects of a load CCC (channel connected component) in a transistor network. A system is disclosed that includes an analysis system that determines allowable logical state and transition functions for nets in a load CCC for a transition or state of a driving CCC for which a load condition is being determined; a trace system that traverses paths in the load CCC from a set of input terminals; and an element replacement system that replaces circuit elements in the load CCC to create a modeled CCC, wherein a circuit element replacement is based on a type of circuit element encountered along a trace, and state and transition functions of nets connected to an encountered circuit element.
摘要:
A system, method and program product for modeling load effects of a load CCC (channel connected component) in a transistor network. A system is disclosed that includes an analysis system that determines allowable logical state and transition functions for nets in a load CCC for a transition or state of a driving CCC for which a load condition is being determined; a trace system that traverses paths in the load CCC from a set of input terminals; and an element replacement system that replaces circuit elements in the load CCC to create a modeled CCC, wherein a circuit element replacement is based on a type of circuit element encountered along a trace, and state and transition functions of nets connected to an encountered circuit element.
摘要:
A method and a system for validating clock skews during a hierarchical static timing analysis of a chip or multi-chip package. Each pair of clock inputs of a hierarchical module bounds the allowable clock skew, creating new relative constraints on clock input arrival times propagated to those clock inputs. One embodiment is based on asserted arrival times and a maximum of computed slack values at said clock inputs, while a second embodiment is based on asserted arrival times and a minimum of downstream test slack values. The method further converts module clock assertions into a set of relative timing constraints to allow a hierarchical timing sign-off even in circumstances where absolute timing arrivals are not totally known at the time of module analysis.
摘要:
Disclosed are embodiments of a system and of an associated method for estimating the leakage current of an electronic circuit. The embodiments analyze a layout of an electronic circuit in order to identify all driven and non-driven nets within the electronic circuit, to identify all of the driven net-bounded partitions within the electronic circuit (based on the driven and non-driven nets), and to identify, for each driven net-bounded partition, all possible states of the electronic circuit that can leak. Then, using this information, the embodiments estimate the leakage current of the electronic circuit. This is accomplished by first determining, for each state of each driven net-bounded partition, a leakage current of the driven net-bounded partition and a probability that the state will occur in the driven net-bounded partition during operation of the electronic circuit. Then, for each state of each driven net-bounded partition, the leakage current of the driven net-bounded partition and the state probability are multiplied together. The results are then aggregated.
摘要:
A method of optimizing timing of signals within an integrated circuit design using proxy slack values propagates signals through the integrated circuit design to output timing signals. For early mode timing analysis, the method sets an early proxy slack value to zero if the late slack value is less than zero. Otherwise, if the late slack value is not less than zero, the method restricts the early proxy slack value to a maximum of the early slack value and the negative of the late slack value. To the contrary, for late mode timing analysis, the method sets a late proxy slack value to zero if the early slack value is less than zero. Otherwise, if the early proxy slack value is not less than zero, the method restricts the late proxy slack value to a maximum of the late slack value and the negative of the early slack value.
摘要:
A method for automatically generating test patterns for digital logic circuitry using an automatic test pattern generation tool. The method includes generating test patterns and applying faulty behavior to various paths within the digital logic circuitry. As each circuit path is tested, tested circuit nodes along the circuit path are marked as “exercised.” Subsequent test paths are assembled by avoiding marked circuit nodes. In this manner, coverage of paths tested may be increased and many circuit nodes can be tested efficiently.