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公开(公告)号：US20120242944A1
公开(公告)日：2012-09-27
申请号：US13423592
申请日：2012-03-19
申请人： Yutaka Tsuchiya
发明人： Yutaka Tsuchiya
IPC分类号： G02F1/1339
CPC分类号： G02F1/1343 , G02F2001/133337 , G02F2001/133388 , G02F2201/501
摘要： A liquid crystal device includes a first substrate and a second substrate disposed so as to be opposite to each other, a liquid crystal layer interposed between the first substrate and the second substrate, a sealing material surrounding the liquid crystal layer and adhering the first substrate to the second substrate, a pixel region provided in a region surrounded by the sealing material, and a trap portion disposed between the pixel region and the sealing material. The trap portion includes a first electrode formed on the first substrate, a second electrode disposed to overlap the first electrode, and an insulating layer formed between the first electrode and the second electrode, and traps impurities in the liquid crystal layer by an electric field generated between the first electrode and the second electrode.
摘要翻译： 液晶装置包括：第一基板和设置成彼此相对布置的第二基板;介于第一基板和第二基板之间的液晶层;围绕液晶层的密封材料，并将第一基板粘附到 第二基板，设置在由密封材料包围的区域中的像素区域和设置在像素区域和密封材料之间的捕获部分。 陷波部包括形成在第一基板上的第一电极，与第一电极重叠设置的第二电极和形成在第一电极和第二电极之间的绝缘层，并且通过产生的电场捕获液晶层中的杂质 在第一电极和第二电极之间。
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公开(公告)号：US07135815B2
公开(公告)日：2006-11-14
申请号：US10384648
申请日：2003-03-11
申请人： Yutaka Tsuchiya
发明人： Yutaka Tsuchiya
CPC分类号： G02F1/133603 , G02F2001/133616 , H01L51/52 , H01L51/5246 , H01L51/5262 , H01L51/5281
摘要： The invention provides an organic EL device that includes light-transmitting portions having a high transmittance factor and is suitable to light display units, a method for readily manufacturing such an organic EL device with a high yield, and a display unit including the organic EL device. An organic electroluminescent device includes a support substrate and an element region, disposed on the support substrate, including emissive portions and openings. The emissive portions each include an anode, an emissive layer containing an organic electroluminescent material, and a cathode that are arranged in that order and emit light rays to an irradiated body. The openings extend through the element region, and the emitted rays are reflected by the irradiated body to pass through the openings to form an image.
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73.发明授权Concentration measuring method and apparatus for absorption component in scattering medium 有权散射介质中吸收组分的浓度测量方法和装置公开(公告)号：US06567165B1
公开(公告)日：2003-05-20
申请号：US09672832
申请日：2000-09-29
申请人： Yutaka Tsuchiya , Tsuneyuki Urakami
发明人： Yutaka Tsuchiya , Tsuneyuki Urakami
IPC分类号： G01N2100
CPC分类号： G01N21/49
摘要： A concentration measuring apparatus for an absorption component in a scattering medium includes a light source (2) for generating at least two light rays having predetermined wavelengths, the light rays having different transport scattering coefficients for a scattering medium (20) as an object to be measured, and a known ratio of the transport scattering coefficients; light incidence means (6) for making the light rays incident from a light incident position into the scattering medium (20); photodetection means (12), (13) for detecting the light ray which has propagated inside the scattering medium (20) at at least one photodetection position different from the light incident position to acquire at least one photodetection signal; parameter detection means (15) for detecting, on the basis of the photodetection signal, a light intensity and a mean flight pathlength at the light detection position for each of the at least two light rays having predetermined wavelengths; and arithmetic processing means (16) for calculating a concentration of an absorption component on the basis of a predetermined relationship between the ratio of the transport scattering coefficients, the light intensity, the mean flight pathlength, and a difference between absorption coefficients per unit concentration of the absorption component for the at least two light rays having predetermined wavelengths.
摘要翻译： 用于散射介质中的吸收组分的浓度测量装置包括用于产生具有预定波长的至少两个光线的光源（2），作为对象的散射介质（20）具有不同的传输散射系数的光线 测量和已知的传输散射系数比; 光入射装置（6），用于使来自光入射位置的光线入射到散射介质（20）中; 用于检测在与所述光入射位置不同的至少一个光电检测位置在所述散射介质（20）内传播的光线的光检测装置（12），（13），以获取至少一个光电检测信号; 参考检测装置（15），用于根据所述光检测信号，针对具有预定波长的所述至少两个光线检测所述光检测位置处的光强度和平均飞行路径长度; 以及运算处理装置（16），用于基于传输散射系数的比率，光强度，平均飞行路径长度以及每单位浓度的吸收系数之间的预定关系来计算吸收分量的浓度 所述至少两个具有预定波长的光线的吸收分量。
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74.发明授权Optical measuring method and an optical measuring apparatus for determining the internal structure of an object 失效光学测量方法和用于确定物体的内部结构的光学测量装置
公开(公告)号：US5774223A
公开(公告)日：1998-06-30
申请号：US703766
申请日：1996-08-27
CPC分类号： A61B5/0059
摘要： An optical measuring method and an optical measuring apparatus are capable of obtaining the true mean time delay of a light waveform within a short time for the purpose of obtaining information on the internal structure of an object. Calculations include a first mean time delay when the light path includes the object, a second mean time delay when the light path does not include the object, and a subtraction of the second mean time delay from the first mean time delay to obtain a true mean time delay.
摘要翻译： 光学测量方法和光学测量装置能够在短时间内获得光波形的真实平均时间延迟，以获得关于对象的内部结构的信息。 计算包括当光路包括物体时的第一平均时间延迟，当光路不包括物体时的第二平均时间延迟，以及从第一平均时间延迟减去第二平均时间延迟以获得真实平均值 时间延迟
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公开(公告)号：US5767688A
公开(公告)日：1998-06-16
申请号：US597267
申请日：1996-02-06
IPC分类号： G01R15/24 , G01R1/07 , G01R19/00 , G01R31/302 , G01R31/311 , G01R31/308
CPC分类号： G01R1/071 , G01R15/242 , G01R31/311
摘要： A processing unit notifies a drive unit of a designated number N (=1, 2, . . . ) The drive unit supplies a drive signal of a frequency f.sub.0 to a target measurement device, and supplies a modulation signal of a frequency N.multidot.f.sub.0 +.DELTA.f to a light source. In this state, an intensity-modulated light beam is emitted from a light source, incident on an E-O probe through an optical system including a PBS and a wave plate, influenced by a periodical voltage waveform generated at a target measurement portion at a fundamental period 1/f.sub.0 to modulate the polarized state, and output from the E-O probe. The optical signal whose polarized state is modulated is input to a photodetector after a polarization direction is selected by the PBS, and heterodyne-detected. The processing unit reproduces the waveform of the voltage signal generated at the target measurement portion by Fourier transform on the basis of the obtained calculation of photodetection signal and displays the waveform.
摘要翻译： 处理单元向驱动单元通知指定数量N（= 1,2，...）。驱动单元向目标测量装置提供频率为f0的驱动信号，并且提供频率为Nxf0 + DELTA f的调制信号 到光源。 在这种状态下，强度调制光束从光源发射，通过包括PBS和波片的光学系统入射到EO探测器，受到在基本周期的目标测量部分产生的周期性电压波形的影响 1 / f0来调制极化状态，并从EO探头输出。 将偏振态调制的光信号通过PBS选择偏振方向后输入到光检测器，并进行外差检测。 处理单元根据获得的光检测信号的计算，通过傅里叶变换在目标测量部分产生的电压信号的波形再现，并显示波形。
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公开(公告)号：US5529065A
公开(公告)日：1996-06-25
申请号：US251969
申请日：1994-06-01
申请人： Yutaka Tsuchiya
发明人： Yutaka Tsuchiya
CPC分类号： G01N21/49 , A61B5/0059 , A61B2562/0242 , A61B5/7242
摘要： A method of measuring internal information in a scattering medium and an apparatus for the same of the present invention measure internal information in the scattering medium by measuring light diffused during propagation in the scattering medium at outside of the scattering medium while receiving the influence of the scattering and absorption, and performing arithmetic processing to the measured values. At this time, the three or more kinds of the detected signals (measured values) detected at a plurality of distances between the light incident position and the photodetection point for the light having a plurality of predetermined wavelengths are processed by utilizing dependencies of the behavior of light diffused during propagation in the scattering medium and the resulting signal, i.e., a photodetection signal on characteristics such as a scattering constituent, or an absorption constituent in the scattering medium and their concentration. If the measurement is performed at a plurality of wavelenghts on an object to be measured, a ratio of absorption coefficients and a ratio of concentrations of specified absorptive constituents in scattering medium can be measured.
摘要翻译： 测量散射介质中的内部信息的方法及其装置本发明的测量方法是通过在散射介质的外侧测量在散射介质的散射介质中扩散的光，同时接收散射的影响来测量散射介质中的内部信息 并进行吸收，并对所测量的值进行运算处理。 此时，通过利用具有多个预定波长的光的光入射位置和光检测点之间的多个距离处检测到的三种或更多种检测信号（测量值），通过利用 在散射介质中传播期间的光扩散，以及所得到的信号，即关于散射成分或散射介质中的吸收成分等特性的光电检测信号及其浓度。 如果在被测量物体上的多个波长进行测量，则可以测定吸收系数与散射介质中规定的吸收成分的浓度比。
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77.发明授权Method for measuring internal information in scattering medium and apparatus for the same 失效用于测量散射介质内部信息的方法及其装置
公开(公告)号：US5517987A
公开(公告)日：1996-05-21
申请号：US252227
申请日：1994-06-01
申请人： Yutaka Tsuchiya
发明人： Yutaka Tsuchiya
CPC分类号： G01N21/49
摘要： A method of measuring internal information in a scattering medium, and an apparatus for the same of the present invention measure internal information in the scattering medium by measuring light diffused during propagation in the scattering medium while receiving the influence of the scattering and absorption, and performing arithmetic processing to the measured values. At this time, the three or more kinds of the detected signals (measured values) measured at three or more different kinds of distances between the light incident position and the photodetection point are processed by utilizing dependencies of the behavior of light diffused during propagation in the scattering medium and the resulting signal, that is, a photodetection signal on characteristics such as a scattering constituent, or an absorption constituent in the scattering medium and the concentration. The measured internal information is the absolute value of a scattering coefficient or a transport scattering coefficient of the scattering medium, and the information associated with a specified scattering constituent or a specified absorption constituent can be measured by processing the measured internal information.
摘要翻译： 一种测量散射介质中的内部信息的方法，以及本发明的装置，在接收散射和吸收的影响的同时，通过测量在散射介质中传播期间扩散的光来测量散射介质中的内部信息，并执行 算术处理到测量值。 此时，通过利用在光入射位置与光检测点之间的三个以上不同种类的距离测量的三种或更多种检测信号（测量值），通过利用在传播期间扩散的光的行为的依赖性来处理 散射介质和所得到的信号，即散射介质等特性，散射介质中的吸收成分和浓度等的光检测信号。 所测量的内部信息是散射介质的散射系数或传输散射系数的绝对值，并且可以通过处理所测量的内部信息来测量与特定散射成分或特定吸收成分相关联的信息。
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公开(公告)号：US5479106A
公开(公告)日：1995-12-26
申请号：US313805
申请日：1994-09-28
CPC分类号： G01R1/071 , G01R31/308
摘要： To provide an E-O probe which can measure a voltage distribution in a fine region while enlarging it. A grounded, transparent electrode 2 and an electrooptic member 3 such as LiTaO.sub.3 are successively fixed to and below a support 1. There are a plurality of conical, conductive members 5a-5e arranged below a reflection film 4 in such a manner that the bottom surfaces thereof are fixed to the lower surface of the reflection film 4 and that the lower ends thereof project downward. Spaces between the plural, linear, electric needles 5a-5e become narrower toward a measured object located below them, whereby voltages in a fine region in the measured object can be guided as enlarged to the electrooptic member 3.
摘要翻译： 提供一种E-O探头，可以在放大时测量精细区域的电压分布。 接地的透明电极2和诸如LiTaO 3的电光元件3依次固定在支撑体1上和下方。在反射膜4的下方设置有多个锥形的导电构件5a-5e， 被固定到反射膜4的下表面，并且其下端向下突出。 多个线性电针5a-5e之间的空间朝向位于其下方的测量对象变窄，由此可以将测量对象中的细微区域中的电压扩大地引导到电光构件3。
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公开(公告)号：US5071249A
公开(公告)日：1991-12-10
申请号：US416774
申请日：1989-10-04
申请人： Akira Takahashi , Musubu Koishi , Yutaka Tsuchiya
发明人： Akira Takahashi , Musubu Koishi , Yutaka Tsuchiya
CPC分类号： G01N21/6408 , G01J2001/442 , G01J2011/005
摘要： A wavelength of light emitted from a semiconductor laser is shifted to a shorter wavelength with wavelength converting means and the resulting light of a shorter wavelength is applied to a sample. Upon exposure to the light of the shorter wavelength, the sample emits light of interest and its waveform is measured with measuring means. Fundamental wavelength laser light which passes through the waveform converting means is outputted therefrom in synchronism with the light of a shorter wavelength and detected by a first photodetector. The waveform of the light of interest can be measured correctly on the basis of an output signal from the first photodetector.
摘要翻译： 使用波长转换装置将从半导体激光器发射的光的波长移动到较短的波长，并将所得到的较短波长的光施加到样品。 当暴露于较短波长的光时，样品发射感兴趣的光，其波形用测量装置测量。 通过波形转换装置的基波长激光与较短波长的光同步地由第一光电检测器检测。 可以基于来自第一光电检测器的输出信号正确地测量感兴趣的光的波形。
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公开(公告)号：US5055770A
公开(公告)日：1991-10-08
申请号：US507514
申请日：1990-04-11
CPC分类号： G01R1/071 , G01R15/242
摘要： A voltage in a selected area of an object is measured by launching an input light beam into an electrooptic material whose refractive index is changed in accordance with an electric field created by the voltage in a selected area of an object to be measured, and detecting a change in polarization or in a deflection angle of an output light beam from the electrooptic material. A medium having a dielectric constant greater than the air is placed between the area to be measured and the electrooptic material.
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